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FARMER KR
DEBAUCHE CP
GIORDANO AR
LUNDGREN P
ANDERSSON MO
BUCHANAN DA
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Authors:
LUNDGREN P
ANDERSSON MO
FARMER KR
ENGSTROM O
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Authors:
ANDERSSON MO
LUNDGREN P
ENGSTROM O
FARMER KR
Citation: Mo. Andersson et al., ANNEALING AND CHARGING OF SLOW AND FAST STATES IN METAL-TUNNEL OXIDE-SILICON DIODES MEASURED USING CAPACITANCE-VOLTAGE AND CURRENT-VOLTAGE TECHNIQUES, Microelectronic engineering, 22(1-4), 1993, pp. 235-238
Citation: P. Lundgren et al., POST-METALLIZATION ANNEALING OF METAL-TUNNEL OXIDE-SILICON DIODES, Journal of applied physics, 74(7), 1993, pp. 4780-4782