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Results: 1-8 |
Results: 8
QUANTIZED AGGREGATION PHENOMENA IN II-VI-SEMICONDUCTOR COLLOIDS
Authors: PLATSCHEK V SCHMIDT T LERCH M MULLER G SPANHEL L EMMERLING A FRICKE J FOITZIK AH LANGER E
Citation: V. Platschek et al., QUANTIZED AGGREGATION PHENOMENA IN II-VI-SEMICONDUCTOR COLLOIDS, Berichte der Bunsengesellschaft fur Physikalische Chemie, 102(1), 1998, pp. 85-95
IN-SITU LASER-HEATING IN AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE
Authors: FOITZIK AH FUTING MW HILLRICHS G HERBST LJ
Citation: Ah. Foitzik et al., IN-SITU LASER-HEATING IN AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE, Scanning, 19(2), 1997, pp. 119-124
FERROELASTICITY OF T-ZIRCONIA .1. HIGH-VOLTAGE ELECTRON-MICROSCOPY STUDIES OF THE MICROSTRUCTURE IN POLYDOMAIN TETRAGONAL ZIRCONIA
Authors: BAITHER D BAUFELD B MESSERSCHMIDT U FOITZIK AH RUHLE M
Citation: D. Baither et al., FERROELASTICITY OF T-ZIRCONIA .1. HIGH-VOLTAGE ELECTRON-MICROSCOPY STUDIES OF THE MICROSTRUCTURE IN POLYDOMAIN TETRAGONAL ZIRCONIA, Journal of the American Ceramic Society, 80(7), 1997, pp. 1691-1698
FERROELASTICITY OF T-ZIRCONIA .2. IN-SITU STRAINING IN A HIGH-VOLTAGEELECTRON-MICROSCOPE
Authors: BAUFELD B BAITHER D MESSERSCHMIDT U BARTSCH M FOITZIK AH RUHLE M
Citation: B. Baufeld et al., FERROELASTICITY OF T-ZIRCONIA .2. IN-SITU STRAINING IN A HIGH-VOLTAGEELECTRON-MICROSCOPE, Journal of the American Ceramic Society, 80(7), 1997, pp. 1699-1705
NANOCRYSTALLINE TITANIUM ALUMINIDE
Authors: XIAO SQ FOITZIK AH WELSCH G HAUBOLD T GLEITER H
Citation: Sq. Xiao et al., NANOCRYSTALLINE TITANIUM ALUMINIDE, Acta metallurgica et materialia, 42(7), 1994, pp. 2535-2545
ON A HIGH-PURITY GE EDS DETECTOR .1. DETERMINATION OF DETECTOR EFFICIENCY
Authors: FOITZIK AH SEARS JS XIAO SQ HEUER AH
Citation: Ah. Foitzik et al., ON A HIGH-PURITY GE EDS DETECTOR .1. DETERMINATION OF DETECTOR EFFICIENCY, Ultramicroscopy, 50(2), 1993, pp. 207-218
ON A HIGH-PURITY GE EDS DETECTOR .2. ICE LAYER FORMATION AND OPTIMIZATION OF DETECTOR DESIGN
Authors: FOITZIK AH SEARS JS XIAO SQ HEUER AH WUNDERLICH W
Citation: Ah. Foitzik et al., ON A HIGH-PURITY GE EDS DETECTOR .2. ICE LAYER FORMATION AND OPTIMIZATION OF DETECTOR DESIGN, Ultramicroscopy, 50(2), 1993, pp. 219-227
ON A HIGH-PURITY GE EDS DETECTOR .3. THE RELIABLE ACQUISITION OF EDS SPECTRA
Authors: FOITZIK AH XIAO SQ HEUER AH WUNDERLICH W
Citation: Ah. Foitzik et al., ON A HIGH-PURITY GE EDS DETECTOR .3. THE RELIABLE ACQUISITION OF EDS SPECTRA, Ultramicroscopy, 50(2), 1993, pp. 229-235
Risultati: 1-8 |