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Results: 1-9 |
Results: 9
CONTACTLESS ELECTROREFLECTANCE CHARACTERIZATION OF GAINP GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR STRUCTURES/
Authors: HUANG YS SUN WD POLLAK FH FREEOUF JL CALDER ID MALLARD RE
Citation: Ys. Huang et al., CONTACTLESS ELECTROREFLECTANCE CHARACTERIZATION OF GAINP GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR STRUCTURES/, Applied physics letters, 73(2), 1998, pp. 214-216
SPECTRAL ELLIPSOMETRY INVESTIGATION OF ZN0.53CD0.47SE LATTICE-MATCHEDTO INP
Authors: HOLDEN T RAM P POLLAK FH FREEOUF JL YANG BX TAMARGO MC
Citation: T. Holden et al., SPECTRAL ELLIPSOMETRY INVESTIGATION OF ZN0.53CD0.47SE LATTICE-MATCHEDTO INP, Physical review. B, Condensed matter, 56(7), 1997, pp. 4037-4046
REFLECTION ANISOTROPY SPECTROSCOPY STUDY OF THE NEAR-SURFACE ELECTRIC-FIELD IN LOW-TEMPERATURE-GROWN GAAS(001)
Authors: HOLDEN T POLLAK FH FREEOUF JL MCINTURFF D GRAY JL LUNDSTROM M WOODALL JM
Citation: T. Holden et al., REFLECTION ANISOTROPY SPECTROSCOPY STUDY OF THE NEAR-SURFACE ELECTRIC-FIELD IN LOW-TEMPERATURE-GROWN GAAS(001), Applied physics letters, 70(9), 1997, pp. 1107-1109
REFLECTION ANISOTROPY SPECTROSCOPY, SURFACE PHOTOVOLTAGE SPECTROSCOPY, AND CONTACTLESS ELECTROREFLECTANCE INVESTIGATION OF THE INP IN0.53GA0.47AS(001)HETEROJUNCTION SYSTEM/
Authors: LEIBOVITCH M RAM P MALIKOVA L POLLAK FH FREEOUF JL KRONIK L MISHORI B SHAPIRA Y CLAWSON AR HANSON CM
Citation: M. Leibovitch et al., REFLECTION ANISOTROPY SPECTROSCOPY, SURFACE PHOTOVOLTAGE SPECTROSCOPY, AND CONTACTLESS ELECTROREFLECTANCE INVESTIGATION OF THE INP IN0.53GA0.47AS(001)HETEROJUNCTION SYSTEM/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3089-3094
SCHOTTKY BARRIERS AND THE REACTIVITY OF THE INTERFACE
Authors: WITTMER M FREEOUF JL
Citation: M. Wittmer et Jl. Freeouf, SCHOTTKY BARRIERS AND THE REACTIVITY OF THE INTERFACE, Europhysics letters, 26(2), 1994, pp. 135-140
EFFECT OF INTERFACIAL HYDROGEN IN COSI2 SI(100) SCHOTTKY-BARRIER CONTACTS/
Authors: ABOELFOTOH MO MARWICK AD FREEOUF JL
Citation: Mo. Aboelfotoh et al., EFFECT OF INTERFACIAL HYDROGEN IN COSI2 SI(100) SCHOTTKY-BARRIER CONTACTS/, Physical review. B, Condensed matter, 49(15), 1994, pp. 10753-10756
THE CONTINUING DRAMA OF THE SEMICONDUCTOR INTERFACE
Authors: WOODALL JM KIRCHNER PD FREEOUF JL MCINTURFF DT MELLOCH MR POLLAK FH
Citation: Jm. Woodall et al., THE CONTINUING DRAMA OF THE SEMICONDUCTOR INTERFACE, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 344(1673), 1993, pp. 521-532
INTERPRETATION OF THE PHOTOELECTRON-SPECTRA OF MOLECULARLY ADSORBED CO (REPRINTED FROM SOLID-STATE COMMUN, VOL 17, PG 391-396, 1975)
Authors: GUSTAFSSON T PLUMMER EW EASTMAN DE FREEOUF JL
Citation: T. Gustafsson et al., INTERPRETATION OF THE PHOTOELECTRON-SPECTRA OF MOLECULARLY ADSORBED CO (REPRINTED FROM SOLID-STATE COMMUN, VOL 17, PG 391-396, 1975), Solid state communications, 88(11-12), 1993, pp. 1079-1084
LIFETIME MEASUREMENTS ON SILICON-ON-INSULATOR WAFERS
Authors: FREEOUF JL BRASLAU N WITTMER M
Citation: Jl. Freeouf et al., LIFETIME MEASUREMENTS ON SILICON-ON-INSULATOR WAFERS, Applied physics letters, 63(2), 1993, pp. 189-190
Risultati: 1-9 |