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SCHWARZ LR
KIEFER F
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GAJDOS O
VIDOVA P
DOBIAS L
FRIED M
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WOLFF T
Citation: J. Topinka et al., DNA ADDUCT FORMATION IN MAMMALIAN-CELL CULTURES BY POLYCYCLIC AROMATIC-HYDROCARBONS (PAH) AND NITRO-PAH IN COKE-OVEN EMISSION EXTRACT, Mutation research. Genetic toxicology and environmental mutagenesis, 419(1-3), 1998, pp. 91-105
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BINKOVA B
LENICEK J
BENES I
VIDOVA P
GAJDOS O
FRIED M
SRAM RJ
Citation: B. Binkova et al., GENOTOXICITY OF COKE-OVEN AND URBAN AIR PARTICULATE MATTER IN IN-VITRO ACELLULAR ASSAYS COUPLED WITH P-32 POSTLABELING AND HPLC ANALYSIS OFDNA-ADDUCTS, Mutation research. Genetic toxicology and environmental mutagenesis, 414(1-3), 1998, pp. 77-94
Citation: J. Gilley et M. Fried, EVOLUTION OF U24 AND U36 SNORNAS ENCODED WITHIN INTRONS OF VERTEBRATERPL7A GENE HOMOLOGS - UNIQUE FEATURES OF MAMMALIAN U36 VARIANTS, DNA and cell biology, 17(7), 1998, pp. 591-602
Citation: M. Fried et al., ASSESSMENT OF THE OUTCOME OF LAPAROSCOPIC NONADJUSTABLE GASTRIC BANDING AND STOMA ADJUSTABLE GASTRIC BANDING - SURGEONS AND PATIENTS VIEW, Obesity surgery, 8(1), 1998, pp. 45-48
Citation: M. Fried et al., MINIMAL CHONDROITIN SULFATE STRUCTURES REQUIRED TO SUPPORT PLASMODIUM-FALCIPARUM ADHESION, Glycobiology, 8(11), 1998, pp. 68-68
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NORRIS CM
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COSTELLO R
BARTON JJ
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Citation: Ad. Colevas et al., INDUCTION CHEMOTHERAPY WITH DOCETAXEL, CISPLATIN, FLUOROURACIL, AND LEUCOVORIN FOR SQUAMOUS-CELL CARCINOMA OF THE HEAD AND NECK - A PHASE III TRIAL/, Journal of clinical oncology, 16(4), 1998, pp. 1331-1339
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DEBATIN JF
SCHWIZER W
SCHOENENBERGER AW
FRIED M
MARINCEK B
Citation: Pr. Hilfiker et al., MR DEFECOGRAPHY - DEPICTION OF ANORECTAL ANATOMY AND PATHOLOGY, Journal of computer assisted tomography, 22(5), 1998, pp. 749-755
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ZATSEPINA OV
JORDAN PWH
JORDAN EG
FRIED M
Citation: C. Magoulas et al., THE SURF-6 PROTEIN IS A COMPONENT OF THE NUCLEOLAR MATRIX AND HAS A HIGH BINDING-CAPACITY FOR NUCLEIC-ACIDS IN-VITRO, European journal of cell biology, 75(2), 1998, pp. 174-183
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ADAM W
BAUER C
BERDERMANN E
BOGANI F
BORCHI E
BRUZZI M
COLLEDANI C
CONWAY J
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DELPIERRE P
DENEUVILLE A
DULINSKI W
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GHEERAERT E
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HARTJES F
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KANIA D
KAPLON J
KASS R
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MANFREDI PF
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PLANO R
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SCHNETZER S
SCIORTINO S
SPEZIALI V
STELZER H
STONE R
TAPPER RJ
TESAREK R
THOMSON GB
TRAWICK M
TRISCHUK W
TURCHETTA R
Citation: P. Weilhammer et al., RECENT RESULTS ON CVD DIAMOND RADIATION SENSORS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 409(1-3), 1998, pp. 264-270
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SCHWIZER W
BOROVICKA J
JANSEN JBMJ
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DELALOYE AB
FRIED M
Citation: C. Kreiss et al., EFFECT OF LINTITRIPT, A NEW CCK-A RECEPTOR ANTAGONIST, ON GASTRIC-EMPTYING OF A SOLID-LIQUID MEAL IN HUMANS, Regulatory peptides, 74(2-3), 1998, pp. 143-149
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PETRIK P
POLGAR O
LOHNER T
FRIED M
KHANH NQ
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Citation: P. Petrik et al., ION IMPLANTATION-CAUSED DAMAGE DEPTH PROFILES IN SINGLE-CRYSTALLINE SILICON STUDIED BY SPECTROSCOPIC ELLIPSOMETRY AND RUTHERFORD BACKSCATTERING SPECTROMETRY, Vacuum, 50(3-4), 1998, pp. 293-297
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PETRIK P
POLGAR O
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BIDEUX L
GRUZZA B
CADORET M
LOHNER T
FRIED M
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GERGELY G
Citation: C. Robert et al., SPECTROELLIPSOMETRY AND ELECTRON-SPECTROSCOPY OF POROUS SI THIN-FILMSON P(+) SUBSTRATES, Thin solid films, 317(1-2), 1998, pp. 210-213
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BIRO LP
FRIED M
LOHNER T
BERGER R
SCHNEIDER C
GYULAI J
RYSSEL H
Citation: P. Petrik et al., COMPARATIVE-STUDY OF SURFACE-ROUGHNESS MEASURED ON POLYSILICON USING SPECTROSCOPIC ELLIPSOMETRY AND ATOMIC-FORCE MICROSCOPY, Thin solid films, 315(1-2), 1998, pp. 186-191
Citation: L. Redei et al., A MODIFIED LEARNING-STRATEGY FOR NEURAL NETWORKS TO SUPPORT SPECTROSCOPIC ELLIPSOMETRIC DATA EVALUATION, Thin solid films, 313, 1998, pp. 149-155
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FRIED M
LOHNER T
BERGER R
BIRO LP
SCHNEIDER C
GYULAI J
RYSSEL H
Citation: P. Petrik et al., COMPARATIVE-STUDY OF POLYSILICON-ON-OXIDE USING SPECTROSCOPIC ELLIPSOMETRY, ATOMIC-FORCE MICROSCOPY, AND TRANSMISSION ELECTRON-MICROSCOPY, Thin solid films, 313, 1998, pp. 259-263
Authors:
FRIED M
WORMEESTER H
ZOETHOUT E
LOHNER T
POLGAR O
BARSONY I
Citation: M. Fried et al., IN-SITU SPECTROSCOPIC ELLIPSOMETRIC INVESTIGATION OF VACUUM ANNEALED AND OXIDIZED POROUS SILICON LAYERS, Thin solid films, 313, 1998, pp. 459-463