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Results: 1-16 |
Results: 16
SIMULTANEOUS ANALYSIS OF MEMBRANE-POTENTIAL AND CALCIUM MOBILIZATION IN A PANCREATIC BETA-CELL LINE MIN6 BY USE OF A DOUBLE-PROBE IMAGING MICROSCOPE-SYSTEM
Authors: OZAWA K FUKANO Y AZUMA T MASUMOTO Y HAYASHI H TAMURA A MIYAZAKI J MASUJIMA T
Citation: K. Ozawa et al., SIMULTANEOUS ANALYSIS OF MEMBRANE-POTENTIAL AND CALCIUM MOBILIZATION IN A PANCREATIC BETA-CELL LINE MIN6 BY USE OF A DOUBLE-PROBE IMAGING MICROSCOPE-SYSTEM, Analytica chimica acta, 365(1-3), 1998, pp. 3-7
VIDEO-MICROSCOPY FOR ANALYSIS OF MOLECULAR-DYNAMICS IN CELLS
Authors: OZAWA K TAMURA A IKEDA K KAWAI E KONDO T FUKANO Y NOMURA S ISHIHARA Y MASUJIMA T
Citation: K. Ozawa et al., VIDEO-MICROSCOPY FOR ANALYSIS OF MOLECULAR-DYNAMICS IN CELLS, Journal of pharmaceutical and biomedical analysis, 15(9-10), 1997, pp. 1483-1488
PREPARATION OF GM1 GANGLIOSIDE WITH SIALIDASE-PRODUCING MARINE-BACTERIA AS A MICROBIAL BIOCATALYST
Authors: FUKANO Y ITO M
Citation: Y. Fukano et M. Ito, PREPARATION OF GM1 GANGLIOSIDE WITH SIALIDASE-PRODUCING MARINE-BACTERIA AS A MICROBIAL BIOCATALYST, Applied and environmental microbiology, 63(5), 1997, pp. 1861-1865
DENSITY SATURATION OF DENSELY CONTACT-ELECTRIFIED NEGATIVE CHARGES ONA THIN SILICON-OXIDE SAMPLE DUE TO THE COULOMB REPULSIVE FORCE
Authors: SUGAWARA Y TSUYUGUCHI T UCHIHASHI T OKUSAKO T FUKANO Y YAMANISHI Y OASA T MORITA S
Citation: Y. Sugawara et al., DENSITY SATURATION OF DENSELY CONTACT-ELECTRIFIED NEGATIVE CHARGES ONA THIN SILICON-OXIDE SAMPLE DUE TO THE COULOMB REPULSIVE FORCE, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 74(5), 1996, pp. 1339-1346
TIME-DEPENDENT DIELECTRIC-BREAKDOWN OF THIN SILICON-OXIDE USING DENSECONTACT ELECTRIFICATION
Authors: FUKANO Y HONTANI KJ UCHIHASHI T OKUSAKO T CHAYAHARA A SUGAWARA Y YAMANISHI Y OASA T MORITA S
Citation: Y. Fukano et al., TIME-DEPENDENT DIELECTRIC-BREAKDOWN OF THIN SILICON-OXIDE USING DENSECONTACT ELECTRIFICATION, JPN J A P 1, 33(6B), 1994, pp. 3756-3760
TIME EVOLUTION OF CONTACT-ELECTRIFIED ELECTRON DISSIPATION ON SILICON-OXIDE SURFACE INVESTIGATED USING NONCONTACT ATOMIC-FORCE MICROSCOPE
Authors: FUKANO Y UCHIHASHI T OKUSAKO T CHAYAHARA A SUGAWARA Y YAMANISHI Y OASA T MORITA S
Citation: Y. Fukano et al., TIME EVOLUTION OF CONTACT-ELECTRIFIED ELECTRON DISSIPATION ON SILICON-OXIDE SURFACE INVESTIGATED USING NONCONTACT ATOMIC-FORCE MICROSCOPE, JPN J A P 1, 33(1B), 1994, pp. 379-382
PARAMETER DEPENDENCE OF STABLE STATE OF DENSELY CONTACT-ELECTRIFIED ELECTRONS ON THIN SILICON-OXIDE
Authors: FUKANO Y UCHIHASHI T OKUSAKO T CHAYAHARA A SUGAWARA Y YAMANISHI Y OASA T MORITA S
Citation: Y. Fukano et al., PARAMETER DEPENDENCE OF STABLE STATE OF DENSELY CONTACT-ELECTRIFIED ELECTRONS ON THIN SILICON-OXIDE, JPN J A P 1, 33(12A), 1994, pp. 6739-6745
CONTACT ELECTRIFICATION ON THIN SRTIO3 FILM BY ATOMIC-FORCE MICROSCOPE
Authors: UCHIHASHI T OKUSAKO T YAMADA J FUKANO Y SUGAWARA Y IGARASHI M KANEKO R MORITA S
Citation: T. Uchihashi et al., CONTACT ELECTRIFICATION ON THIN SRTIO3 FILM BY ATOMIC-FORCE MICROSCOPE, JPN J A P 2, 33(3A), 1994, pp. 120000374-120000376
SPATIAL-DISTRIBUTION AND ITS PHASE-TRANSITION OF DENSELY CONTACT-ELECTRIFIED ELECTRONS ON A THIN SILICON-OXIDE
Authors: SUGAWARA Y MORITA S FUKANO Y UCHIHASHI T OKUSAKO T CHAYAHARA A YAMANISHI Y OASA T
Citation: Y. Sugawara et al., SPATIAL-DISTRIBUTION AND ITS PHASE-TRANSITION OF DENSELY CONTACT-ELECTRIFIED ELECTRONS ON A THIN SILICON-OXIDE, JPN J A P 2, 33(1A), 1994, pp. 120000070-120000073
SPATIAL DISTRIBUTIONS OF DENSELY CONTACT-ELECTRIFIED CHARGES ON A THIN SILICON-OXIDE
Authors: SUGAWARA Y MORITA S FUKANO Y UCHIHASHI T OKUSAKO T CHAYAHARA A YAMANISHI Y OASA T
Citation: Y. Sugawara et al., SPATIAL DISTRIBUTIONS OF DENSELY CONTACT-ELECTRIFIED CHARGES ON A THIN SILICON-OXIDE, JPN J A P 2, 33(1A), 1994, pp. 120000074-120000077
POTENTIOMETRY COMBINED WITH ATOMIC-FORCE MICROSCOPE
Authors: UCHIHASHI T FUKANO Y SUGAWARA Y MORITA S NAKANO A IDA T OKADA T
Citation: T. Uchihashi et al., POTENTIOMETRY COMBINED WITH ATOMIC-FORCE MICROSCOPE, JPN J A P 2, 33(11A), 1994, pp. 120001562-120001564
ATOMIC-FORCE MICROSCOPY STUDIES OF CONTACT-ELECTRIFIED CHARGES ON SILICON-OXIDE FILM
Authors: SUGAWARA Y FUKANO Y UCHIHASHI T OKUSAKO T MORITA S YAMANISHI Y OASA T OKADA T
Citation: Y. Sugawara et al., ATOMIC-FORCE MICROSCOPY STUDIES OF CONTACT-ELECTRIFIED CHARGES ON SILICON-OXIDE FILM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1627-1630
DISSIPATION OF CONTACT-ELECTRIFIED CHARGE ON THIN SI-OXIDE STUDIED BYATOMIC-FORCE MICROSCOPY
Authors: MORITA S FUKANO Y UCHIHASHI T SUGAWARA Y YAMANISHI Y OASA T
Citation: S. Morita et al., DISSIPATION OF CONTACT-ELECTRIFIED CHARGE ON THIN SI-OXIDE STUDIED BYATOMIC-FORCE MICROSCOPY, Applied surface science, 75, 1994, pp. 151-156
ATOMIC-FORCE MICROSCOPE COMBINED WITH SCANNING TUNNELING MICROSCOPE [AFM STM]/
Authors: MORITA S SUGAWARA Y FUKANO Y
Citation: S. Morita et al., ATOMIC-FORCE MICROSCOPE COMBINED WITH SCANNING TUNNELING MICROSCOPE [AFM STM]/, JPN J A P 1, 32(6B), 1993, pp. 2983-2988
STABLE-UNSTABLE PHASE-TRANSITION OF DENSELY CONTRACT-ELECTRIFIED ELECTRONS ON THIN SILICON-OXIDE
Authors: MORITA S SUGAWARA Y FUKANO Y UCHIHASHI T OKUSAKO T CHAYAHARA A YAMANISHI Y OASA T
Citation: S. Morita et al., STABLE-UNSTABLE PHASE-TRANSITION OF DENSELY CONTRACT-ELECTRIFIED ELECTRONS ON THIN SILICON-OXIDE, JPN J A P 2, 32(12B), 1993, pp. 120001852-120001854
REPRODUCIBLE AND CONTROLLABLE CONTACT ELECTRIFICATION ON A THIN INSULATOR
Authors: MORITA S FUKANO Y UCHIHASHI T OKUSAKO T SUGAWARA Y YAMANISHI Y OASA T
Citation: S. Morita et al., REPRODUCIBLE AND CONTROLLABLE CONTACT ELECTRIFICATION ON A THIN INSULATOR, JPN J A P 2, 32(11B), 1993, pp. 120001701-120001703
Risultati: 1-16 |