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Results: 1-9 |
Results: 9
SELECTED APPLICATIONS OF PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE TECHNIQUES FOR PROCESS-CONTROL IN SILICON-WAFER MANUFACTURING
Authors: EHLERT A KERSTAN M LUNDT H HUBER A HELMREICH D GEILER HD KARGE H WAGNER M
Citation: A. Ehlert et al., SELECTED APPLICATIONS OF PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE TECHNIQUES FOR PROCESS-CONTROL IN SILICON-WAFER MANUFACTURING, Optical engineering, 36(2), 1997, pp. 446-458
ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY A COMBINED PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE MEASUREMENT
Authors: GEILER HD KARGE H WAGNER M EHLERT A KERSTAN M HELMREICH D
Citation: Hd. Geiler et al., ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY A COMBINED PHOTOTHERMAL AND PHOTOLUMINESCENCE HETERODYNE MEASUREMENT, Journal of applied physics, 81(11), 1997, pp. 7548-7551
ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY PHOTOLUMINESCENCE AND PHOTOTHERMAL HETERODYNE METHODS
Authors: GEILER HD KARGE H WAGNER M EHLERT A KERSTAN M HELMREICH D
Citation: Hd. Geiler et al., ANALYSIS OF SUBSURFACE DAMAGE IN SILICON BY PHOTOLUMINESCENCE AND PHOTOTHERMAL HETERODYNE METHODS, Progress in Natural Science, 6, 1996, pp. 498-502
INVESTIGATION OF THERMOPHYSICAL PROPERTIES OF AIP COATED CUTTING TOOLS FOR DRY MACHINING
Authors: LUGSCHEIDER E GEILER HD LAKE M ZIMMERMANN H
Citation: E. Lugscheider et al., INVESTIGATION OF THERMOPHYSICAL PROPERTIES OF AIP COATED CUTTING TOOLS FOR DRY MACHINING, Surface & coatings technology, 86-7(1-3), 1996, pp. 803-808
SURFACE CHARACTERIZATION OF SEMICONDUCTORS WITH PLASMA AND THERMAL WAVES ANALYSIS
Authors: BUCHMANN F GEILER HD
Citation: F. Buchmann et Hd. Geiler, SURFACE CHARACTERIZATION OF SEMICONDUCTORS WITH PLASMA AND THERMAL WAVES ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 113-117
MEASUREMENT OF SURFACE RECOMBINATION OF EXCESS CARRIERS BY USE OF THEDOUBLE-MODULATION TECHNIQUE
Authors: KAPPLINGER S BUCHMANN F GEILER HD
Citation: S. Kapplinger et al., MEASUREMENT OF SURFACE RECOMBINATION OF EXCESS CARRIERS BY USE OF THEDOUBLE-MODULATION TECHNIQUE, Journal de physique. IV, 4(C7), 1994, pp. 145-149
IN-SITU INVESTIGATION OF ION-IMPLANTATION PROCESSES BY THERMAL-WAVE ANALYSIS
Authors: SCHLEMM H GEILER HD KLUGE A
Citation: H. Schlemm et al., IN-SITU INVESTIGATION OF ION-IMPLANTATION PROCESSES BY THERMAL-WAVE ANALYSIS, Journal de physique. IV, 4(C7), 1994, pp. 167-170
A RIGOROUS DESCRIPTION OF ELECTRODYNAMIC AND PHOTOTHERMAL RESPONSE BYTHE MATRIX FORMALISM IN LAYERED SYSTEMS
Authors: WOLFF D GEILER HD MANDELIS A
Citation: D. Wolff et al., A RIGOROUS DESCRIPTION OF ELECTRODYNAMIC AND PHOTOTHERMAL RESPONSE BYTHE MATRIX FORMALISM IN LAYERED SYSTEMS, Journal de physique. IV, 4(C7), 1994, pp. 179-182
NONDESTRUCTIVE EVALUATION OF ION IMPLANTATION-INDUCED MICROHARDNESS BY PHOTOTHERMAL SPECTROSCOPY
Authors: GEILER HD KARGE H KLUGE A
Citation: Hd. Geiler et al., NONDESTRUCTIVE EVALUATION OF ION IMPLANTATION-INDUCED MICROHARDNESS BY PHOTOTHERMAL SPECTROSCOPY, Surface & coatings technology, 66(1-3), 1994, pp. 265-270
Risultati: 1-9 |