Authors: EGGER P GIESER H KROPF R GUGGENMOS X

Citation: P. Egger et al., ESD MONITOR CIRCUIT - A TOOL TO INVESTIGATE THE SUSCEPTIBILITY AND FAILURE MECHANISMS OF THE CHARGED DEVICE MODEL, Quality and reliability engineering international, 12(4), 1996, pp. 265-270

Authors: WOLF H GIESER H WILKENING W

Citation: H. Wolf et al., PULSED THERMAL CHARACTERIZATION OF A REVERSE-BIASED PN-JUNCTION FOR ESD HBM SIMULATION, Microelectronics and reliability, 36(11-12), 1996, pp. 1711-1714

Authors: MUSSHOFF C WOLF H GIESER H EGGER P GUGGENMOS X

Citation: C. Musshoff et al., RISETIME EFFECTS OF HBM AND SQUARE PULSES ON THE FAILURE THRESHOLDS OF GGNMOS-TRANSISTORS, Microelectronics and reliability, 36(11-12), 1996, pp. 1743-1746

Authors: VERHAEGE K GROESENEKEN GV MAES HE EGGER P GIESER H

Citation: K. Verhaege et al., INFLUENCE OF TESTER, TEST METHOD, AND DEVICE TYPE ON CDM ESD TESTING, IEEE transactions on components, packaging, and manufacturing technology. Part A, 18(2), 1995, pp. 284-294

Authors: RUSS C GIESER H VERHAEGE K

Citation: C. Russ et al., ESD PROTECTION ELEMENTS DURING HBM STRESS TESTS - FURTHER NUMERICAL AND EXPERIMENTAL RESULTS, Quality and reliability engineering international, 11(4), 1995, pp. 285-294