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Results: 1-11 |
Results: 11
XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 4 - ASSESSMENT OF EFFECTS FOR DIFFERENT X-RAY SOURCES, ANALYZER RESOLUTIONS, ANGLES OF EMISSION AND OVERALL UNCERTAINTIES
Authors: SEAH MP GILMORE IS SPENCER SJ
Citation: Mp. Seah et al., XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 4 - ASSESSMENT OF EFFECTS FOR DIFFERENT X-RAY SOURCES, ANALYZER RESOLUTIONS, ANGLES OF EMISSION AND OVERALL UNCERTAINTIES, Surface and interface analysis, 26(9), 1998, pp. 617-641
QUANTITATIVE AES - VIII - ANALYSIS OF AUGER-ELECTRON INTENSITIES FROMELEMENTAL DATA IN A DIGITAL AUGER DATABASE
Authors: SEAH MP GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES - VIII - ANALYSIS OF AUGER-ELECTRON INTENSITIES FROMELEMENTAL DATA IN A DIGITAL AUGER DATABASE, Surface and interface analysis, 26(12), 1998, pp. 908-929
QUANTITATIVE AES-VII - THE IONIZATION CROSS-SECTION IN AES
Authors: SEAH MP GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES-VII - THE IONIZATION CROSS-SECTION IN AES, Surface and interface analysis, 26(11), 1998, pp. 815-824
QUANTITATIVE AES - V - PRACTICAL ANALYSIS OF INTENSITIES WITH DETAILED EXAMPLES OF METALS AND THEIR OXIDES
Authors: SEAH MP GILMORE IS BISHOP HE LORANG G
Citation: Mp. Seah et al., QUANTITATIVE AES - V - PRACTICAL ANALYSIS OF INTENSITIES WITH DETAILED EXAMPLES OF METALS AND THEIR OXIDES, Surface and interface analysis, 26(10), 1998, pp. 701-722
QUANTITATIVE AES - VI - BACKSCATTERING AND BACKGROUNDS - AN ANALYSIS OF ELEMENTAL SYSTEMATICS AND CORRECTIONS OF ABSOLUTE INTENSITY
Authors: SEAH MP GILMORE IS
Citation: Mp. Seah et Is. Gilmore, QUANTITATIVE AES - VI - BACKSCATTERING AND BACKGROUNDS - AN ANALYSIS OF ELEMENTAL SYSTEMATICS AND CORRECTIONS OF ABSOLUTE INTENSITY, Surface and interface analysis, 26(10), 1998, pp. 723-735
AES - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .3. GENERAL CALIBRATION
Authors: SEAH MP GILMORE IS
Citation: Mp. Seah et Is. Gilmore, AES - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .3. GENERAL CALIBRATION, Journal of electron spectroscopy and related phenomena, 83(2-3), 1997, pp. 197-208
HIGH-RESOLUTION DIGITAL AUGER DATABASE OF TRUE SPECTRA FOR AUGER-ELECTRON SPECTROSCOPY INTENSITIES
Authors: SEAH MP GILMORE IS
Citation: Mp. Seah et Is. Gilmore, HIGH-RESOLUTION DIGITAL AUGER DATABASE OF TRUE SPECTRA FOR AUGER-ELECTRON SPECTROSCOPY INTENSITIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1401-1407
SAVITZKY AND GOLAY DIFFERENTIATION IN AES
Authors: GILMORE IS SEAH MP
Citation: Is. Gilmore et Mp. Seah, SAVITZKY AND GOLAY DIFFERENTIATION IN AES, Applied surface science, 93(3), 1996, pp. 273-280
STATIC SIMS - A STUDY OF DAMAGE USING POLYMERS
Authors: GILMORE IS SEAH MP
Citation: Is. Gilmore et Mp. Seah, STATIC SIMS - A STUDY OF DAMAGE USING POLYMERS, Surface and interface analysis, 24(11), 1996, pp. 746-762
STATIC SIMS - SURFACE-CHARGE STABILIZATION OF INSULATORS FOR HIGHLY REPEATABLE SPECTRA WHEN USING A QUADRUPOLE MASS-SPECTROMETER
Authors: GILMORE IS SEAH MP
Citation: Is. Gilmore et Mp. Seah, STATIC SIMS - SURFACE-CHARGE STABILIZATION OF INSULATORS FOR HIGHLY REPEATABLE SPECTRA WHEN USING A QUADRUPOLE MASS-SPECTROMETER, Surface and interface analysis, 23(4), 1995, pp. 191-203
FLUENCE, FLUX, CURRENT AND CURRENT-DENSITY MEASUREMENT IN FARADAY CUPS FOR SURFACE-ANALYSIS
Authors: GILMORE IS SEAH MP
Citation: Is. Gilmore et Mp. Seah, FLUENCE, FLUX, CURRENT AND CURRENT-DENSITY MEASUREMENT IN FARADAY CUPS FOR SURFACE-ANALYSIS, Surface and interface analysis, 23(4), 1995, pp. 248-258
Risultati: 1-11 |