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Results:
1-14
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Results: 14
Authors:
FARROW RC
POSTEK MT
KEERY WJ
JONES SN
LOWNEY JR
BLAKEY M
FETTER LA
GRIFFITH JE
LIDDLE JA
HOPKINS LC
HUGGINS HA
PEABODY M
NOVEMBRE A
Citation: Rc. Farrow et al., APPLICATION OF TRANSMISSION ELECTRON DETECTION TO SCALPEL MASK METROLOGY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2167-2172
Authors:
GRIFFITH JE
HOPKINS LC
BRYSON CE
BERGHAUS A
SNYDER EJ
PLOMBON JJ
VASILYEV LA
HECHT M
BINDELL JB
Citation: Je. Griffith et al., WALL ANGLE MEASUREMENT WITH A SCANNING PROBE MICROSCOPE EMPLOYING A ONE-DIMENSIONAL FORCE SENSOR, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2189-2192
Authors:
BENGE OG
MCDERMOTT JR
LANGLINAIS JC
GRIFFITH JE
Citation: Og. Benge et al., FOAMED CEMENT JOB SUCCESSFUL IN DEEP HTHP OFFSHORE WELL, Oil & gas journal, 94(11), 1996, pp. 58
Authors:
GRIFFITH JE
MARCHMAN HM
MILLER GL
HOPKINS LC
Citation: Je. Griffith et al., DIMENSIONAL METROLOGY WITH SCANNING PROBE MICROSCOPES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1100-1105
Authors:
MARCHMAN HM
GRIFFITH JE
TRAUTMAN JK
Citation: Hm. Marchman et al., OPTICAL PROBE MICROSCOPE FOR NONDESTRUCTIVE METROLOGY OF LARGE-SAMPLESURFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1106-1111
Authors:
HOPKINS LC
GRIFFITH JE
HARRIOTT LR
VASILE MJ
Citation: Lc. Hopkins et al., POLYCRYSTALLINE TUNGSTEN AND IRIDIUM PROBE TIP PREPARATION WITH A GA-BEAM( FOCUSED ION), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(2), 1995, pp. 335-337
Authors:
GRIFFITH JE
MARCHMAN HM
HOPKINS LC
Citation: Je. Griffith et al., EDGE POSITION MEASUREMENT WITH A SCANNING PROBE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3567-3570
Authors:
MARCHMAN HM
GRIFFITH JE
GUO JZY
FRACKOVIAK J
CELLER GK
Citation: Hm. Marchman et al., NANOMETER-SCALE DIMENSIONAL METROLOGY FOR ADVANCED LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3585-3590
Authors:
WOOD OR
BJORKHOLM JE
FETTER L
HIMEL MD
TENNANT DM
MACDOWELL AA
LAFONTAINE B
GRIFFITH JE
TAYLOR GN
WASKIEWICZ WK
WINDT DL
KORTRIGHT JB
GULLIKSON EK
NGUYEN K
Citation: Or. Wood et al., WAVELENGTH DEPENDENCE OF THE RESIST SIDEWALL ANGLE IN EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3841-3845
Authors:
MARCHMAN HM
GRIFFITH JE
FILAS RW
Citation: Hm. Marchman et al., FABRICATION OF OPTICAL-FIBER PROBES FOR NANOMETER-SCALE DIMENSIONAL METROLOGY, Review of scientific instruments, 65(8), 1994, pp. 2538-2541
Authors:
WINDT DL
WASKIEWICZ WK
GRIFFITH JE
Citation: Dl. Windt et al., SURFACE FINISH REQUIREMENTS FOR SOFT-X-RAY MIRRORS, Applied optics, 33(10), 1994, pp. 2025-2031
Authors:
GRIFFITH JE
MARCHMAN HM
MILLER GL
HOPKINS LC
VASILE MJ
SCHWALM SA
Citation: Je. Griffith et al., LINE-PROFILE MEASUREMENT WITH A SCANNING PROBE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2473-2476
Authors:
GRIFFITH JE
GRIGG DA
Citation: Je. Griffith et Da. Grigg, DIMENSIONAL METROLOGY WITH SCANNING PROBE MICROSCOPES, Journal of applied physics, 74(9), 1993, pp. 180000083-180000109
Authors:
RIEVES RD
BASS D
CARTER RR
GRIFFITH JE
NORMAN JR
Citation: Rd. Rieves et al., SEVERE COPD AND ACUTE RESPIRATORY-FAILURE - CORRELATES FOR SURVIVAL AT THE TIME OF TRACHEAL INTUBATION, Chest, 104(3), 1993, pp. 854-860
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