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Results: 1-25/26
Authors:
GRUSH MM
MURAMATSU Y
UNDERWOOD JH
GULLIKSON EM
EDERER DL
PERERA RCC
CALLCOTT TA
Citation: Mm. Grush et al., SOFT-X-RAY EMISSION AND ABSORPTION - A COMPARATIVE-STUDY ON THE SENSITIVITY TO OXIDATION-STATE AND LIGAND ENVIRONMENT OF TRANSITION-METAL COMPLEXES, Journal of electron spectroscopy and related phenomena, 92(1-3), 1998, pp. 225-229
Authors:
UNDERWOOD JH
GULLIKSON EM
Citation: Jh. Underwood et Em. Gullikson, HIGH-RESOLUTION, HIGH-FLUX, USER-FRIENDLY VLS BEAMLINE AT THE ALS FORTHE 50-1300 EV ENERGY REGION, Journal of electron spectroscopy and related phenomena, 92(1-3), 1998, pp. 265-272
Authors:
SACCHI M
HAGUE CF
GULLIKSON EM
UNDERWOOD JH
Citation: M. Sacchi et al., RESONANT MAGNETIC SCATTERING OF POLARIZED SOFT X-RAYS - SPECULAR REFLECTIVITY AND BRAGG-DIFFRACTION FROM MULTILAYERS, Physical review. B, Condensed matter, 57(1), 1998, pp. 108-111
Authors:
SACCHI M
HAGUE CF
PASQUALI L
MIRONE A
MARIOT JM
ISBERG P
GULLIKSON EM
UNDERWOOD JH
Citation: M. Sacchi et al., OPTICAL-CONSTANTS OF FERROMAGNETIC IRON VIA 2P RESONANT MAGNETIC SCATTERING, Physical review letters, 81(7), 1998, pp. 1521-1524
Authors:
STEARNS DG
GAINES DP
SWEENEY DW
GULLIKSON EM
Citation: Dg. Stearns et al., NONSPECULAR X-RAY-SCATTERING IN A MULTILAYER-COATED IMAGING-SYSTEM, Journal of applied physics, 84(2), 1998, pp. 1003-1028
Authors:
SOUFLI R
GULLIKSON EM
Citation: R. Soufli et Em. Gullikson, ABSOLUTE PHOTOABSORPTION MEASUREMENTS OF MOLYBDENUM IN THE RANGE 60-930 EV FOR OPTICAL-CONSTANT DETERMINATION, Applied optics, 37(10), 1998, pp. 1713-1719
Authors:
FRANKE AE
SCHATTENBURG ML
GULLIKSON EM
COTTAM J
KAHN SM
RASMUSSEN A
Citation: Ae. Franke et al., SUPER-SMOOTH X-RAY REFLECTION GRATING FABRICATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2940-2945
Authors:
UEHARA Y
LINDLE DW
CALLCOTT TA
TERMINELLO LT
HIMPSEL FJ
EDERER DL
UNDERWOOD JH
GULLIKSON EM
PERERA RCC
Citation: Y. Uehara et al., RESONANT INELASTIC-SCATTERING AT THE L-EDGE OF TI IN BARIUM STRONTIUM-TITANATE BY SOFT-X-RAY FLUORESCENCE SPECTROSCOPY, Applied physics A: Materials science & processing, 65(2), 1997, pp. 179-182
Authors:
LAMBRECHT WRL
RASHKEEV SN
SEGALL B
LAWNICZAKJABLONSKA K
SUSKI T
GULLIKSON EM
UNDERWOOD JH
PERERA RCC
RIFE JC
GRZEGORY I
POROWSKI S
WICKENDEN DK
Citation: Wrl. Lambrecht et al., X-RAY-ABSORPTION, GLANCING-ANGLE REFLECTIVITY, AND THEORETICAL-STUDY OF THE N K-EDGE AND GA M(2,3)-EDGE SPECTRA IN GAN, Physical review. B, Condensed matter, 55(4), 1997, pp. 2612-2622
Authors:
LAWNICZAKJABLONSKA K
PERERA RCC
UNDERWOOD JH
GULLIKSON EM
IWANOWSKI RJ
Citation: K. Lawniczakjablonska et al., HYBRIDIZATION OF THE 3D STATES OF TRANSITION-METALS WITH THE STATES OF THE ZNS MATRIX, Physical review. B, Condensed matter, 55(16), 1997, pp. 10376-10381
Authors:
GULLIKSON EM
KOSHEVOI MO
LUKYANTSEV IV
RUPASOV AA
FEDIN DA
FEDORCHUK RV
SHIKANOV AS
SHPOLSKII MR
Citation: Em. Gullikson et al., DETERMINATION OF THE SPATIAL-RESOLUTION OF X-RAY-FILMS, Instruments and experimental techniques, 40(2), 1997, pp. 256-259
Authors:
LAWNICZAKJABLONSKA K
SUSKI T
LILIENTALWEBER Z
GULLIKSON EM
UNDERWOOD JH
PERERA RCC
DRUMMOND TJ
Citation: K. Lawniczakjablonska et al., ANISOTROPY OF THE NITROGEN CONDUCTION STATES IN THE GROUP-III NITRIDES STUDIED BY POLARIZED X-RAY-ABSORPTION, Applied physics letters, 70(20), 1997, pp. 2711-2713
Authors:
SOUFLI R
GULLIKSON EM
Citation: R. Soufli et Em. Gullikson, REFLECTANCE MEASUREMENTS ON CLEAN SURFACES FOR THE DETERMINATION OF OPTICAL-CONSTANTS OF SILICON IN THE EXTREME ULTRAVIOLET-SOFT-X-RAY REGION, Applied optics, 36(22), 1997, pp. 5499-5507
Authors:
GULLIKSON EM
KORDE R
CANFIELD LR
VEST RE
Citation: Em. Gullikson et al., STABLE SILICON PHOTODIODES FOR ABSOLUTE INTENSITY MEASUREMENTS IN THEVUV AND SOFT-X-RAY REGIONS, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 313-316
Authors:
JIA JJ
UNDERWOOD JH
GULLIKSON EM
CALLCOTT TA
PERERA RCC
Citation: Jj. Jia et al., SOFT-X-RAY ABSORPTION-SPECTROSCOPY IN 100-1000 EV REGION AT THE ALS, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 509-512
Authors:
SAVIN DW
BEIERSDORFER P
LOPEZURRUTIA JC
DECAUX V
GULLIKSON EM
KAHN SM
LIEDAHL DA
REED KJ
WIDMANN K
Citation: Dw. Savin et al., LABORATORY MEASUREMENTS OF FE-XXIV L-SHELL LINE EMISSION, The Astrophysical journal, 470(1), 1996, pp. 73-76
Authors:
VANLOEVEZIJN P
SCHLATMANN R
VERHOEVEN J
VANTIGGELEN BA
GULLIKSON EM
Citation: P. Vanloevezijn et al., NUMERICAL AND EXPERIMENTAL-STUDY OF DISORDERED MULTILAYERS FOR BROAD-BAND X-RAY REFLECTION, Applied optics, 35(19), 1996, pp. 3614-3619
Authors:
HEIMANN P
MOSSESSIAN D
WARWICK A
WANG C
MARKS S
PADMORE H
KINCAID B
GULLIKSON EM
Citation: P. Heimann et al., EXPERIMENTAL CHARACTERIZATION OF ALS UNDULATOR RADIATION, Review of scientific instruments, 66(2), 1995, pp. 1885-1888
Authors:
UNDERWOOD JH
MALEK CK
GULLIKSON EM
KRUMREY M
Citation: Jh. Underwood et al., MULTILAYER-COATED ECHELLE GRATINGS FOR SOFT X-RAYS AND EXTREME-ULTRAVIOLET, Review of scientific instruments, 66(2), 1995, pp. 2147-2150
Authors:
GULLIKSON EM
GRAMSCH E
SZAWLOWSKI M
Citation: Em. Gullikson et al., LARGE-AREA AVALANCHE PHOTODIODES FOR THE DETECTION OF SOFT X-RAYS, Applied optics, 34(22), 1995, pp. 4662-4668
Authors:
SKULINA KM
ALFORD CS
BIONTA RM
MAKOWIECKI DM
GULLIKSON EM
SOUFLI R
KORTRIGHT JB
UNDERWOOD JH
Citation: Km. Skulina et al., MOLYBDENUM BERYLLIUM MULTILAYER MIRRORS FOR NORMAL INCIDENCE IN THE EXTREME-ULTRAVIOLET, Applied optics, 34(19), 1995, pp. 3727-3730
Authors:
GULLIKSON EM
DENHAM P
MROWKA S
UNDERWOOD JH
Citation: Em. Gullikson et al., ABSOLUTE PHOTOABSORPTION MEASUREMENTS OF MG, AL, AND SI IN THE SOFT-X-RAY REGION BELOW THE L2,3 EDGES, Physical review. B, Condensed matter, 49(23), 1994, pp. 16283-16288
Authors:
HENKE BL
GULLIKSON EM
DAVIS JC
Citation: Bl. Henke et al., X-RAY INTERACTIONS - PHOTOABSORPTION, SCATTERING, TRANSMISSION AND REFLECTION AT E=50-30,000 EV, Z=1-92 (VOL 54, PG 181, 1993), Atomic data and nuclear data tables, 55(2), 1993, pp. 349-349
Authors:
HENKE BL
GULLIKSON EM
DAVIS JC
Citation: Bl. Henke et al., X-RAY INTERACTIONS - PHOTOABSORPTION, SCATTERING, TRANSMISSION, AND REFLECTION AT E=50-30,000 EV, Z=1-92, Atomic data and nuclear data tables, 54(2), 1993, pp. 181-342
Authors:
KORTRIGHT JB
GULLIKSON EM
DENHAM PE
Citation: Jb. Kortright et al., MASKED DEPOSITION TECHNIQUES FOR ACHIEVING MULTILAYER PERIOD VARIATIONS REQUIRED FOR SHORT-WAVELENGTH (68-ANGSTROM) SOFT-X-RAY IMAGING OPTICS, Applied optics, 32(34), 1993, pp. 6961-6968