Authors:
Setkus, A
Galdikas, A
Mironas, A
Strazdiene, V
Simkiene, I
Ancutiene, L
Janickis, V
Kaciulis, S
Mattogno, G
Ingo, GM
Citation: A. Setkus et al., The room temperature ammonia sensor based on improved CuxS-micro-porous-Sistructure, SENS ACTU-B, 78(1-3), 2001, pp. 208-215
Authors:
Setkus, A
Galdikas, A
Mironas, A
Simkiene, I
Ancutiene, I
Janickis, V
Kaciulis, S
Mattogno, G
Ingo, GM
Citation: A. Setkus et al., Properties of CuxS thin film based structures: influence on the sensitivity to ammonia at room temperatures, THIN SOL FI, 391(2), 2001, pp. 275-281
Authors:
Galdikas, A
Mironas, A
Senuliene, D
Strazdiene, V
Setkus, A
Zelenin, D
Citation: A. Galdikas et al., Response time based output of metal oxide gas sensors applied to evaluation of meat freshness with neural signal analysis, SENS ACTU-B, 69(3), 2000, pp. 258-265
Authors:
Galdikas, A
Mironas, A
Senuliene, D
Setkus, A
Citation: A. Galdikas et al., Specific set of the time constants for characterisation of organic volatile compounds in the output of metal oxide sensors, SENS ACTU-B, 68(1-3), 2000, pp. 335-343
Citation: A. Galdikas et L. Pranevicius, Surface composition changes of ternary alloys in the non-steady state regime of preferential sputtering, NUCL INST B, 164, 2000, pp. 868-872
Authors:
Logothetidis, S
Patsalas, P
Gioti, M
Galdikas, A
Pranevicius, L
Citation: S. Logothetidis et al., Growth kinetics of sputtered amorphous carbon thin films: composition studies and phenomenological model, THIN SOL FI, 376(1-2), 2000, pp. 56-66
Authors:
Galdikas, A
Mironas, A
Senuliene, D
Setkus, A
Gopel, W
Schierbaum, KD
Citation: A. Galdikas et al., Copper on-top-sputtering induced modification of tin dioxide thin film gassensors, SENS ACTU-B, 58(1-3), 1999, pp. 330-337
Authors:
Galdikas, A
Kaciulis, S
Mattogno, G
Mironas, A
Napoli, A
Senuliene, D
Setkus, A
Citation: A. Galdikas et al., Thickness effect of constituent layers on gas sensitivity in SnO2[metal]/metal multi-layers, SENS ACTU-B, 58(1-3), 1999, pp. 478-485
Citation: A. Grigonis et al., The oxidation of surface layers during reactive ion etching of GaAs in CF2Cl2+O-2 and O-2 plasmas, APPL SURF S, 139, 1999, pp. 581-586
Citation: A. Galdikas, Surface topography development and ion mixing in the study of depth profiling of multilayered structures, VACUUM, 55(1), 1999, pp. 51-58