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Results: 1-10 |
Results: 10
Minimizing errors in electron microprobe analysis
Authors: Lifshin, E Gauvin, R
Citation: E. Lifshin et R. Gauvin, Minimizing errors in electron microprobe analysis, MICROS MICR, 7(2), 2001, pp. 168-177
Simulation of X-ray emission from rough surfaces
Authors: Gauvin, R Lifshin, E
Citation: R. Gauvin et E. Lifshin, Simulation of X-ray emission from rough surfaces, MIKROCH ACT, 132(2-4), 2000, pp. 201-204
Flow dynamics in double-scaled porous media
Authors: Henzel, Y Breard, J Faitout, P Cayeux, D Gauvin, R
Citation: Y. Henzel et al., Flow dynamics in double-scaled porous media, CR AC S IIB, 327(11), 1999, pp. 1171-1177
Effect of in situ plasma oxidation of TiN diffusion barrier for AlSiCu/TiN/Ti metallization structure of integrated circuits
Authors: Fortin, V Gujrathi, SC Gagnon, G Gauvin, R Currie, JF Ouellet, L Tremblay, Y
Citation: V. Fortin et al., Effect of in situ plasma oxidation of TiN diffusion barrier for AlSiCu/TiN/Ti metallization structure of integrated circuits, J VAC SCI B, 17(2), 1999, pp. 423-431
Compaction of textile reinforcements for composites manufacturing. III. Reorganization of the fiber network
Authors: Robitaille, F Gauvin, R
Citation: F. Robitaille et R. Gauvin, Compaction of textile reinforcements for composites manufacturing. III. Reorganization of the fiber network, POLYM COMP, 20(1), 1999, pp. 48-61
Some theoretical considerations on x-ray microanalysis in the environmental or variable pressure scanning electron microscope
Authors: Gauvin, R
Citation: R. Gauvin, Some theoretical considerations on x-ray microanalysis in the environmental or variable pressure scanning electron microscope, SCANNING, 21(6), 1999, pp. 388-393
The effect of fast secondary electrons on x-ray microanalysis in the scanning electron microscope
Authors: Gauvin, R Hovington, P Drouin, D
Citation: R. Gauvin et al., The effect of fast secondary electrons on x-ray microanalysis in the scanning electron microscope, SCANNING, 21(4), 1999, pp. 238-245
Electron backscattering profile of rough surfaces
Authors: Gauvin, R Lifshin, E
Citation: R. Gauvin et E. Lifshin, Electron backscattering profile of rough surfaces, SCANNING, 21(2), 1999, pp. 144-145
Forest analysis under partly cloudy conditions for large mosaics of CASI data
Authors: Davison, D Price, R Mah, S Gauvin, R Achal, S
Citation: D. Davison et al., Forest analysis under partly cloudy conditions for large mosaics of CASI data, AUTOMATED INTERPRETATION OF HIGH SPATIAL RESOLUTION DIGITAL IMAGERY FOR FORESTRY, INTERNATIONAL FORUM, 1999, pp. 255-264
Statistical considerations in microanalysis by energy-dispersive spectrometry
Authors: Lifshin, E Doganaksoy, N Sirois, J Gauvin, R
Citation: E. Lifshin et al., Statistical considerations in microanalysis by energy-dispersive spectrometry, MICROS MICR, 4(6), 1998, pp. 598-604
Risultati: 1-10 |