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Results:
1-7
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Results: 7
Authors:
Giannazzo, F
Raineri, V
Privitera, V
Priolo, F
Citation: F. Giannazzo et al., High-resolution scanning capacitance microscopy by angle bevelling, MAT SC S PR, 4(1-3), 2001, pp. 77-80
Authors:
Ciampolini, L
Giannazzo, F
Ciappa, M
Fichtner, W
Raineri, V
Citation: L. Ciampolini et al., Simulation of scanning capacitance microscopy measurements on micro-sectioned and bevelled n(+)-p samples, MAT SC S PR, 4(1-3), 2001, pp. 85-88
Authors:
Toth, AL
Dozsa, L
Gyulai, J
Giannazzo, F
Raineri, V
Citation: Al. Toth et al., SCTS: scanning capacitance transient spectroscopy, MAT SC S PR, 4(1-3), 2001, pp. 89-91
Authors:
Giannazzo, F
Musumeci, P
Calcagno, L
Makhtari, A
Raineri, V
Citation: F. Giannazzo et al., Carrier concentration profiles in 6H-SiC by scanning capacitance microscopy, MAT SC S PR, 4(1-3), 2001, pp. 195-199
Authors:
Giannazzo, F
Calcagno, L
Raineri, V
Ciampolini, L
Ciappa, M
Napolitani, E
Citation: F. Giannazzo et al., Quantitative carrier profiling in ion-implanted 6H-SiC, APPL PHYS L, 79(8), 2001, pp. 1211-1213
Authors:
Giannazzo, F
Priolo, F
Raineri, V
Privitera, V
Citation: F. Giannazzo et al., Two-dimensional profiling and size effects on the transient enhanced diffusion of ultralow-energy B implants in Si, APPL PHYS L, 78(5), 2001, pp. 598-600
Authors:
Giannazzo, F
Priolo, F
Raineri, V
Privitera, V
Citation: F. Giannazzo et al., High-resolution scanning capacitance microscopy of silicon devices by surface beveling, APPL PHYS L, 76(18), 2000, pp. 2565-2567
Risultati:
1-7
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