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Results: 1-4 |
Results: 4

Authors: Lysenko, VS Nazarov, AN Kilchytska, VI Osiyuk, IN Tyagulski, IP Gomeniuk, YV Barchuk, IP
Citation: Vs. Lysenko et al., Thermally activated processes in the buried oxide of SIMOX SOI structures and devices, SOL ST ELEC, 45(4), 2001, pp. 575-584

Authors: Lysenko, VS Tyagulski, IP Gomeniuk, YV Osiyuk, IN
Citation: Vs. Lysenko et al., Effect of oxide-semiconductor interface traps on low-temperature operationof MOSFETs, MICROEL REL, 40(4-5), 2000, pp. 735-738

Authors: Lysenko, VS Tyagulski, IP Gomeniuk, YV Osiyuk, IN
Citation: Vs. Lysenko et al., Effect of traps in the transition Si/SiO2 layer on input characteristics of SOI transistors, MICROEL REL, 40(4-5), 2000, pp. 799-802

Authors: Lysenko, VS Tyagulski, IP Gomeniuk, YV Osiyuk, IN Mikhnov, AK
Citation: Vs. Lysenko et al., Electrical characterization of the amorphous SiC-pSi structure, MICROEL ENG, 48(1-4), 1999, pp. 265-268
Risultati: 1-4 |