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Results: 1-11 |
Results: 11
Electrical characterization of CVD diamond-n(+) silicon junctions
Authors: Rodrigues, AM Gomes, HL Stallinga, P Pereira, L Pereira, E
Citation: Am. Rodrigues et al., Electrical characterization of CVD diamond-n(+) silicon junctions, DIAM RELAT, 10(3-7), 2001, pp. 858-862
Electrical characterization of pn-junctions of PPV and silicon
Authors: Stallinga, P Gomes, HL Charas, A Morgado, J Alcacer, L
Citation: P. Stallinga et al., Electrical characterization of pn-junctions of PPV and silicon, SYNTH METAL, 121(1-3), 2001, pp. 1535-1536
Minority-carrier effects in poly-phenylenevinylene as studied by electrical characterization
Authors: Stallinga, P Gomes, HL Rost, H Holmes, AB Harrison, MG Friend, RH
Citation: P. Stallinga et al., Minority-carrier effects in poly-phenylenevinylene as studied by electrical characterization, J APPL PHYS, 89(3), 2001, pp. 1713-1724
Electronic levels in MEH-PPV
Authors: Stallinga, P Gomes, HL Rost, H Holmes, AB Harrison, MG Friend, RH
Citation: P. Stallinga et al., Electronic levels in MEH-PPV, SYNTH METAL, 111, 2000, pp. 535-537
Determination of deep and shallow levels in conjugated polymers by electrical methods
Authors: Stallinga, P Gomes, HL Rost, H Holmes, AB Harrison, MG Friend, RH Biscarini, F Taliani, C Jones, GW Taylor, DM
Citation: P. Stallinga et al., Determination of deep and shallow levels in conjugated polymers by electrical methods, PHYSICA B, 274, 1999, pp. 923-926
Influence of the metal center on the morphology of coordination compounds thin films
Authors: Toffolo, F Brinkmann, M Greco, O Biscarini, F Taliani, C Gomes, HL Aiello, I Ghedini, M
Citation: F. Toffolo et al., Influence of the metal center on the morphology of coordination compounds thin films, SYNTH METAL, 101(1-3), 1999, pp. 140-141
Photocurrents in P3MeT Schottky barrier diodes
Authors: Jones, GW Taylor, DM Gomes, HL
Citation: Gw. Jones et al., Photocurrents in P3MeT Schottky barrier diodes, SYNTH METAL, 101(1-3), 1999, pp. 431-432
Electrical study of impurity states in conjugated polymers
Authors: Stallinga, P Gomes, HL Jones, GW Taylor, DM
Citation: P. Stallinga et al., Electrical study of impurity states in conjugated polymers, SYNTH METAL, 101(1-3), 1999, pp. 496-497
Interface properties and capacitance-voltage behaviour of diamond devices prepared by microwave-assisted CVD
Authors: Rodrigues, AM Gomes, HL Rees, JA Pereira, L Pereira, E
Citation: Am. Rodrigues et al., Interface properties and capacitance-voltage behaviour of diamond devices prepared by microwave-assisted CVD, PHYS ST S-A, 174(1), 1999, pp. 165-170
Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods
Authors: Gomes, HL Stallinga, P Rost, H Holmes, AB Harrison, MG Friend, RH
Citation: Hl. Gomes et al., Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods, APPL PHYS L, 74(8), 1999, pp. 1144-1146
Schottky barrier diodes from diamond grown by microwave plasma assisted chemical vapor deposition (MPCVD)
Authors: Pereira, L Gomes, HL Rodrigues, A Pereira, E
Citation: L. Pereira et al., Schottky barrier diodes from diamond grown by microwave plasma assisted chemical vapor deposition (MPCVD), DIAM FILM T, 8(4), 1998, pp. 261-270
Risultati: 1-11 |