Authors:
Chana, OS
Kuzhakhmetov, AR
Hyland, DM
Eastell, CJ
Dew-Hughes, D
Grovenor, CRM
Koval, Y
Mossle, M
Kleiner, R
Muller, P
Warburton, PA
Citation: Os. Chana et al., Fabrication and measurement of intrinsic Josephson junctions in misalignedfilms of Tl2Ba2CaCu2O8, IEEE APPL S, 11(1), 2001, pp. 2711-2714
Authors:
Gladstone, TA
Moore, JC
Wilkinson, AJ
Grovenor, CRM
Citation: Ta. Gladstone et al., Grain boundary misorientation and thermal grooving in cube-textured Ni andNi-Cr tape, IEEE APPL S, 11(1), 2001, pp. 2923-2926
Authors:
Warburton, PA
Chana, OS
Kuzhakhmetov, AR
Hyland, DMC
Dew-Hughes, D
Grovenor, CRM
Koval, Y
Muller, P
Citation: Pa. Warburton et al., In-plane magnetic field dependence of intrinsic Josephson junctions in Tl-Ba-Ca-Cu-O thin films, IEEE APPL S, 11(1), 2001, pp. 300-303
Authors:
Goodall, R
Moore, JC
Pecz, B
Grime, GW
Salter, CJ
Grovenor, CRM
Citation: R. Goodall et al., Fabrication of cube-textured Ag-buffered Ni substrates by electro-epitaxial deposition, SUPERCOND S, 14(3), 2001, pp. 124-129
Authors:
Chana, OS
Kuzhakhumetov, AR
Hyland, DMC
Dew-Hughes, D
Grovenor, CRM
Koval, Y
Kleiner, R
Muffer, P
Warburton, PA
Citation: Os. Chana et al., Properties of Tl2Ba2CaCu2O8 thin film intrinsic Josephson junctions in an in-plane magnetic field, PHYSICA C, 362, 2001, pp. 265-268
Authors:
Henry, BM
Erlat, AG
McGuigan, A
Grovenor, CRM
Briggs, GAD
Tsukahara, Y
Miyamoto, T
Noguchi, N
Niijima, T
Citation: Bm. Henry et al., Characterization of transparent aluminium oxide and indium tin oxide layers on polymer substrates, THIN SOL FI, 382(1-2), 2001, pp. 194-201
Authors:
Chana, OS
Kuzhakhmetov, AR
Warburton, PA
Hyland, DMC
Dew-Hughes, D
Grovenor, CRM
Kinsey, RJ
Burnell, G
Booij, WE
Blamire, MG
Kleiner, R
Muller, P
Citation: Os. Chana et al., Alternating current Josephson effect in intrinsic Josephson bridges in Tl2Ba2CaCu2O8 thin films, APPL PHYS L, 76(24), 2000, pp. 3603-3605
Authors:
Gladstone, TA
Moore, JC
Wilkinson, AJ
Grovenor, CRM
Citation: Ta. Gladstone et al., Fabrication of biaxially textured Ni substrates and LaNiO3 buffer layers for Tl-1223 thick films, IEEE APPL S, 9(2), 1999, pp. 2252-2255
Authors:
Henry, BM
Norenberg, H
Dinelli, F
Grovenor, CRM
Briggs, GAD
Tsukahara, Y
Miyamoto, T
Citation: Bm. Henry et al., The effect of thermal cycling damage on the permeability and structure of transparent gas barrier films, CHEM ENG TE, 22(12), 1999, pp. 1010-1011
Authors:
Pekala, M
Bougrine, H
Gadomski, W
Morgan, CG
Grovenor, CRM
Cloots, R
Ausloos, M
Citation: M. Pekala et al., Distribution of vortex lattice melting temperatures in mixed state diagramof Bi2212 tapes (vol 303, pg 169, 1998), PHYSICA C, 308(3-4), 1998, pp. 313-313