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Results: 1-23 |
Results: 23

Authors: Chana, OS Kuzhakhmetov, AR Hyland, DM Eastell, CJ Dew-Hughes, D Grovenor, CRM Koval, Y Mossle, M Kleiner, R Muller, P Warburton, PA
Citation: Os. Chana et al., Fabrication and measurement of intrinsic Josephson junctions in misalignedfilms of Tl2Ba2CaCu2O8, IEEE APPL S, 11(1), 2001, pp. 2711-2714

Authors: Gladstone, TA Moore, JC Wilkinson, AJ Grovenor, CRM
Citation: Ta. Gladstone et al., Grain boundary misorientation and thermal grooving in cube-textured Ni andNi-Cr tape, IEEE APPL S, 11(1), 2001, pp. 2923-2926

Authors: Warburton, PA Chana, OS Kuzhakhmetov, AR Hyland, DMC Dew-Hughes, D Grovenor, CRM Koval, Y Muller, P
Citation: Pa. Warburton et al., In-plane magnetic field dependence of intrinsic Josephson junctions in Tl-Ba-Ca-Cu-O thin films, IEEE APPL S, 11(1), 2001, pp. 300-303

Authors: Goodall, R Moore, JC Pecz, B Grime, GW Salter, CJ Grovenor, CRM
Citation: R. Goodall et al., Fabrication of cube-textured Ag-buffered Ni substrates by electro-epitaxial deposition, SUPERCOND S, 14(3), 2001, pp. 124-129

Authors: Chana, OS Kuzhakhumetov, AR Hyland, DMC Dew-Hughes, D Grovenor, CRM Koval, Y Kleiner, R Muffer, P Warburton, PA
Citation: Os. Chana et al., Properties of Tl2Ba2CaCu2O8 thin film intrinsic Josephson junctions in an in-plane magnetic field, PHYSICA C, 362, 2001, pp. 265-268

Authors: Yanaka, M Henry, BM Roberts, AP Grovenor, CRM Briggs, GAD Sutton, AP Miyamoto, T Tsukahara, Y Takeda, N Chater, RJ
Citation: M. Yanaka et al., How cracks in SiOx-coated polyester films affect gas permeation, THIN SOL FI, 397(1-2), 2001, pp. 176-185

Authors: Erlat, AG Henry, BM Ingram, JJ Mountain, DB McGuigan, A Howson, RP Grovenor, CRM Briggs, GAD Tsukahara, Y
Citation: Ag. Erlat et al., Characterisation of aluminium oxynitride gas barrier films, THIN SOL FI, 388(1-2), 2001, pp. 78-86

Authors: Henry, BM Erlat, AG McGuigan, A Grovenor, CRM Briggs, GAD Tsukahara, Y Miyamoto, T Noguchi, N Niijima, T
Citation: Bm. Henry et al., Characterization of transparent aluminium oxide and indium tin oxide layers on polymer substrates, THIN SOL FI, 382(1-2), 2001, pp. 194-201

Authors: Gladstone, TA Moore, JC Henry, BM Speller, S Salter, CJ Wilkinson, AJ Grovenor, CRM
Citation: Ta. Gladstone et al., Control of texture in Ag and Ag-alloy substrates for superconducting tapes, SUPERCOND S, 13(9), 2000, pp. 1399-1407

Authors: Stevens, CJ Grovenor, CRM Edwards, DJ
Citation: Cj. Stevens et al., Selective epitaxial fabrication of TBCCO microstrip devices and structures, SUPERCOND S, 13(12), 2000, pp. L31-L33

Authors: Kuzhakhmetov, AR Jenkins, AP Grovenor, CRM Warburton, PA Dew-Hughes, D
Citation: Ar. Kuzhakhmetov et al., Magnetically tunable Tl2Ba2CaCu2O8-based microstrip ring resonators, ELECTR LETT, 36(7), 2000, pp. 688-689

Authors: Chana, OS Kuzhakhmetov, AR Warburton, PA Hyland, DMC Dew-Hughes, D Grovenor, CRM Kinsey, RJ Burnell, G Booij, WE Blamire, MG Kleiner, R Muller, P
Citation: Os. Chana et al., Alternating current Josephson effect in intrinsic Josephson bridges in Tl2Ba2CaCu2O8 thin films, APPL PHYS L, 76(24), 2000, pp. 3603-3605

Authors: Jenkins, AP Dew-Hughes, D Edwards, DJ Hyland, D Grovenor, CRM
Citation: Ap. Jenkins et al., Application of TBCCO based HTS devices to digital cellular communications, IEEE APPL S, 9(2), 1999, pp. 2849-2852

Authors: Moore, JC Bisset, MI Knoll, DC Marin, J Peterson, S Roney, AB Sastry, PVPSS Schwartz, J Gladstone, TA Grovenor, CRM
Citation: Jc. Moore et al., Effect of deposition method on the uniformity of Hg-1212 thick films, IEEE APPL S, 9(2), 1999, pp. 1692-1695

Authors: Moore, JC Naylor, MJ Grovenor, CRM
Citation: Jc. Moore et al., Optimization of phase formation and microstructure in Tl-1223 thick films, IEEE APPL S, 9(2), 1999, pp. 1787-1790

Authors: Naylor, MJ Grovenor, CRM
Citation: Mj. Naylor et Crm. Grovenor, Melt processing of Bi-2212 on MgO and MgO-buffered substrates, IEEE APPL S, 9(2), 1999, pp. 1860-1863

Authors: Balmer, BR Grovenor, CRM Riddle, R
Citation: Br. Balmer et al., Stoichiometric variations of Bi 2212 electrophoretically deposited thick films, IEEE APPL S, 9(2), 1999, pp. 1888-1891

Authors: Gladstone, TA Moore, JC Wilkinson, AJ Grovenor, CRM
Citation: Ta. Gladstone et al., Fabrication of biaxially textured Ni substrates and LaNiO3 buffer layers for Tl-1223 thick films, IEEE APPL S, 9(2), 1999, pp. 2252-2255

Authors: Bramley, AP O'Connor, JD Grovenor, CRM
Citation: Ap. Bramley et al., Thallium-based HTS thin films, processing, properties and applications, SUPERCOND S, 12(5), 1999, pp. R57-R74

Authors: Henry, BM Norenberg, H Dinelli, F Grovenor, CRM Briggs, GAD Tsukahara, Y Miyamoto, T
Citation: Bm. Henry et al., The effect of thermal cycling damage on the permeability and structure of transparent gas barrier films, CHEM ENG TE, 22(12), 1999, pp. 1010-1011

Authors: Chana, OS Hyland, DMC Kinsey, RJ Booij, WE Blamire, MG Grovenor, CRM Dew-Hughes, D Warburton, PA
Citation: Os. Chana et al., Josephson effects in misaligned Tl-2212 films, PHYSICA C, 327, 1999, pp. 104-110

Authors: Henry, BM Dinelli, F Zhao, KY Grovenor, CRM Kolosov, OV Briggs, GAD Roberts, AP Kumar, RS Howson, RP
Citation: Bm. Henry et al., A microstructural study of transparent metal oxide gas barrier films, THIN SOL FI, 356, 1999, pp. 500-505

Authors: Pekala, M Bougrine, H Gadomski, W Morgan, CG Grovenor, CRM Cloots, R Ausloos, M
Citation: M. Pekala et al., Distribution of vortex lattice melting temperatures in mixed state diagramof Bi2212 tapes (vol 303, pg 169, 1998), PHYSICA C, 308(3-4), 1998, pp. 313-313
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