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Results: 1-13 |
Results: 13
HIGH-QUALITY BREWSTERS ANGLE POLARIZER FOR BROAD-BAND INFRARED APPLICATION
Authors: DUMMER DJ KAPLAN SG HANSSEN LM PINE AS ZONG YG
Citation: Dj. Dummer et al., HIGH-QUALITY BREWSTERS ANGLE POLARIZER FOR BROAD-BAND INFRARED APPLICATION, Applied optics, 37(7), 1998, pp. 1194-1204
MAGNIFICATION OF CONIC MIRROR REFLECTOMETERS (VOL 37, PG 4143, 1998)
Authors: SNAIL KA HANSSEN LM
Citation: Ka. Snail et Lm. Hanssen, MAGNIFICATION OF CONIC MIRROR REFLECTOMETERS (VOL 37, PG 4143, 1998), Applied optics, 37(28), 1998, pp. 6695-6695
MAGNIFICATION OF CONIC MIRROR REFLECTOMETERS
Authors: SNAIL KA HANSSEN LM
Citation: Ka. Snail et Lm. Hanssen, MAGNIFICATION OF CONIC MIRROR REFLECTOMETERS, Applied optics, 37(19), 1998, pp. 4143-4149
A PROCEDURE FOR TESTING THE RADIOMETRIC ACCURACY OF FOURIER-TRANSFORMINFRARED SPECTROMETERS
Authors: ZHANG ZM HANSSEN LM HSIA JJ DATLA RU ZHU CJ GRIFFITHS PR
Citation: Zm. Zhang et al., A PROCEDURE FOR TESTING THE RADIOMETRIC ACCURACY OF FOURIER-TRANSFORMINFRARED SPECTROMETERS, Mikrochimica acta, 1997, pp. 315-316
A COMPUTER-SIMULATION OF THE NONLINEARITY EFFECT ON FT-IR MEASUREMENTS
Authors: ZHANG ZM HANSSEN LM
Citation: Zm. Zhang et Lm. Hanssen, A COMPUTER-SIMULATION OF THE NONLINEARITY EFFECT ON FT-IR MEASUREMENTS, Mikrochimica acta, 1997, pp. 317-319
ABSOLUTE DETECTOR CALIBRATION APPLIED TO NONLINEARITY ERROR-CORRECTION IN FT-IR MEASUREMENTS
Authors: ZHANG ZM ZHU CJ HANSSEN LM
Citation: Zm. Zhang et al., ABSOLUTE DETECTOR CALIBRATION APPLIED TO NONLINEARITY ERROR-CORRECTION IN FT-IR MEASUREMENTS, Applied spectroscopy, 51(4), 1997, pp. 576-579
TESTING THE RADIOMETRIC ACCURACY OF FOURIER-TRANSFORM INFRARED TRANSMITTANCE MEASUREMENTS
Authors: KAPLAN SG HANSSEN LM DATLA RU
Citation: Sg. Kaplan et al., TESTING THE RADIOMETRIC ACCURACY OF FOURIER-TRANSFORM INFRARED TRANSMITTANCE MEASUREMENTS, Applied optics, 36(34), 1997, pp. 8896-8908
POLARIZATION-DEPENDENT ANGULAR REFLECTANCE OF SILICON AND GERMANIUM IN THE INFRARED
Authors: ZHANG ZM HANSSEN LM DATLA RU
Citation: Zm. Zhang et al., POLARIZATION-DEPENDENT ANGULAR REFLECTANCE OF SILICON AND GERMANIUM IN THE INFRARED, Infrared physics & technology, 37(4), 1996, pp. 539-546
AN APPARATUS FOR INFRARED TRANSMITTANCE AND REFLECTANCE MEASUREMENTS AT CRYOGENIC TEMPERATURES
Authors: ZHANG ZM HANSSEN LM DATLA RU DREW HD
Citation: Zm. Zhang et al., AN APPARATUS FOR INFRARED TRANSMITTANCE AND REFLECTANCE MEASUREMENTS AT CRYOGENIC TEMPERATURES, International journal of thermophysics, 17(6), 1996, pp. 1441-1454
EFFECTS OF NON-LAMBERTIAN SURFACES ON INTEGRATING SPHERE MEASUREMENTS
Authors: HANSSEN LM
Citation: Lm. Hanssen, EFFECTS OF NON-LAMBERTIAN SURFACES ON INTEGRATING SPHERE MEASUREMENTS, Applied optics, 35(19), 1996, pp. 3597-3606
HIGH-OPTICAL-DENSITY OUT-OF-BAND SPECTRAL TRANSMITTANCE MEASUREMENTS OF BANDPASS-FILTERS
Authors: ZHANG ZM HANSSEN LM DATLA RU
Citation: Zm. Zhang et al., HIGH-OPTICAL-DENSITY OUT-OF-BAND SPECTRAL TRANSMITTANCE MEASUREMENTS OF BANDPASS-FILTERS, Optics letters, 20(9), 1995, pp. 1077-1079
IMPROVED INTEGRATING-SPHERE THROUGHPUT WITH A LENS AND NONIMAGING CONCENTRATOR
Authors: CHENAULT DB SNAIL KA HANSSEN LM
Citation: Db. Chenault et al., IMPROVED INTEGRATING-SPHERE THROUGHPUT WITH A LENS AND NONIMAGING CONCENTRATOR, Applied optics, 34(34), 1995, pp. 7959-7964
CONFIRMATION OF (113) FACETS ON DIAMOND GROWN BY CHEMICAL-VAPOR-DEPOSITION
Authors: SNAIL KA LU ZP WEIMER R HEBERLEIN J PFENDER E HANSSEN LM
Citation: Ka. Snail et al., CONFIRMATION OF (113) FACETS ON DIAMOND GROWN BY CHEMICAL-VAPOR-DEPOSITION, Journal of crystal growth, 137(3-4), 1994, pp. 676-679
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