Authors:
JOHS B
HERZINGER CM
DINAN JH
CORNFELD A
BENSON JD
Citation: B. Johs et al., DEVELOPMENT OF A PARAMETRIC OPTICAL-CONSTANT MODEL FOR HG1-XCDXTE FORCONTROL OF COMPOSITION BY SPECTROSCOPIC ELLIPSOMETRY DURING MBE GROWTH, Thin solid films, 313, 1998, pp. 137-142
Citation: Cm. Herzinger et al., A MULTISAMPLE, MULTIWAVELENGTH, MULTI-ANGLE INVESTIGATION OF THE INTERFACE LAYER BETWEEN SILICON AND THERMALLY GROWN SILICON DIOXIDE, Thin solid films, 313, 1998, pp. 281-285
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Authors:
HERZINGER CM
JOHS B
MCGAHAN WA
WOOLLAM JA
PAULSON W
Citation: Cm. Herzinger et al., ELLIPSOMETRIC DETERMINATION OF OPTICAL-CONSTANTS FOR SILICON AND THERMALLY GROWN SILICON DIOXIDE VIA A MULTISAMPLE, MULTIWAVELENGTH, MULTI-ANGLE INVESTIGATION, Journal of applied physics, 83(6), 1998, pp. 3323-3336
Authors:
SCHUBERT M
RHEINLANDER B
CRAMER C
SCHMIEDEL H
WOOLLAM JA
HERZINGER CM
JOHS B
Citation: M. Schubert et al., GENERALIZED TRANSMISSION ELLIPSOMETRY FOR TWISTED BIAXIAL DIELECTRIC MEDIA - APPLICATION TO CHIRAL LIQUID-CRYSTALS, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(9), 1996, pp. 1930-1940
Authors:
SCHUBERT M
RHEINLANDER B
WOOLLAM JA
JOHS B
HERZINGER CM
Citation: M. Schubert et al., EXTENSION OF ROTATING-ANALYZER ELLIPSOMETRY TO GENERALIZED ELLIPSOMETRY - DETERMINATION OF THE DIELECTRIC FUNCTION TENSOR FROM UNIAXIAL TIO2, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(4), 1996, pp. 875-883
Authors:
HERZINGER CM
SNYDER PG
CELLI FG
KAO YC
CHOW D
JOHS B
WOOLLAM JA
Citation: Cm. Herzinger et al., STUDIES OF THIN STRAINED INAS, ALAS, AND ALSB LAYERS BY SPECTROSCOPICELLIPSOMETRY, Journal of applied physics, 79(5), 1996, pp. 2663-2674
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ZOLLNER S
HERZINGER CM
WOOLLAM JA
IYER SS
POWELL AP
EBERL K
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Authors:
HERZINGER CM
YAO H
SNYDER PG
CELII FG
KAO YC
JOHS B
WOOLLAM JA
Citation: Cm. Herzinger et al., DETERMINATION OF ALAS OPTICAL-CONSTANTS BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY AND A MULTISAMPLE ANALYSIS, Journal of applied physics, 77(9), 1995, pp. 4677-4687
Citation: Cm. Herzinger et al., INP OPTICAL-CONSTANTS BETWEEN 0.75 AND 5.0 EV DETERMINED BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY, Journal of applied physics, 77(4), 1995, pp. 1715-1724
Authors:
CROOK AC
COCKERILL TM
FORBES DV
HERZINGER CM
DETEMPLE TA
COLEMAN JJ
Citation: Ac. Crook et al., LOW DRIVE VOLTAGE GAAS QUANTUM-WELL ELECTROABSORPTION MODULATORS OBTAINED WITH A DISPLACED JUNCTION, IEEE photonics technology letters, 6(5), 1994, pp. 619-622
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CROOK AC
HERZINGER CM
COCKERILL TM
FORBES DV
HONIG J
DETEMPLE TA
COLEMAN JJ
WHITE IA
BESSE PA
Citation: Ac. Crook et al., MODAL PROPERTIES OF DEPRESSED CLADDING SEMICONDUCTOR WAVE-GUIDES AND LASERS, IEEE journal of quantum electronics, 30(12), 1994, pp. 2817-2826
Citation: Cm. Herzinger et al., THE SEMICONDUCTOR WAVE-GUIDE FACET REFLECTIVITY PROBLEM, IEEE journal of quantum electronics, 29(8), 1993, pp. 2273-2281
Citation: Ta. Detemple et Cm. Herzinger, ON THE SEMICONDUCTOR-LASER LOGARITHMIC GAIN CURRENT-DENSITY RELATION, IEEE journal of quantum electronics, 29(5), 1993, pp. 1246-1252
Authors:
CARRIERI AH
SCHMITT CJ
HERZINGER CM
JENSEN JO
Citation: Ah. Carrieri et al., COMPUTATION, VISUALIZATION, AND ANIMATION OF INFRARED MUELLER MATRIX-ELEMENTS BY SCATTERING FROM SURFACES THAT ARE ABSORBING AND RANDOMLY ROUGH, Applied optics, 32(31), 1993, pp. 6264-6269