Authors:
SETSUHARA Y
SUZUKI T
TANAKA Y
MIYAKE S
SUZUKI M
KUMAGAI M
OGATA K
KOHATA M
HIGETA K
EINISHI T
SUZUKI Y
SHIMOITANI Y
MOTONAMI Y
Citation: Y. Setsuhara et al., INTERFACIAL STRUCTURE CONTROL OF CUBIC BORON-NITRIDE FILMS PREPARED BY ION-BEAM-ASSISTED DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 851-856
Authors:
KUMAGAI M
SUZUKI M
SUZUKI T
TANAKA Y
SETSUHARA Y
MIYAKE S
OGATA K
KOHATA M
HIGETA K
EINISHI T
SUZUKI Y
SHIMOITANI Y
MOTONAMI Y
Citation: M. Kumagai et al., PROPERTIES OF DEPTH-PROFILE CONTROLLED BORON-NITRIDE FILMS PREPARED BY ION-BEAM-ASSISTED DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 977-980
Authors:
HIGETA K
USAMI M
OHAYASHI M
FUJIMURA Y
NISHIYAMA M
ISOMURA S
YAMAGUCHI K
IDEI Y
NAMBU H
OHHATA K
HANTA N
Citation: K. Higeta et al., A SOFT-ERROR-IMMUNE 0.9-NS 1.15-MB ECL-CMOS SRAM WITH 30-PS 120 K LOGIC GATES AND ON-CHIP TEST CIRCUITRY, IEEE journal of solid-state circuits, 31(10), 1996, pp. 1443-1450
Authors:
HIGETA K
YOSHIDA Y
SATO M
MOTONAMI Y
KUMAGAI M
SAITO H
SATOU M
Citation: K. Higeta et al., METALLURGICAL STUDY ON HARDNESS DISTRIBUTION BY HIGH-ENERGY ION-IMPLANTATION TAKING NOTICE OF SOLID-SOLUBILITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 237-241