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Results: 1-12 |
Results: 12
CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES
Authors: DIECKHOFF S HOPER R SCHLETT V GESANG T POSSART W HENNEMANN OD GUNSTER J KEMPTER V
Citation: S. Dieckhoff et al., CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 258-262
ADSORPTION AND GROWTH OF DIP-COATING PREPOLYMER FILMS ON SILICON-WAFERS - AN ATOMIC-FORCE MICROSCOPE STUDY
Authors: GESANG T HOPER R POSSART W PETERMANN J HENNEMANN OD
Citation: T. Gesang et al., ADSORPTION AND GROWTH OF DIP-COATING PREPOLYMER FILMS ON SILICON-WAFERS - AN ATOMIC-FORCE MICROSCOPE STUDY, Applied surface science, 115(1), 1997, pp. 10-22
AFM STUDIES OF THE INITIAL-STAGES OF SPIN-COATED PREPOLYMER FILM GROWTH ON SILICON-WAFERS
Authors: GESANG T HOPER R POSSART W PETERMANN J HENNEMANN OD
Citation: T. Gesang et al., AFM STUDIES OF THE INITIAL-STAGES OF SPIN-COATED PREPOLYMER FILM GROWTH ON SILICON-WAFERS, Advanced materials, 8(10), 1996, pp. 829
CHARACTERIZATION OF MICROMACHINED SURFACES BY ATOMIC-FORCE MICROSCOPY
Authors: BRINKSMEIER E HOPER R RIEMER O
Citation: E. Brinksmeier et al., CHARACTERIZATION OF MICROMACHINED SURFACES BY ATOMIC-FORCE MICROSCOPY, IDR. Industrial diamond review, 56(2), 1996, pp. 59-63
PREPOLYMER FILM GROWTH BY ADSORPTION OUT OF SOLUTION ON SILICON AND ALUMINUM - AN ATOMIC-FORCE MICROSCOPIC STUDY
Authors: GESANG T HOPER R DIECKHOFF S HARTWIG A POSSART W HENNEMANN OD
Citation: T. Gesang et al., PREPOLYMER FILM GROWTH BY ADSORPTION OUT OF SOLUTION ON SILICON AND ALUMINUM - AN ATOMIC-FORCE MICROSCOPIC STUDY, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 419-426
IMAGING ELASTIC SAMPLE PROPERTIES WITH AN ATOMIC-FORCE MICROSCOPE OPERATING IN THE TAPPING MODE
Authors: HOPER R GESANG T POSSART W HENNEMANN OD BOSECK S
Citation: R. Hoper et al., IMAGING ELASTIC SAMPLE PROPERTIES WITH AN ATOMIC-FORCE MICROSCOPE OPERATING IN THE TAPPING MODE, Ultramicroscopy, 60(1), 1995, pp. 17-24
AFM INVESTIGATIONS OF THE INITIAL-STAGES OF PREPOLYMER FILM GROWTH ONALUMINUM
Authors: GESANG T HOPER R DIECKHOFF S FANTER D HARTWIG A POSSART W HENNEMANN OD
Citation: T. Gesang et al., AFM INVESTIGATIONS OF THE INITIAL-STAGES OF PREPOLYMER FILM GROWTH ONALUMINUM, Applied surface science, 84(3), 1995, pp. 273-283
COMPARATIVE FILM THICKNESS DETERMINATION BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY FOR ULTRATHIN POLYMER-FILMS
Authors: GESANG T FANTER D HOPER R POSSART W HENNEMANN OD
Citation: T. Gesang et al., COMPARATIVE FILM THICKNESS DETERMINATION BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY FOR ULTRATHIN POLYMER-FILMS, Surface and interface analysis, 23(12), 1995, pp. 797-808
ORGANIC FILM FORMATION INVESTIGATED BY ATOMIC-FORCE MICROSCOPY ON THENANOMETER-SCALE
Authors: GESANG T HOPER R DIECKHOFF S SCHLETT V POSSART W HENNEMANN OD
Citation: T. Gesang et al., ORGANIC FILM FORMATION INVESTIGATED BY ATOMIC-FORCE MICROSCOPY ON THENANOMETER-SCALE, Thin solid films, 264(2), 1995, pp. 194-204
NUMERICAL SIMULATIONS OF A SCANNING FORCE MICROSCOPE WITH A LARGE-AMPLITUDE VIBRATING CANTILEVER
Authors: CHEN J WORKMAN RK SARID D HOPER R
Citation: J. Chen et al., NUMERICAL SIMULATIONS OF A SCANNING FORCE MICROSCOPE WITH A LARGE-AMPLITUDE VIBRATING CANTILEVER, Nanotechnology, 5(4), 1994, pp. 199-204
ULTRATHIN POLYMER-COATINGS INVESTIGATED BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY
Authors: GESANG T FANTER D HOPER R POSSART W HENNEMANN OD
Citation: T. Gesang et al., ULTRATHIN POLYMER-COATINGS INVESTIGATED BY ATOMIC-FORCE MICROSCOPY AND ELLIPSOMETRY, Le Vide, les couches minces, (272), 1994, pp. 350-353
SINGLE-SHELL CARBON NANOTUBES IMAGED BY ATOMIC-FORCE MICROSCOPY
Authors: HOPER R WORKMAN RK CHEN D SARID D YADAV T WITHERS JC LOUTFY RO
Citation: R. Hoper et al., SINGLE-SHELL CARBON NANOTUBES IMAGED BY ATOMIC-FORCE MICROSCOPY, Surface science, 311(3), 1994, pp. 120000731-120000736
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