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Results:
1-7
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Results: 7
Authors:
HONG JW
KHIM ZG
HOU AS
PARK SI
Citation: Jw. Hong et al., NONINVASIVE PROBING OF HIGH-FREQUENCY SIGNAL IN INTEGRATED-CIRCUITS USING ELECTROSTATIC FORCE MICROSCOPE, Review of scientific instruments, 68(12), 1997, pp. 4506-4510
Authors:
HO F
HOU AS
NECHAY BA
BLOOM DM
Citation: F. Ho et al., ULTRAFAST VOLTAGE-CONTRAST SCANNING PROBE MICROSCOPY, Nanotechnology, 7(4), 1996, pp. 385-389
Authors:
HOU AS
NECHAY BA
HO F
BLOOM DM
Citation: As. Hou et al., SCANNING PROBE MICROSCOPY FOR TESTING ULTRAFAST ELECTRONIC DEVICES, Optical and quantum electronics, 28(7), 1996, pp. 819-841
Authors:
HONG JW
KHIM ZG
HOU AS
PARK S
Citation: Jw. Hong et al., TAPPING MODE ATOMIC-FORCE MICROSCOPY USING ELECTROSTATIC FORCE MODULATION, Applied physics letters, 69(19), 1996, pp. 2831-2833
Authors:
NECHAY BA
HO F
HOU AS
BLOOM DM
Citation: Ba. Nechay et al., APPLICATIONS OF AN ATOMIC-FORCE MICROSCOPE VOLTAGE PROBE WITH ULTRAFAST TIME RESOLUTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1369-1374
Authors:
LIN CE
HOU AS
Citation: Ce. Lin et As. Hou, REAL-TIME POSITION AND ATTITUDE SENSING USING CCD CAMERAS IN MAGNETICSUSPENSION SYSTEM APPLICATIONS, IEEE transactions on instrumentation and measurement, 44(1), 1995, pp. 8-13
Authors:
HO F
HOU AS
BLOOM DM
Citation: F. Ho et al., HIGH-SPEED INTEGRATED-CIRCUIT PROBING USING A SCANNING FORCE MICROSCOPE SAMPLER, Electronics Letters, 30(7), 1994, pp. 560-562
Risultati:
1-7
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