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Results: 1-6 |
Results: 6

Authors: Herrmann, K Hasche, K Pohlenz, F Seemann, R
Citation: K. Herrmann et al., Characterisation of the geometry of indenters used for the micro- and nanoindentation method, MEASUREMENT, 29(3), 2001, pp. 201-207

Authors: Herrmann, K Jennett, NM Wegener, W Meneve, J Hasche, K Seemann, R
Citation: K. Herrmann et al., Progress in determination of the area function of indenters used for nanoindentation, THIN SOL FI, 377, 2000, pp. 394-400

Authors: Ahbe, T Hasche, K Herrmann, K Hoffmann, KP Thiele, K
Citation: T. Ahbe et al., Investigations to calibrate reference standards for the thickness of coatings, FRESEN J AN, 365(1-3), 1999, pp. 55-58

Authors: Hasche, K Wilkening, G
Citation: K. Hasche et G. Wilkening, Microsystems metrology, TEC MES, 66(12), 1999, pp. 475-475

Authors: Buchner, H Jager, G Gerhardt, U Ilmenau, TU Hasche, K
Citation: H. Buchner et al., Development of a 3D-laserinterferometric nano-measuring-system for Abbe-error-free fitting into scanning force microscopes, TEC MES, 66(12), 1999, pp. 504-510

Authors: Herrmann, K Hasche, K Seemann, R
Citation: K. Herrmann et al., Measurement of indenters with a scanning force microscope, TEC MES, 66(12), 1999, pp. 511-517
Risultati: 1-6 |