Authors:
Zhang, W
Roesel, S
Alves, HR
Meister, D
Kriegseis, W
Hofmann, DM
Meyer, BK
Riemann, T
Veit, P
Blaesing, J
Krost, A
Christen, J
Citation: W. Zhang et al., Dislocation reduction in GaN grown by hydride vapor phase epitaxy via growth interruption modulation, APPL PHYS L, 78(6), 2001, pp. 772-774
Authors:
Meyer, BK
Hofmann, DM
Volm, D
Chen, WM
Son, NT
Janzen, E
Citation: Bk. Meyer et al., Optically detected cyclotron resonance investigations on 4H and 6H SiC: Band-structure and transport properties, PHYS REV B, 61(7), 2000, pp. 4844-4849
Authors:
Dirnstorfer, I
Hofmann, DM
Meister, D
Meyer, BK
Citation: I. Dirnstorfer et al., Postgrowth thermal treatment of CuIn(Ga)Se-2: Characterization of doping levels in In-rich thin films, J APPL PHYS, 85(3), 1999, pp. 1423-1428