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Results:
1-13
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Results: 13
Authors:
KIYOKURA T
MAEDA F
WATANABE Y
SHIGEMASA E
YAGISHITA A
OSHIMA M
IKETAKI Y
HORIKAWA Y
Citation: T. Kiyokura et al., SUBMICROMETER-AREA HIGH-ENERGY-RESOLUTION PHOTOELECTRON-SPECTROSCOPY SYSTEM, Journal of synchrotron radiation, 5, 1998, pp. 1111-1113
Authors:
KIYOKURA T
MAEDA F
WATANABE Y
KADOTA Y
IKETAKI Y
HORIKAWA Y
OSHIMA M
SHIGEMASA E
YAGISHITA A
Citation: T. Kiyokura et al., PHOTOELECTRON MICROSPECTROSCOPY OBSERVATIONS OF A CLEAVED SURFACE OF SEMICONDUCTOR DOUBLE-HETEROSTRUCTURE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1086-1090
Authors:
WATANABE T
MIYATA M
IKETAKI Y
FUJII M
YAGISHITA A
Citation: T. Watanabe et al., SOFT-X-RAY MICROSCOPE IMAGING USING PHOTOEXCITATION PROCESSES AND DOUBLE-RESONANCE ABSORPTION PROCESSES, Journal of the Korean Physical Society, 32(3), 1998, pp. 388-393
Authors:
IKETAKI Y
HORIKAWA Y
MOCHIMARU S
NAGAI K
Citation: Y. Iketaki et al., FORMATION OF AN X-RAY MICROBEAM USING A SCHWARZSCHILD X-RAY OBJECTIVE, JPN J A P 1, 35(8), 1996, pp. 4585-4586
Authors:
IKETAKI Y
HORIKAWA Y
MOCHIMARU S
NAGAI K
KIYOKURA T
OSHIMA M
YAGISHITA A
Citation: Y. Iketaki et al., STUDY OF THE X-RAY MICROBEAM FOR SCANNING MICROSCOPES, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 353-356
Authors:
IKETAKI Y
WATANABE T
Citation: Y. Iketaki et T. Watanabe, STUDY OF X-RAY MICROSCOPY USING ULTRAVIOLET AND X-RAY DOUBLE-RESONANCE ABSORPTION, Optical engineering, 35(8), 1996, pp. 2418-2422
Authors:
IKETAKI Y
WATANABE T
Citation: Y. Iketaki et T. Watanabe, FEASIBILITY OF PHOTOEXCITATION IMAGING IN SOFT-X-RAY MICROSCOPY USINGTHE TRANSITION TO PI-ASTERISK ORBITS IN BIOLOGICAL MOLECULES, Review of scientific instruments, 66(2), 1995, pp. 1376-1378
Authors:
IKETAKI Y
WATANABE T
Citation: Y. Iketaki et T. Watanabe, X-RAY MICROSCOPY USING THE PHOTOEXCITATION TO UNOCCUPIED PI-CHARACTERMOLECULAR ORBITS, Review of scientific instruments, 66(2), 1995, pp. 982-986
Authors:
TAKAYANAGI I
NAGAI K
TETSUKA H
INOUE Y
ARAKI S
MOCHIMARU S
IKETAKI Y
HORIKAWA Y
MATSUMOTO K
Citation: I. Takayanagi et al., AMPLIFIED MOS IMAGER FOR SOFT-X-RAY IMAGING, I.E.E.E. transactions on electron devices, 42(8), 1995, pp. 1425-1432
Authors:
IKETAKI Y
HORIKAWA Y
MOCHIMARU S
NAGAI K
ATSUMI M
KAMIJOU H
SHIBUYA M
Citation: Y. Iketaki et al., EVALUATION OF THE OPTICAL CHARACTERISTICS OF THE SCHWARZSCHILD X-RAY OBJECTIVE, Optics letters, 19(22), 1994, pp. 1804-1806
Authors:
HORIKAWA Y
NAGAI K
IKETAKI Y
Citation: Y. Horikawa et al., SOFT-X-RAY REFLECTOMETRY WITH A LASER-PRODUCED PLASMA SOURCE, Optical engineering, 33(5), 1994, pp. 1721-1725
Authors:
IKETAKI Y
HORIKAWA Y
NAGAI K
MOCHIMARU S
OHTA Y
KAMIJOU H
SHIBUYA M
Citation: Y. Iketaki et al., MEASUREMENT OF KNIFE-EDGE RESPONSES OF A SCHWARZSCHILD X-RAY OBJECTIVE, JPN J A P 1, 32(4), 1993, pp. 1837-1841
Authors:
HORIKAWA Y
NAGAI K
MOCHIMARU S
IKETAKI Y
Citation: Y. Horikawa et al., A COMPACT SCHWARZSCHILD SOFT-X-RAY MICROSCOPE WITH A LASER-PRODUCED PLASMA SOURCE, Journal of Microscopy, 172, 1993, pp. 189-194
Risultati:
1-13
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