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Results: 1-25 |
Results: 25
X-RAY-DIFFRACTION STUDY OF THE EFFECT OF GROWTH-CONDITIONS ON THE STRUCTURE PERFECTION OF INDIVIDUAL LAYERS AND INTERFACES IN THE INXGA1-XAS-GAAS GAAS SUPERLATTICE/
Authors: AFANASEV AM CHUEV MA IMAMOV RM LOMOV AA MOKEROV VG FEDOROV YV GUK AV
Citation: Am. Afanasev et al., X-RAY-DIFFRACTION STUDY OF THE EFFECT OF GROWTH-CONDITIONS ON THE STRUCTURE PERFECTION OF INDIVIDUAL LAYERS AND INTERFACES IN THE INXGA1-XAS-GAAS GAAS SUPERLATTICE/, Crystallography reports, 43(5), 1998, pp. 872-876
POTENTIALITIES OF X-RAY-DIFFRACTOMETRY FOR STUDYING DELTA-LAYERS ON EXAMPLE OF THE AL0.27GA0.73AS-IN0.13GA0.87AS GAAS HETEROSTRUCTURE/
Authors: AFANASEV AM ZAITSEV AA IMAMOV RM PASHAEV EM CHUEV MA
Citation: Am. Afanasev et al., POTENTIALITIES OF X-RAY-DIFFRACTOMETRY FOR STUDYING DELTA-LAYERS ON EXAMPLE OF THE AL0.27GA0.73AS-IN0.13GA0.87AS GAAS HETEROSTRUCTURE/, Crystallography reports, 43(4), 1998, pp. 628-630
X-RAY-DIFFRACTION STUDY OF INTERFACES BETWEEN THE LAYERS OF THE ALAS-GA1-XALXAS SUPERLATTICE
Authors: AFANASEV AM ZAITSEV AA IMAMOV RM PASHAEV EM CHUEV MA MOKEROV VG
Citation: Am. Afanasev et al., X-RAY-DIFFRACTION STUDY OF INTERFACES BETWEEN THE LAYERS OF THE ALAS-GA1-XALXAS SUPERLATTICE, Crystallography reports, 43(1), 1998, pp. 129-133
ASYMMETRIC MONOCHROMATOR IN NONCOPLANAR DIFFRACTION GEOMETRY
Authors: PASHAEV EM VAVILOV AV IMAMOV RM AFANASEV AM DJOMKINA TB
Citation: Em. Pashaev et al., ASYMMETRIC MONOCHROMATOR IN NONCOPLANAR DIFFRACTION GEOMETRY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 405(2-3), 1998, pp. 301-304
INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES
Authors: GALIEV GB IMAMOV RM MEDVEDEV BK MOKEROV VG MUKHAMEDZHANOV EK PASHAEV EM CHEGLAKOV VB
Citation: Gb. Galiev et al., INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES, Semiconductors, 31(10), 1997, pp. 1003-1005
COMPARATIVE-STUDY OF ROUGH SUBSTRATES FOR X-RAY MIRRORS BY THE METHODS OF X-RAY REFLECTIVITY AND SCANNING PROBE MICROSCOPY
Authors: PROTOPOPOV VV VALIEV KA IMAMOV RM
Citation: Vv. Protopopov et al., COMPARATIVE-STUDY OF ROUGH SUBSTRATES FOR X-RAY MIRRORS BY THE METHODS OF X-RAY REFLECTIVITY AND SCANNING PROBE MICROSCOPY, Crystallography reports, 42(4), 1997, pp. 686-693
X-RAY-DIFFRACTION IN A NONCOPLANAR GRAZING SCHEME
Authors: AFANASEV AM VAVILOV AB DEMKINA TB IMAMOV RM PASHAEV EM
Citation: Am. Afanasev et al., X-RAY-DIFFRACTION IN A NONCOPLANAR GRAZING SCHEME, Crystallography reports, 42(3), 1997, pp. 360-363
STUDY OF MULTILAYER GAAS-INXGA1-XAS LAYER-BASED STRUCTURE BY DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY
Authors: AFANASEV AM CHUEV MA IMAMOV RM LOMOV AA MOKEROV VG FEDOROV YV GUK AV
Citation: Am. Afanasev et al., STUDY OF MULTILAYER GAAS-INXGA1-XAS LAYER-BASED STRUCTURE BY DOUBLE-CRYSTAL X-RAY-DIFFRACTOMETRY, Crystallography reports, 42(3), 1997, pp. 467-476
X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS
Authors: BOCCHI C FRANZOSI P IMAMOV RM MASLOV AV MUKHAMEDZHANOV EK PASHAEV EM
Citation: C. Bocchi et al., X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(1), 1997, pp. 65-72
X-RAY-IMAGING BY ANGULAR RASTER SCANNING
Authors: VALIEV KA VELIKOV LV DOLGICH VT KALNOV VA PROTOPOPOV VV IMAMOV RM LEBEDEV OI LOMOV AA
Citation: Ka. Valiev et al., X-RAY-IMAGING BY ANGULAR RASTER SCANNING, Applied optics, 36(7), 1997, pp. 1592-1597
NONCOPLANAR DIFFRACTION GEOMETRY IN THE B RAGG-CASE OF GLANCING INCIDENCE OF X-RAYS
Authors: AFANASEV AM VAVILOV AB IMAMOV RM PASHAEV EM
Citation: Am. Afanasev et al., NONCOPLANAR DIFFRACTION GEOMETRY IN THE B RAGG-CASE OF GLANCING INCIDENCE OF X-RAYS, Kristallografia, 41(5), 1996, pp. 804-807
STUDIES OF TRANSIENT REGION BETWEEN LASER -DEPOSITED PALLADIUM AND (111)SI
Authors: ZHOVANNIK EV NIKOLAEV IN STAVKIN DG SHEVLYUGA VM IMAMOV RM LOMOV AA
Citation: Ev. Zhovannik et al., STUDIES OF TRANSIENT REGION BETWEEN LASER -DEPOSITED PALLADIUM AND (111)SI, Kristallografia, 41(5), 1996, pp. 935-939
X-RAY TOPOGRAPHIC CONTRAST OF ION-IMPLANT ATION BOUNDARIES IN SILICON-CRYSTALS
Authors: POLOVINIKINA VI MITINSKAYA TV SMOLSKII IL IMAMOV RM GRABCHAK VP ALEKSANDROV PA
Citation: Vi. Polovinikina et al., X-RAY TOPOGRAPHIC CONTRAST OF ION-IMPLANT ATION BOUNDARIES IN SILICON-CRYSTALS, Kristallografia, 41(1), 1996, pp. 136-142
EFFECTS OF DYNAMICAL DIFFRACTION IN THE M ETHOD OF X-RAY STANDING WAVES
Authors: AFANASEV AM IMAMOV RM
Citation: Am. Afanasev et Rm. Imamov, EFFECTS OF DYNAMICAL DIFFRACTION IN THE M ETHOD OF X-RAY STANDING WAVES, Kristallografia, 40(3), 1995, pp. 446-460
EFFECT OF X-RAY-BEAM CONTRACTION IN ASYMM ETRIC DIFFRACTION BY THE GE-CU SYSTEM
Authors: AFANASEV AM IMAMOV RM MUKHAMEDZHANOV EK
Citation: Am. Afanasev et al., EFFECT OF X-RAY-BEAM CONTRACTION IN ASYMM ETRIC DIFFRACTION BY THE GE-CU SYSTEM, Kristallografia, 40(3), 1995, pp. 567-568
X-RAY MIRROR WITH A WIDENED ANGULAR RANGE
Authors: VALIEV KA VELIKOV LV DOLGIKH VT KALNOV VA PROTOPOPOV VV IMAMOV RM LEBEDEV OI LOMOV AA RODDATIS VV
Citation: Ka. Valiev et al., X-RAY MIRROR WITH A WIDENED ANGULAR RANGE, Kristallografia, 40(2), 1995, pp. 358-363
STUDY OF AN INGAAS GAAS(100) HETEROSTRUCTURE BY HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY/
Authors: IMAMOV RM LOMOV AA SIROCHENKO VN IGNATEV AS MOKEROV VG NEMTSEV GZ FEDOROV YV
Citation: Rm. Imamov et al., STUDY OF AN INGAAS GAAS(100) HETEROSTRUCTURE BY HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY/, Semiconductors, 28(8), 1994, pp. 761-764
APPLICATION OF THE RENNINGER EFFECT TO X-RAY DOUBLE-PLANE COLLIMATION
Authors: STEPANOV SA KONDRASHKINA EA NOVIKOV DV IMAMOV RM
Citation: Sa. Stepanov et al., APPLICATION OF THE RENNINGER EFFECT TO X-RAY DOUBLE-PLANE COLLIMATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 346(1-2), 1994, pp. 385-393
THE DETERMINATION OF THE PROBABILITY OF E SCAPE OF PHOTOELECTRONS OF VARIOUS ENERGIES
Authors: AFANASEV AM IMAMOV RM IGAMKULOV ZA MUKHAMEDZHANOV EK
Citation: Am. Afanasev et al., THE DETERMINATION OF THE PROBABILITY OF E SCAPE OF PHOTOELECTRONS OF VARIOUS ENERGIES, Kristallografia, 39(2), 1994, pp. 250-257
A METHOD FOR INCREASING THE RESOLUTION OF THE X-RAY-DIFFRACTION METHOD UNDER THE GRAZING-INCIDENCE CONDITIONS
Authors: YAKOVCHIK YV IMAMOV RM
Citation: Yv. Yakovchik et Rm. Imamov, A METHOD FOR INCREASING THE RESOLUTION OF THE X-RAY-DIFFRACTION METHOD UNDER THE GRAZING-INCIDENCE CONDITIONS, Kristallografia, 39(2), 1994, pp. 337-339
INVESTIGATION OF LATTICE-DISTORTIONS IN INP CRYSTALS IMPLANTED WITH FE-RESOLUTION X-RAY-DIFFRACTION AND X-RAY STANDING-WAVE METHODS( IONS BY MEANS OF HIGH)
Authors: BOCCHI C FRANZOSI P IMAMOV RM LOMOV AA MASLOV AV MUKHAMEDZHANOV EK YAKOVCHICK YV
Citation: C. Bocchi et al., INVESTIGATION OF LATTICE-DISTORTIONS IN INP CRYSTALS IMPLANTED WITH FE-RESOLUTION X-RAY-DIFFRACTION AND X-RAY STANDING-WAVE METHODS( IONS BY MEANS OF HIGH), Journal of applied physics, 76(11), 1994, pp. 7239-7245
STUDY OF GAAS ION-ALLOYED LAYERS WITH (10 0) AND (211) ORIENTATIONS BY THE 2-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD
Authors: LOMOV AA SIROCHENKO VP IMAMOV RM
Citation: Aa. Lomov et al., STUDY OF GAAS ION-ALLOYED LAYERS WITH (10 0) AND (211) ORIENTATIONS BY THE 2-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD, Kristallografia, 38(4), 1993, pp. 272-274
X-RAY PHOTOELECTRONS AND POLARIZATION EFF ECT
Authors: PASHAEV EM VAVILOV AA IMAMOV RM
Citation: Em. Pashaev et al., X-RAY PHOTOELECTRONS AND POLARIZATION EFF ECT, Kristallografia, 38(3), 1993, pp. 36-41
STUDY OF SUPERLATTICE TOP LAYERS BY THE S TANDING X-RAY WAVES TECHNIQUE
Authors: AFANASEV AM IMAMOV RM MASLOV AV MOKEROV VG PASHAEV EM VAVILOV AB IGNATEV AS NEMTSEV GZ ZAITSEV AA
Citation: Am. Afanasev et al., STUDY OF SUPERLATTICE TOP LAYERS BY THE S TANDING X-RAY WAVES TECHNIQUE, Kristallografia, 38(3), 1993, pp. 58-62
SINGLE-CRYSTAL X-RAY DIFFRACTOMETER FOR TESTING OF THE STRUCTURE OF SUBMICRON SURFACE-LAYERS OF SINGLE-CRYSTALS
Authors: AFANASEV SM IMAMOV RM MAKAROV SY NOVIKOV DV SMENOV NI SHCHELOKOV AN
Citation: Sm. Afanasev et al., SINGLE-CRYSTAL X-RAY DIFFRACTOMETER FOR TESTING OF THE STRUCTURE OF SUBMICRON SURFACE-LAYERS OF SINGLE-CRYSTALS, Industrial laboratory, 59(5), 1993, pp. 483-487
Risultati: 1-25 |