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Results:
1-16
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Results: 16
Authors:
JONES EC
ISHIDA E
Citation: Ec. Jones et E. Ishida, SHALLOW JUNCTION DOPING TECHNOLOGIES FOR ULSI, Materials science & engineering. R, Reports, 24(1-2), 1998, pp. 1-80
Authors:
ASHIZUKA M
ISHIDA E
KITO T
Citation: M. Ashizuka et al., DISPERSIBILITY OF SIC WHISKERS IN SEVERAL ORGANIC-SOLVENTS, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 106(8), 1998, pp. 744-748
Authors:
ASHIZUKA M
ISHIDA E
Citation: M. Ashizuka et E. Ishida, MECHANICAL-PROPERTIES OF SILICATE GLASS-CERAMICS CONTAINING TRICALCIUM PHOSPHATE, Journal of Materials Science, 32(1), 1997, pp. 185-188
Authors:
CRAIG M
SULTAN A
REDDY K
BANERJEE S
ISHIDA E
LARSON L
Citation: M. Craig et al., DOSE-RATE AND THERMAL BUDGET OPTIMIZATION FOR ULTRASHALLOW JUNCTIONS FORMED BY LOW-ENERGY (2-5 KEV) ION-IMPLANTATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 255-259
Authors:
FELCH SB
CHAPEK DL
MALIK SM
MAILLOT P
ISHIDA E
MAGEE CW
Citation: Sb. Felch et al., COMPARISON OF DIFFERENT ANALYTICAL TECHNIQUES IN MEASURING THE SURFACE REGION OF ULTRASHALLOW DOPING PROFILES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 336-340
Authors:
ISHIDA E
FELCH SB
Citation: E. Ishida et Sb. Felch, STUDY OF ELECTRICAL MEASUREMENT TECHNIQUES FOR ULTRA-SHALLOW DOPANT PROFILING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 397-403
Authors:
ASHIZUKA M
ISHIDA E
Citation: M. Ashizuka et E. Ishida, CRACK CONFIGURATION BENEATH VICKERS INDENTATION IN Y2O3-CONTAINING TETRAGONAL ZIRCONIA POLYCRYSTALS, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 104(7), 1996, pp. 673-676
Authors:
ASHIZUKA M
ISHIDA E
Citation: M. Ashizuka et E. Ishida, JOINING OF ZIRCONIA-TO-ZIRCONIA USING CAO -MGO-SIO2-AL2O3 GLASSES, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 104(4), 1996, pp. 345-347
Authors:
SULTAN A
CRAIG M
REDDY K
BANERJEE S
ISHIDA E
MAILLOT P
NEIL T
LARSON L
Citation: A. Sultan et al., THE DEPENDENCE OF ULTRASHALLOW JUNCTION DEPTHS ON IMPACT DOSE-RATES, Applied physics letters, 67(9), 1995, pp. 1223-1225
Authors:
ISHIDA E
SIGMON TW
WEINER KH
FROST MR
Citation: E. Ishida et al., ULTRA-SHALLOW BOX-LIKE PROFILES FABRICATED BY PULSED ULTRAVIOLET-LASER DOPING PROCESS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(1), 1994, pp. 399-404
Authors:
KUBOTA Y
ASHIZUKA M
ISHIDA E
Citation: Y. Kubota et al., STATIC FATIGUE AND FRACTURE-TOUGHNESS OF MULLITE CERAMICS AT 1200-DEGREES-C, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 102(9), 1994, pp. 805-809
Authors:
KUBOTA Y
ASHIZUKA M
ISHIDA E
MITAMURA T
Citation: Y. Kubota et al., INFLUENCE OF TEMPERATURE ON ELASTIC-MODULUS AND STRENGTH OF MGO-PARTIALLY STABILIZED ZIRCONIA (MG-PSZ), Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 102(8), 1994, pp. 708-712
Authors:
SUGAI M
KOMATSUZAWA H
OOKUINOMATA K
MIYAKE Y
ISHIDA E
SUGINAKA H
Citation: M. Sugai et al., ISOLATION AND CHARACTERIZATION OF STAPHYLOCOCCUS-AUREUS MUTANTS WHICHFORM ALTERED CELL CLUSTERS, Microbiology and immunology, 38(12), 1994, pp. 995-999
Authors:
ISHIDA E
Citation: E. Ishida, COGNITION-CORRELATION INDEXES OF GENDER S CHEMA - TESTS OF VALIDITY, Shinrigaku Kenkyu, 64(6), 1994, pp. 417-425
Authors:
KIKUZAKI H
KAWABATA M
ISHIDA E
AKAZAWA Y
TAKEI Y
NAKATANI N
Citation: H. Kikuzaki et al., LC-MS ANALYSIS AND STRUCTURAL DETERMINATION OF NEW AMIDES FROM JAVANESE LONG PEPPER (PIPER-RETROFRACTUM), Bioscience, biotechnology, and biochemistry, 57(8), 1993, pp. 1329-1333
Authors:
KRAMER KJ
TALWAR S
ISHIDA E
WEINER KH
SIGMON TW
Citation: Kj. Kramer et al., FABRICATION AND CHARACTERIZATION OF SELECTIVELY GROWN SI1-XGEX SI P+/N HETEROJUNCTIONS USING PULSED-LASER INDUCED EPITAXY AND GAS IMMERSIONLASER DOPING/, Applied surface science, 69(1-4), 1993, pp. 121-126
Risultati:
1-16
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