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Results: 1-25/30
Authors:
TANG EZ
IVEY DG
ETSELL TH
Citation: Ez. Tang et al., MICROSTRUCTURE OF POLARIZED ELECTROCHEMICAL VAPOR-DEPOSITION (PEVD) PRODUCTS, Micron, 29(4), 1998, pp. 251-259
Authors:
IVEY DG
Citation: Dg. Ivey, MICROSTRUCTURAL CHARACTERIZATION OF AU SN SOLDER FOR PACKAGING IN OPTOELECTRONIC APPLICATIONS/, Micron, 29(4), 1998, pp. 281-287
Authors:
IVEY DG
LUO J
INGREY S
MOORE R
WOODS I
Citation: Dg. Ivey et al., GALVANIC CORROSION EFFECTS IN INP-BASED LASER RIDGE STRUCTURES, Journal of electronic materials, 27(2), 1998, pp. 89-95
Authors:
OMOTOSO OE
IVEY DG
MIKULA R
Citation: Oe. Omotoso et al., CONTAINMENT MECHANISM OF TRIVALENT CHROMIUM IN TRICALCIUM SILICATE, Journal of hazardous materials, 60(1), 1998, pp. 1-28
Authors:
OMOTOSO OE
IVEY DG
MIKULA R
Citation: Oe. Omotoso et al., HEXAVALENT CHROMIUM IN TRICALCIUM SILICATE - PART I - QUANTITATIVE X-RAY-DIFFRACTION ANALYSIS OF CRYSTALLINE HYDRATION PRODUCTS, Journal of Materials Science, 33(2), 1998, pp. 507-513
Authors:
OMOTOSO OE
IVEY DG
MIKULA R
Citation: Oe. Omotoso et al., HEXAVALENT CHROMIUM IN TRICALCIUM SILICATE - PART II - EFFECTS OF CR-VI ON THE HYDRATION OF TRICALCIUM SILICATE, Journal of Materials Science, 33(2), 1998, pp. 515-522
Authors:
HEIMANN RB
KURZWEG H
IVEY DG
WAYMAN ML
Citation: Rb. Heimann et al., MICROSTRUCTURAL AND IN-VITRO CHEMICAL INVESTIGATIONS INTO PLASMA-SPRAYED BIOCERAMIC COATINGS, Journal of biomedical materials research, 43(4), 1998, pp. 441-450
Authors:
WANG YG
WANG D
IVEY DG
Citation: Yg. Wang et al., THERMAL-STABILITY OF PD GE-BASED OHMIC CONTACTS TO N-TYPE GAAS/, Journal of applied physics, 84(3), 1998, pp. 1310-1315
Authors:
IVEY DG
ZHANG R
ABID Z
EICHER S
LESTER TP
Citation: Dg. Ivey et al., MICROSTRUCTURAL ANALYSIS OF PD PT/AU/PD OHMIC CONTACTS TO INGAP/GAAS/, Journal of materials science. Materials in electronics, 8(5), 1997, pp. 281-288
Authors:
IVEY DG
EICHER S
WINGAR S
LESTER T
Citation: Dg. Ivey et al., PERFORMANCE OF PD-GE BASED OHMIC CONTACTS TO N-TYPE GAAS, Journal of materials science. Materials in electronics, 8(2), 1997, pp. 63-68
Authors:
TANG EZ
ETSELL TH
IVEY DG
Citation: Ez. Tang et al., APPLYING POLARIZED ELECTROCHEMICAL VAPOR-DEPOSITION (PEVD) FOR AUXILIARY PHASE DEPOSITION AT WORKING ELECTRODES OF GASEOUS OXIDE SENSORS, Sensors and actuators. B, Chemical, 45(2), 1997, pp. 131-139
Authors:
IVEY DG
INGREY S
NOEL JP
LAU WM
Citation: Dg. Ivey et al., MICROSTRUCTURAL STUDY OF TI PT/AU CONTACTS TO P-INGAAS/, Materials science & engineering. B, Solid-state materials for advanced technology, 49(1), 1997, pp. 66-73
Authors:
ZHANG R
IVEY DG
Citation: R. Zhang et Dg. Ivey, PREPARATION OF SHARP POLYCRYSTALLINE TUNGSTEN TIPS FOR SCANNING-TUNNELING-MICROSCOPY IMAGING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 1-10
Authors:
JIAN P
IVEY DG
BRUCE R
KNIGHT G
Citation: P. Jian et al., MICROSTRUCTURAL STUDY OF AU-PD-ZN OHMIC CONTACTS TO P-TYPE INGAASP-INP, Journal of materials science. Materials in electronics, 7(2), 1996, pp. 77-83
Authors:
WANG D
IVEY DG
Citation: D. Wang et Dg. Ivey, INTERFACIAL REACTIONS BETWEEN TI THIN-FILMS AND INP, Materials science & engineering. B, Solid-state materials for advanced technology, 41(2), 1996, pp. 289-293
Authors:
JIAN P
IVEY DG
EICHER S
LESTER TP
Citation: P. Jian et al., MICROSTRUCTURAL ANALYSIS OF A AU PT/PD/ZN OHMIC CONTACT TO AN ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTOR/, Journal of electronic materials, 25(9), 1996, pp. 1478-1486
Authors:
YOON J
IVEY DG
Citation: J. Yoon et Dg. Ivey, PREPARATION OF CROSS-SECTION SPECIMENS FOR AFM IMAGING OF METAL-SEMICONDUCTOR INTERFACES, Journal of materials science letters, 15(7), 1996, pp. 551-554
Authors:
BALDWIN NR
IVEY DG
Citation: Nr. Baldwin et Dg. Ivey, LOW-TEMPERATURE IRON THIN-FILM SILICON REACTIONS, Journal of Materials Science, 31(1), 1996, pp. 31-37
Authors:
OMOTOSO OE
IVEY DG
MIKULA R
Citation: Oe. Omotoso et al., QUANTITATIVE X-RAY-DIFFRACTION ANALYSIS OF CHROMIUM(III) DOPED TRICALCIUM SILICATE PASTES, Cement and concrete research, 26(9), 1996, pp. 1369-1379
Authors:
IVEY DG
JIAN P
Citation: Dg. Ivey et P. Jian, MICROSTRUCTURAL ANALYSIS OF AU PT/TI CONTACTS TO P-TYPE INGAAS/, Journal of materials science. Materials in electronics, 6(4), 1995, pp. 219-227
Authors:
OMOTOSO OE
IVEY DG
MIKULA R
Citation: Oe. Omotoso et al., CHARACTERIZATION OF CHROMIUM-DOPED TRICALCIUM SILICATE USING SEM EDS,XRD AND FTIR/, Journal of hazardous materials, 42(1), 1995, pp. 87-102
Authors:
WANG D
IVEY DG
Citation: D. Wang et Dg. Ivey, CRYSTAL-STRUCTURE DETERMINATION OF NI2INP, Journal of materials science letters, 14(2), 1995, pp. 117-123
Authors:
ZHANG R
STEFANIUK R
IVEY DG
Citation: R. Zhang et al., AN INEXPENSIVE STM CONVERSION TO A BEEM, Review of scientific instruments, 66(7), 1995, pp. 3799-3801
Authors:
CVITKOVIC R
IVEY DG
STILES J
Citation: R. Cvitkovic et al., MOSI2 DIFFUSION BARRIER FOR THE PASSIVATION OF COPPER AT ELEVATED-TEMPERATURES, Journal of Materials Science, 30(21), 1995, pp. 5415-5426
Authors:
IVEY DG
JIAN P
Citation: Dg. Ivey et P. Jian, METALLURGY OF OHMIC CONTACTS TO INP, Canadian metallurgical quarterly, 34(2), 1995, pp. 85-113