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Results:
1-25
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Results: 25
Authors:
JAEGER RC
Citation: Rc. Jaeger, EDITORS TRANSITIONS STATEMENTS, IEEE journal of solid-state circuits, 33(8), 1998, pp. 1146-1146
Authors:
JAEGER RC
Citation: Rc. Jaeger, UNTITLED, IEEE journal of solid-state circuits, 33(4), 1998, pp. 514-514
Authors:
JOSEPH AJ
CRESSLER JD
RICHEY DM
JAEGER RC
HARAME DL
Citation: Aj. Joseph et al., NEUTRAL BASE RECOMBINATION AND ITS INFLUENCE ON THE TEMPERATURE-DEPENDENCE OF EARLY VOLTAGE AND CURRENT GAIN EARLY VOLTAGE PRODUCT IN UHV CVD SIGE HETEROJUNCTION BIPOLAR-TRANSISTORS/, I.E.E.E. transactions on electron devices, 44(3), 1997, pp. 404-413
Authors:
JAEGER RC
Citation: Rc. Jaeger, NEW ASSOCIATE EDITORS, IEEE journal of solid-state circuits, 32(4), 1997, pp. 486-487
Authors:
JAEGER RC
Citation: Rc. Jaeger, PUBLICATION SCHEDULE CHANGES, IEEE journal of solid-state circuits, 32(2), 1997, pp. 146-146
Authors:
JAEGER RC
Citation: Rc. Jaeger, UNTITLED, IEEE journal of solid-state circuits, 32(1), 1997, pp. 3-3
Authors:
LATHAM MS
CRESSLER JD
JOSEPH AJ
JAEGER RC
Citation: Ms. Latham et al., THE IMPACT OF GE GRADING ON THE BIAS AND TEMPERATURE CHARACTERISTICS OF SIGE HBT PRECISION VOLTAGE REFERENCES, Journal de physique. IV, 6(C3), 1996, pp. 113-118
Authors:
CRESSLER JD
VEMPATI L
BABCOCK JA
JAEGER RC
HARAME DL
Citation: Jd. Cressler et al., LOW-FREQUENCY NOISE CHARACTERISTICS OF UHV CVD EPITAXIAL SI-BASE AND SIGE-BASE BIPOLAR-TRANSISTORS/, IEEE electron device letters, 17(1), 1996, pp. 13-15
Authors:
RICHEY DM
JOSEPH AJ
CRESSLER JD
JAEGER RC
Citation: Dm. Richey et al., EVIDENCE FOR NONEQUILIBRIUM BASE TRANSPORT IN SI AND SIGE BIPOLAR-TRANSISTORS AT CRYOGENIC TEMPERATURES, Solid-state electronics, 39(6), 1996, pp. 785-789
Authors:
JAEGER RC
Citation: Rc. Jaeger, UNTITLED, IEEE journal of solid-state circuits, 31(8), 1996, pp. 1074-1075
Authors:
JAEGER RC
Citation: Rc. Jaeger, NEW ASSOCIATE EDITORS, IEEE journal of solid-state circuits, 31(10), 1996, pp. 1371-1371
Authors:
VEMPATI LS
CRESSLER JD
BABCOCK JA
JAEGER RC
HARAME DL
Citation: Ls. Vempati et al., LOW-FREQUENCY NOISE IN UHV CVD EPITAXIAL SI AND SIGE BIPOLAR-TRANSISTORS/, IEEE journal of solid-state circuits, 31(10), 1996, pp. 1458-1467
Authors:
AZIMI M
JAEGER RC
Citation: M. Azimi et Rc. Jaeger, SUBSTRATE THICKNESS OPTIMIZATION FOR LIQUID IMMERSION COOLED SILICON MULTICHIP MODULES, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 18(1), 1995, pp. 144-149
Authors:
NOWELL RM
BHAVNANI SH
JAEGER RC
Citation: Rm. Nowell et al., EFFECT OF CHANNEL WIDTH ON POOL BOILING FROM A MICROCONFIGURED HEAT SINK, IEEE transactions on components, packaging, and manufacturing technology. Part A, 18(3), 1995, pp. 534-539
Authors:
BABCOCK JA
CRESSLER JD
VEMPATI LS
CLARK SD
JAEGER RC
HARAME DL
Citation: Ja. Babcock et al., IONIZING-RADIATION TOLERANCE AND LOW-FREQUENCY NOISE DEGRADATION IN UHV CVD SIGE HBTS/, IEEE electron device letters, 16(8), 1995, pp. 351-353
Authors:
BABCOCK JA
CRESSLER JD
VEMPATI LS
CLARK SD
JAEGER RC
HARAME DL
Citation: Ja. Babcock et al., IONIZING-RADIATION TOLERANCE OF HIGH-PERFORMANCE SIGE HBTS GROWN BY UHV CVD/, IEEE transactions on nuclear science, 42(6), 1995, pp. 1558-1566
Authors:
JAEGER RC
Citation: Rc. Jaeger, TRANSITION STATEMENTS, IEEE journal of solid-state circuits, 30(9), 1995, pp. 958-959
Authors:
JAEGER RC
Citation: Rc. Jaeger, NEW ASSOCIATE EDITOR, IEEE journal of solid-state circuits, 30(10), 1995, pp. 1038-1038
Authors:
CRESSLER JD
RICHEY DM
JAEGER RC
CRABBE EF
COMFORT JH
STORK JMC
Citation: Jd. Cressler et al., HIGH-INJECTION BARRIER EFFECTS IN SIGE HBTS OPERATING AT CRYOGENIC TEMPERATURES, Journal de physique. IV, 4(C6), 1994, pp. 117-122
Authors:
RICHEY DM
CRESSLER JD
JAEGER RC
Citation: Dm. Richey et al., NUMERICAL-SIMULATION OF SIGE HBTS AT CRYOGENIC TEMPERATURES, Journal de physique. IV, 4(C6), 1994, pp. 127-132
Authors:
JAEGER RC
SUHLING JC
RAMANI R
Citation: Rc. Jaeger et al., ERRORS ASSOCIATED WITH THE DESIGN, CALIBRATION AND APPLICATION OF PIEZORESISTIVE STRESS SENSORS IN SILICON(100), IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 17(1), 1994, pp. 97-107
Authors:
HINGORANI S
FAHRNER CJ
MACKOWSKI DW
GOODING JS
JAEGER RC
Citation: S. Hingorani et al., OPTIMAL SIZING OF PLANAR THERMAL SPREADERS, Journal of heat transfer, 116(2), 1994, pp. 296-301
Authors:
JAEGER RC
SUHLING JC
CAREY MT
JOHNSON RW
Citation: Rc. Jaeger et al., OFF-AXIS SENSOR ROSETTES FOR MEASUREMENT OF THE PIEZORESISTIVE COEFFICIENTS OF SILICON, IEEE transactions on components, hybrids, and manufacturing technology, 16(8), 1993, pp. 925-931
Authors:
TOMANA M
JOHNSON RW
JAEGER RC
DILLARD WC
Citation: M. Tomana et al., A HYBRID SILICON-CARBIDE DIFFERENTIAL-AMPLIFIER FOR 350-DEGREES-C OPERATION, IEEE transactions on components, hybrids, and manufacturing technology, 16(5), 1993, pp. 536-542
Authors:
AZIMI M
JAEGER RC
Citation: M. Azimi et Rc. Jaeger, A MICROELECTRONIC TEST STRUCTURE AND NUMERICAL ALGORITHM FOR CHARACTERIZATION OF LIQUID IMMERSION HEAT-TRANSFER, IEEE transactions on components, hybrids, and manufacturing technology, 16(3), 1993, pp. 253-265
Risultati:
1-25
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