Authors: Dilhaire, S Grauby, S Jorez, S Lopez, LDP Schaub, E Claeys, W

Citation: S. Dilhaire et al., Laser diode COFD analysis by thermoreflectance microscopy, MICROEL REL, 41(9-10), 2001, pp. 1597-1601

Authors: Claeys, W Dilhaire, S Jorez, S Patino-Lopez, LD

Citation: W. Claeys et al., Laser probes for the thermal and thermomechanical characterisation of microelectronic devices, MICROELEC J, 32(10-11), 2001, pp. 891-898

Authors: Dilhaire, S Jorez, S Patino-Lopez, LD Claeys, W Schaub, E

Citation: S. Dilhaire et al., Laser diode light efficiency determination by thermoreflectance microscopy, MICROELEC J, 32(10-11), 2001, pp. 899-901

Authors: Dilhaire, S Jorez, S Cornet, A Lopez, LDP Claeys, W

Citation: S. Dilhaire et al., Measurement of the thermomechanical strain of electronic devices by shearography, MICROEL REL, 40(8-10), 2000, pp. 1509-1514

Authors: Dilhaire, S Altet, J Jorez, S Schaub, E Rubio, A Claeys, W

Citation: S. Dilhaire et al., Fault localisation in ICs by goniometric laser probing of thermal induced surface waves, MICROEL REL, 39(6-7), 1999, pp. 919-923

Authors: Dilhaire, S Jorez, S Cornet, A Schaub, E Claeys, W

Citation: S. Dilhaire et al., Optical method for the measurement of the thermomechanical behaviour of electronic devices, MICROEL REL, 39(6-7), 1999, pp. 981-985