Citation: P. Kaczor, KINETICS OF FORMATION AND METASTABILITY MECHANISM FOR THERMAL DONOR-RELATED DEFECTS IN AL-DOPED SILICON, Acta Physica Polonica. A, 90(5), 1996, pp. 861-864
Authors:
KACZOR P
ASHWIN MJ
DOBOSZ D
ZYTKIEWICZ ZR
NEWMAN RC
DOBACZEWSKI L
Citation: P. Kaczor et al., LATTICE SITES OF SILICON IMPURITIES IN ALGAAS GROWN BY LIQUID-PHASE EPITAXY, Acta Physica Polonica. A, 90(5), 1996, pp. 865-868
Authors:
SURKOVA TP
GIRIAT W
GODLEWSKI M
KACZOR P
PERMOGOROV SA
TENISHEV LN
Citation: Tp. Surkova et al., ENERGY-LEVEL POSITION OF NI AND BAND OFFSETS IN ZN1-XCDXSE-NI AND ZNSXSE1-X-NI, Journal of crystal growth, 159(1-4), 1996, pp. 471-474
Authors:
SURKOVA T
GIRIAT W
GODLEWSKI M
KACZOR P
ZAKZEWSKI AJ
PERMOGOROV S
TENISHEV L
Citation: T. Surkova et al., ENERGY-LEVEL POSITION OF NI AND BAND OFFSETS IN ZN1-XCDXSE-NI AND ZNSXSE1-X-NI, Acta Physica Polonica. A, 88(5), 1995, pp. 925-928
Authors:
DOBACZEWSKI L
KACZOR P
MISSOUS M
PEAKER AR
ZYTKIEWICZ ZR
Citation: L. Dobaczewski et al., STRUCTURE OF THE DX STATE FORMED BY DONORS IN (AL,GA)AS AND GA(AS,P), Journal of applied physics, 78(4), 1995, pp. 2468-2477
Authors:
DOBACZEWSKI L
KACZOR P
HAWKINS ID
PEAKER AR
Citation: L. Dobaczewski et al., LAPLACE TRANSFORM DEEP-LEVEL TRANSIENT SPECTROSCOPIC STUDIES OF DEFECTS IN SEMICONDUCTORS, Journal of applied physics, 76(1), 1994, pp. 194-198
Citation: P. Kaczor et al., BISTABLE BEHAVIOR OF THE NEW SHALLOW THERMAL DONOR IN ALUMINUM-DOPED SILICON, Acta Physica Polonica. A, 84(3), 1993, pp. 555-558
Citation: P. Kaczor et al., OBSERVATION OF THE INTERMEDIATE-ENERGY STATE OF THE DX CENTER IN ALXGA1-XASTE IN NONSTATIONARY ABSORPTION EXPERIMENTS, Semiconductor science and technology, 8(11), 1993, pp. 1973-1976
Citation: P. Kaczor et al., X(1)-X(3) CONDUCTION-BAND SPLITTING OF ALXGA1-XAS OBSERVED IN FAR-INFRARED PHOTOINDUCED ABSORPTION RELATED TO THE DX DEFECT, Physical review. B, Condensed matter, 47(19), 1993, pp. 12558-12562
Citation: L. Dobaczewski et P. Kaczor, IONIZATION AND CAPTURE KINETICS OF DX CENTERS IN ALGAAS AND GASB - APPROACH FOR A NEGATIVE-U DEFECT, Semiconductor science and technology, 6(10B), 1991, pp. 51-57