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Results:
1-14
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Results: 14
Authors:
KAMMER S
ALBINSKY K
SANDNER B
WARTEWIG S
Citation: S. Kammer et al., POLYMERIZATION OF HYDROXYALKYL METHACRYLATES CHARACTERIZED BY COMBINATION OF FT-RAMAN AND STEP-SCAN FT-IR PHOTOACOUSTIC-SPECTROSCOPY, Polymer, 40(5), 1999, pp. 1131-1137
Authors:
MULLER F
MULLER AD
HIETSCHOLD M
KAMMER S
Citation: F. Muller et al., DETECTING ELECTRICAL FORCES IN NONCONTACT ATOMIC-FORCE MICROSCOPY, Measurement science & technology, 9(5), 1998, pp. 734-738
Authors:
BRAET F
DEZANGER R
KAMMER S
WISSE E
Citation: F. Braet et al., NONCONTACT VERSUS CONTACT IMAGING - AN ATOMIC-FORCE MICROSCOPIC STUDYON HEPATIC ENDOTHELIAL-CELLS IN-VITRO, International journal of imaging systems and technology, 8(2), 1997, pp. 162-167
Authors:
MULLER F
MULLER AD
HIETSCHOLD M
KAMMER S
Citation: F. Muller et al., APPLICATIONS OF SCANNING ELECTRICAL FORCE MICROSCOPY, Microelectronics and reliability, 37(10-11), 1997, pp. 1631-1634
Authors:
HOSAKA S
SHINTANI T
MIYAMOTO M
HIROTSUNE A
TERAO M
YOSHIDA M
FUJITA K
KAMMER S
Citation: S. Hosaka et al., NANOMETER-SIZED PHASE-CHANGE RECORDING USING A SCANNING NEAR-FIELD OPTICAL MICROSCOPE WITH A LASER-DIODE, JPN J A P 1, 35(1B), 1996, pp. 443-447
Authors:
OCOLA LE
FRYER D
NEALEY P
DEPABLO J
CERRINA F
KAMMER S
Citation: Le. Ocola et al., LATENT IMAGE-FORMATION - NANOSCALE TOPOGRAPHY AND CALORIMETRIC MEASUREMENTS IN CHEMICALLY AMPLIFIED RESISTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3974-3979
Authors:
MULLERZULOW B
KAMMER S
GEHRING S
REINEKE F
Citation: B. Mullerzulow et al., FLUORESCENCE AND LUMINESCENCE TESTING OF ELECTRONIC DEVICES WITH SNOM, Microelectronic engineering, 31(1-4), 1996, pp. 163-168
Authors:
HOSAKA S
SHINTANI T
MIYAMOTO M
HIROTSUNE A
TERAO M
YOSHIDA M
HONMA S
KAMMER S
Citation: S. Hosaka et al., SCANNING NEAR-FIELD OPTICAL MICROSCOPE WITH A LASER-DIODE AND NANOMETER-SIZED BIT RECORDING, Thin solid films, 273(1-2), 1996, pp. 122-127
Authors:
SANDNER B
KAMMER S
WARTEWIG S
Citation: B. Sandner et al., CROSS-LINKING COPOLYMERIZATION OF EPOXY METHACRYLATES AS STUDIED BY FOURIER-TRANSFORM RAMAN-SPECTROSCOPY, Polymer, 37(21), 1996, pp. 4705-4712
Authors:
HOSAKA S
SHINTANI T
MIYAMOTO M
KIKUKAWA A
HIROTSUNE A
TERAO M
YOSHIDA M
FUJITA K
KAMMER S
Citation: S. Hosaka et al., PHASE-CHANGE RECORDING USING A SCANNING NEAR-FIELD OPTICAL MICROSCOPE, Journal of applied physics, 79(10), 1996, pp. 8082-8086
Authors:
SHINTANI T
NAKAMURA K
HOSAKA S
HIROTSUNE A
TERAO M
IMURA R
FUJITA K
YOSHIDA M
KAMMER S
Citation: T. Shintani et al., PHASE-CHANGE WRITING IN A GESBTE FILM WITH SCANNING NEAR-FIELD OPTICAL MICROSCOPE, Ultramicroscopy, 61(1-4), 1995, pp. 285-289
Authors:
MOYER PJ
KAMMER S
WALZER K
HIETSCHOLD M
Citation: Pj. Moyer et al., INVESTIGATIONS OF LIQUID-CRYSTALS AND LIQUID AMBIENTS USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Ultramicroscopy, 61(1-4), 1995, pp. 291-294
Authors:
ALSHUTH T
SCHUSTER RH
KAMMER S
Citation: T. Alshuth et al., ATOMIC-FORCE MICROSCOPY OF ELASTOMERS .1. CHARACTERIZATION OF CARBON-BLACK MORPHOLOGY AND DISPERSION IN ELASTOMERS BY NONCONTACT MODE AFM, Kautschuk und Gummi, Kunststoffe, 47(10), 1994, pp. 702-708
Authors:
KIPP S
KAMMER S
LACMANN R
ROLFS J
TANNEBERGER U
BECKMANN W
Citation: S. Kipp et al., IMAGING CRYSTAL-GROWTH FEATURES USING SCANNING FORCE MICROSCOPY (SFM), Crystal research and technology, 29(7), 1994, pp. 1005-1011
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