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Results: 1-12 |
Results: 12
PREPARATION AND PROPERTIES OF INAS 50-MOL-PERCENT CUINSE2 50-MOL-PERCENT ALLOY
Authors: ALDOURI AAJ HASOON FS KAZMERSKI LL
Citation: Aaj. Aldouri et al., PREPARATION AND PROPERTIES OF INAS 50-MOL-PERCENT CUINSE2 50-MOL-PERCENT ALLOY, Renewable energy, 13(1), 1998, pp. 25-31
PHOTOVOLTAICS CHARACTERIZATION - A SURVEY OF DIAGNOSTIC MEASUREMENTS
Authors: KAZMERSKI LL
Citation: Ll. Kazmerski, PHOTOVOLTAICS CHARACTERIZATION - A SURVEY OF DIAGNOSTIC MEASUREMENTS, Journal of materials research, 13(10), 1998, pp. 2684-2708
EFFECTS OF CDCL2 TREATMENT ON THE RECRYSTALLIZATION AND ELECTROOPTICAL PROPERTIES OF CDTE THIN-FILMS
Authors: MOUTINHO HR ALJASSIM MM LEVI DH DIPPO PC KAZMERSKI LL
Citation: Hr. Moutinho et al., EFFECTS OF CDCL2 TREATMENT ON THE RECRYSTALLIZATION AND ELECTROOPTICAL PROPERTIES OF CDTE THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1251-1257
DEVICE AND MATERIALS CHARACTERIZATION IN MANUFACTURING
Authors: SITES J RAND J KAZMERSKI LL PHILLIPS JE
Citation: J. Sites et al., DEVICE AND MATERIALS CHARACTERIZATION IN MANUFACTURING, Progress in photovoltaics, 5(5), 1997, pp. 371-378
INFRARED SPECTROSCOPIC, X-RAY, AND NANOSCALE CHARACTERIZATION OF STRONTIUM-TITANATE THIN-FILMS
Authors: WEBB JD MOUTINHO HR KAZMERSKI LL MUELLER CH RIVKIN TV TREECE RE DALBERTH M ROGERS CT
Citation: Jd. Webb et al., INFRARED SPECTROSCOPIC, X-RAY, AND NANOSCALE CHARACTERIZATION OF STRONTIUM-TITANATE THIN-FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 9-18
MICRO THROUGH NANOSTRUCTURE INVESTIGATIONS OF POLYCRYSTALLINE CDTE - CORRELATIONS WITH PROCESSING AND ELECTRONIC-STRUCTURES
Authors: LEVI DH MOUTINHO HR HASOON FS KEYES BM AHRENKIEL RK ALJASSIM M KAZMERSKI LL BIRKMIRE RW
Citation: Dh. Levi et al., MICRO THROUGH NANOSTRUCTURE INVESTIGATIONS OF POLYCRYSTALLINE CDTE - CORRELATIONS WITH PROCESSING AND ELECTRONIC-STRUCTURES, Solar energy materials and solar cells, 41-2, 1996, pp. 381-393
STUDIES OF THE MICROSTRUCTURE AND NANOSTRUCTURE OF POLYCRYSTALLINE CDTE AND CUINSE2 USING ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY
Authors: MOUTINHO HR HASOON FS KAZMERSKI LL
Citation: Hr. Moutinho et al., STUDIES OF THE MICROSTRUCTURE AND NANOSTRUCTURE OF POLYCRYSTALLINE CDTE AND CUINSE2 USING ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY, Progress in photovoltaics, 3(1), 1995, pp. 39-46
INVESTIGATION OF POLYCRYSTALLINE CDTE THIN-FILMS DEPOSITED BY PHYSICAL VAPOR-DEPOSITION, CLOSE-SPACED SUBLIMATION, AND SPUTTERING
Authors: MOUTINHO HR HASOON FS ABULFOTUH F KAZMERSKI LL
Citation: Hr. Moutinho et al., INVESTIGATION OF POLYCRYSTALLINE CDTE THIN-FILMS DEPOSITED BY PHYSICAL VAPOR-DEPOSITION, CLOSE-SPACED SUBLIMATION, AND SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2877-2883
ARRAYS TO ATOMS - THE RANGE, EVOLUTION, AND FRONTIERS OF CHARACTERIZATION
Authors: KAZMERSKI LL
Citation: Ll. Kazmerski, ARRAYS TO ATOMS - THE RANGE, EVOLUTION, AND FRONTIERS OF CHARACTERIZATION, Renewable energy, 5(1-4), 1994, pp. 107-117
EVALUATION AND DIRECTIONS OF THE PHOTOVOLTAIC TECHNOLOGIES
Authors: KAZMERSKI LL EMERY KA DEBLASIO R
Citation: Ll. Kazmerski et al., EVALUATION AND DIRECTIONS OF THE PHOTOVOLTAIC TECHNOLOGIES, Renewable energy, 5(1-4), 1994, pp. 252-267
ATOMIC IMAGING, ATOMIC PROCESSING AND NANOCHARACTERIZATION OF CUINSE2USING PROXIMAL PROBE TECHNIQUES
Authors: KAZMERSKI LL
Citation: Ll. Kazmerski, ATOMIC IMAGING, ATOMIC PROCESSING AND NANOCHARACTERIZATION OF CUINSE2USING PROXIMAL PROBE TECHNIQUES, JPN J A P 1, 32, 1993, pp. 25-34
MICROCHARACTERIZATION TO NANO-CHARACTERIZATION OF SEMICONDUCTOR GRAIN-BOUNDARIES
Authors: KAZMERSKI LL
Citation: Ll. Kazmerski, MICROCHARACTERIZATION TO NANO-CHARACTERIZATION OF SEMICONDUCTOR GRAIN-BOUNDARIES, Surface science reports, 19(3-6), 1993, pp. 169-189
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