ACNP - Italian Periodicals Catalogue

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Results: 10

OPTIMIZATION OF CURVED X-RAY MULTILAYER MIRRORS FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

Authors: STOEV K KNOTH J SCHWENKE H

Citation: K. Stoev et al., OPTIMIZATION OF CURVED X-RAY MULTILAYER MIRRORS FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, X-ray spectrometry, 27(3), 1998, pp. 166-172

DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY ALONE AND IN COMBINATION WITH ION-BEAM SPUTTERING

Authors: SCHWENKE H KNOTH J GUNTHER R WIENER G BORMANN R

Citation: H. Schwenke et al., DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY ALONE AND IN COMBINATION WITH ION-BEAM SPUTTERING, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 795-803

ION-BEAM SPUTTERING TECHNIQUES FOR HIGH-RESOLUTION CONCENTRATION DEPTH PROFILING WITH GLANCING-INCIDENCE X-RAY-FLUORESCENCE SPECTROMETRY

Authors: WIENER G GUNTHER R MICHAELSEN C KNOTH J SCHWENKE H BORMANN R

Citation: G. Wiener et al., ION-BEAM SPUTTERING TECHNIQUES FOR HIGH-RESOLUTION CONCENTRATION DEPTH PROFILING WITH GLANCING-INCIDENCE X-RAY-FLUORESCENCE SPECTROMETRY, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 813-821

VARIABLE X-RAY-EXCITATION FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING AN MO W ALLOY ANODE AND A TUNABLE DOUBLE MULTILAYER MONOCHROMATOR/

Authors: KNOTH J PRANGE A SCHNEIDER H SCHWENKE H

Citation: J. Knoth et al., VARIABLE X-RAY-EXCITATION FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING AN MO W ALLOY ANODE AND A TUNABLE DOUBLE MULTILAYER MONOCHROMATOR/, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 907-913

MEASUREMENT OF SHALLOW ARSENIC IMPURITY PROFILES IN SEMICONDUCTOR SILICON USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY AND TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

Authors: SCHWENKE H KNOTH J FABRY L PAHLKE S SCHOLZ R FREY L

Citation: H. Schwenke et al., MEASUREMENT OF SHALLOW ARSENIC IMPURITY PROFILES IN SEMICONDUCTOR SILICON USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY AND TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, Journal of the Electrochemical Society, 144(11), 1997, pp. 3979-3983

ENGINEERING VIA THE INTERNET

Authors: KNOTH J

Citation: J. Knoth, ENGINEERING VIA THE INTERNET, Computer-aided engineering, 15(10), 1996, pp. 54

DETERMINATION OF CONCENTRATION DEPTH PROFILES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM ETCHING

Authors: GUNTHER R WIENER G KNOTH J SCHWENKE H BORMANN R

Citation: R. Gunther et al., DETERMINATION OF CONCENTRATION DEPTH PROFILES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM ETCHING, Review of scientific instruments, 67(6), 1996, pp. 2332-2336

DEPTH PROFILING IN SURFACES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE

Authors: SCHWENKE H KNOTH J

Citation: H. Schwenke et J. Knoth, DEPTH PROFILING IN SURFACES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE, Analytical sciences, 11(3), 1995, pp. 533-537

CONCENTRATION-DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM MICROSECTIONING TECHNIQUES

Authors: WIENER G MICHAELSEN C KNOTH J SCHWENKE H BORMANN R

Citation: G. Wiener et al., CONCENTRATION-DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM MICROSECTIONING TECHNIQUES, Review of scientific instruments, 66(1), 1995, pp. 20-23

TUNABLE EXCITING ENERGIES FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING A TUNGSTEN ANODE AND BANDPASS FILTERING

Authors: KNOTH J SCHNEIDER H SCHWENKE H

Citation: J. Knoth et al., TUNABLE EXCITING ENERGIES FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING A TUNGSTEN ANODE AND BANDPASS FILTERING, X-ray spectrometry, 23(6), 1994, pp. 261-266

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