Citation: K. Stoev et al., OPTIMIZATION OF CURVED X-RAY MULTILAYER MIRRORS FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, X-ray spectrometry, 27(3), 1998, pp. 166-172
Authors:
SCHWENKE H
KNOTH J
GUNTHER R
WIENER G
BORMANN R
Citation: H. Schwenke et al., DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY ALONE AND IN COMBINATION WITH ION-BEAM SPUTTERING, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 795-803
Authors:
WIENER G
GUNTHER R
MICHAELSEN C
KNOTH J
SCHWENKE H
BORMANN R
Citation: G. Wiener et al., ION-BEAM SPUTTERING TECHNIQUES FOR HIGH-RESOLUTION CONCENTRATION DEPTH PROFILING WITH GLANCING-INCIDENCE X-RAY-FLUORESCENCE SPECTROMETRY, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 813-821
Citation: J. Knoth et al., VARIABLE X-RAY-EXCITATION FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING AN MO W ALLOY ANODE AND A TUNABLE DOUBLE MULTILAYER MONOCHROMATOR/, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 907-913
Authors:
SCHWENKE H
KNOTH J
FABRY L
PAHLKE S
SCHOLZ R
FREY L
Citation: H. Schwenke et al., MEASUREMENT OF SHALLOW ARSENIC IMPURITY PROFILES IN SEMICONDUCTOR SILICON USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY AND TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, Journal of the Electrochemical Society, 144(11), 1997, pp. 3979-3983
Authors:
GUNTHER R
WIENER G
KNOTH J
SCHWENKE H
BORMANN R
Citation: R. Gunther et al., DETERMINATION OF CONCENTRATION DEPTH PROFILES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM ETCHING, Review of scientific instruments, 67(6), 1996, pp. 2332-2336
Citation: H. Schwenke et J. Knoth, DEPTH PROFILING IN SURFACES USING TOTAL-REFLECTION X-RAY-FLUORESCENCE, Analytical sciences, 11(3), 1995, pp. 533-537
Authors:
WIENER G
MICHAELSEN C
KNOTH J
SCHWENKE H
BORMANN R
Citation: G. Wiener et al., CONCENTRATION-DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM MICROSECTIONING TECHNIQUES, Review of scientific instruments, 66(1), 1995, pp. 20-23
Citation: J. Knoth et al., TUNABLE EXCITING ENERGIES FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING A TUNGSTEN ANODE AND BANDPASS FILTERING, X-ray spectrometry, 23(6), 1994, pp. 261-266