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Results: 1-9 |
Results: 9
Silicon network in a-Si : H films containing ordered inclusions
Authors: Golikova, OA Bogdanova, EV Kazanin, MM Kuznetsov, AN Terekhov, VA Kashkarov, VM Ostapenko, OV
Citation: Oa. Golikova et al., Silicon network in a-Si : H films containing ordered inclusions, SEMICONDUCT, 35(5), 2001, pp. 579-582
Determination of the phase composition of surface layers of porous siliconby ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques
Authors: Terekhov, VA Kashkarov, VM",Manukovskii,"Schukarev, AV Domashevskaya, EP
Citation: Va. Terekhov et al., Determination of the phase composition of surface layers of porous siliconby ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques, J ELEC SPEC, 114, 2001, pp. 895-900
XPS and XES emission investigations of d-p resonance in some copper chalcogenides
Authors: Domashevskaya, EP Gorbachev, VV Terekhov, VA Kashkarov, VM Panfilova, EV Shchukarev, AV
Citation: Ep. Domashevskaya et al., XPS and XES emission investigations of d-p resonance in some copper chalcogenides, J ELEC SPEC, 114, 2001, pp. 901-908
Specific features of the joint influence of lead and bismuth oxides on thermal oxidation of GaAs
Authors: Mittova, IY Kostryukov, VF Pshestanchik, VR Kashkarov, VM Prokin, AN
Citation: Iy. Mittova et al., Specific features of the joint influence of lead and bismuth oxides on thermal oxidation of GaAs, RUSS J IN C, 46(5), 2001, pp. 723-727
Solid-state reactions underlying the thermal oxidation of Ni/InP structures
Authors: Mittova, IY Prokin, AN Gavryutin, VN Sukhochev, AS Kashkarov, VM
Citation: Iy. Mittova et al., Solid-state reactions underlying the thermal oxidation of Ni/InP structures, INORG MATER, 37(4), 2001, pp. 321-326
Effect of VO2+ cation on the nitric acid oxidation of indium phosphide
Authors: Mittova, IY Soshnikov, IM Dement'ev, NN Ponomareva, SA Kashkarov, VM
Citation: Iy. Mittova et al., Effect of VO2+ cation on the nitric acid oxidation of indium phosphide, INORG MATER, 37(1), 2001, pp. 5-8
Structural-phase parameters found for porous silicon from capacitance measurements
Authors: Tutov, EA Andryukov, AY Kashkarov, VM
Citation: Ea. Tutov et al., Structural-phase parameters found for porous silicon from capacitance measurements, RUS J AP CH, 73(7), 2000, pp. 1133-1135
Thermal oxidation of InP in the presence of group IV nitrates and sulfates
Authors: Mittova, IY Shchukarev, AV Soshnikov, VV Kashkarov, VM
Citation: Iy. Mittova et al., Thermal oxidation of InP in the presence of group IV nitrates and sulfates, INORG MATER, 35(12), 1999, pp. 1209-1212
Thermal oxidation of InP in the presence of PbO vapor
Authors: Mittova, IY Soshnikov, VV Kashkarov, VM Pshestanchik, VR
Citation: Iy. Mittova et al., Thermal oxidation of InP in the presence of PbO vapor, INORG MATER, 35(1), 1999, pp. 7-9
Risultati: 1-9 |