Authors:
Ayoub, M
Hage-Ali, M
Koebel, JM
Regal, R
Rit, C
Klotz, F
Zumbiehli, A
Siffert, P
Citation: M. Ayoub et al., Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods, MAT SCI E B, 83(1-3), 2001, pp. 173-179
Authors:
Zumbiehl, A
Hage-Ali, M
Fougeres, P
Koebel, JM
Regal, R
Rit, C
Ayoub, M
Siffert, P
Citation: A. Zumbiehl et al., Modelling and 3D optimisation of CdTe pixels detector array geometry - Extension to small pixels, NUCL INST A, 469(2), 2001, pp. 227-239