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Results: 1-16 |
Results: 16
COMPARISON OF MIL-STD-1773 FIBER OPTIC DATA BUS TERMINALS - SINGLE EVENT PROTON TEST IRRADIATION, IN-FLIGHT SPACE PERFORMANCE, AND PREDICTION TECHNIQUES
Authors: LABEL KA MARSHALL PW MARSHALL CJ BARTH J LEIDECKER H REED R SEIDLECK CM
Citation: Ka. Label et al., COMPARISON OF MIL-STD-1773 FIBER OPTIC DATA BUS TERMINALS - SINGLE EVENT PROTON TEST IRRADIATION, IN-FLIGHT SPACE PERFORMANCE, AND PREDICTION TECHNIQUES, IEEE transactions on nuclear science, 45(3), 1998, pp. 1633-1639
SINGLE EVENT TEST METHODOLOGY AND TEST-RESULTS OF COMMERCIAL GIGABIT PER SECOND FIBER CHANNEL HARDWARE
Authors: CARTS MA MARSHALL PW MARSHALL CJ LABEL KA FLANEGAN M BRETTHAUER J
Citation: Ma. Carts et al., SINGLE EVENT TEST METHODOLOGY AND TEST-RESULTS OF COMMERCIAL GIGABIT PER SECOND FIBER CHANNEL HARDWARE, IEEE transactions on nuclear science, 44(6), 1997, pp. 1878-1884
PROTON-INDUCED TRANSIENTS IN OPTOCOUPLERS - IN-FLIGHT ANOMALIES, GROUND IRRADIATION TEST, MITIGATION AND IMPLICATIONS
Authors: LABEL KA MARSHALL PW MARSHALL CJ DORDINE M CARTS M LUM G KIM HS SEIDLECK CM POWELL T ABBOTT R BARTH J STASSINOPOULOS EG
Citation: Ka. Label et al., PROTON-INDUCED TRANSIENTS IN OPTOCOUPLERS - IN-FLIGHT ANOMALIES, GROUND IRRADIATION TEST, MITIGATION AND IMPLICATIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 1885-1892
MEASUREMENT OF A CROSS-SECTION FOR SINGLE-EVENT GATE RUPTURE IN POWERMOSFETS
Authors: MOURET I CALVEL P ALLENSPACH M TITUS JL WHEATLEY CF LABEL KA CALVET MC SCHRIMPF RD GALLOWAY KF
Citation: I. Mouret et al., MEASUREMENT OF A CROSS-SECTION FOR SINGLE-EVENT GATE RUPTURE IN POWERMOSFETS, IEEE electron device letters, 17(4), 1996, pp. 163-165
RADIATION EFFECT CHARACTERIZATION AND TEST METHODS OF SINGLE-CHIP ANDMULTICHIP STACKED 16MBIT DRAMS
Authors: LABEL KA GATES MM MORAN AK KIM HS SEIDLECK CM MARSHALL P KINNISON J CARKHUFF B
Citation: Ka. Label et al., RADIATION EFFECT CHARACTERIZATION AND TEST METHODS OF SINGLE-CHIP ANDMULTICHIP STACKED 16MBIT DRAMS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2974-2981
EXPERIMENTAL-EVIDENCE OF THE TEMPERATURE AND ANGULAR-DEPENDENCE IN SEGR
Authors: MOURET I CALVET MC CALVEL P TASTET P ALLENSPACH M LABEL KA TITUS JL WHEATLEY CF SCHRIMPF RD GALLOWAY KF
Citation: I. Mouret et al., EXPERIMENTAL-EVIDENCE OF THE TEMPERATURE AND ANGULAR-DEPENDENCE IN SEGR, IEEE transactions on nuclear science, 43(3), 1996, pp. 936-943
SYSTEM-LEVEL RADIATION RESPONSE OF A HIGH-PERFORMANCE FIBER OPTIC DATA BUS
Authors: DALE CJ MARSHALL PW FRITZ ME DELACHAPELLE M CARTS MA LABEL KA
Citation: Cj. Dale et al., SYSTEM-LEVEL RADIATION RESPONSE OF A HIGH-PERFORMANCE FIBER OPTIC DATA BUS, IEEE transactions on nuclear science, 43(3), 1996, pp. 1030-1037
SEE DATA FROM THE APEX COSMIC-RAY UPSET EXPERIMENT - PREDICTING THE PERFORMANCE OF COMMERCIAL DEVICES IN-SPACE
Authors: ADOLPHSEN J BARTH JL STASSINOPOULOS EG GRUNER T WENNERSTEN M LABEL KA SEIDLECK CM
Citation: J. Adolphsen et al., SEE DATA FROM THE APEX COSMIC-RAY UPSET EXPERIMENT - PREDICTING THE PERFORMANCE OF COMMERCIAL DEVICES IN-SPACE, IEEE transactions on nuclear science, 43(3), 1996, pp. 1069-1076
SPACE RADIATION EFFECTS IN HIGH-PERFORMANCE FIBER OPTIC DATA LINKS FOR SATELLITE DATA MANAGEMENT
Authors: MARSHALL PW DALE CJ LABEL KA
Citation: Pw. Marshall et al., SPACE RADIATION EFFECTS IN HIGH-PERFORMANCE FIBER OPTIC DATA LINKS FOR SATELLITE DATA MANAGEMENT, IEEE transactions on nuclear science, 43(2), 1996, pp. 645-653
SINGLE-EVENT-EFFECT MITIGATION FROM A SYSTEM PERSPECTIVE
Authors: LABEL KA GATES NM
Citation: Ka. Label et Nm. Gates, SINGLE-EVENT-EFFECT MITIGATION FROM A SYSTEM PERSPECTIVE, IEEE transactions on nuclear science, 43(2), 1996, pp. 654-660
PARTICLE-INDUCED MITIGATION OF SEU SENSITIVITY IN HIGH DATA RATE GAASHIGFET TECHNOLOGIES
Authors: MARSHALL PW DALE CJ WEATHERFORD TR LAMACCHIA M LABEL KA
Citation: Pw. Marshall et al., PARTICLE-INDUCED MITIGATION OF SEU SENSITIVITY IN HIGH DATA RATE GAASHIGFET TECHNOLOGIES, IEEE transactions on nuclear science, 42(6), 1995, pp. 1844-1849
IMPLICATIONS OF SINGLE EVENT EFFECT CHARACTERIZATION OF HYBRID DC-DC CONVERTERS AND A SOLID-STATE POWER CONTROLLER
Authors: LABEL KA BARRY RK CASTELL K KIM HS SEIDLECK CM
Citation: Ka. Label et al., IMPLICATIONS OF SINGLE EVENT EFFECT CHARACTERIZATION OF HYBRID DC-DC CONVERTERS AND A SOLID-STATE POWER CONTROLLER, IEEE transactions on nuclear science, 42(6), 1995, pp. 1957-1963
SINGLE EVENT UPSET RATES ON 1 MBIT AND 256 KBIT MEMORIES - CRUX EXPERIMENT ON APEX
Authors: ADOLPHSEN J BARTH JL STASSINOPOULOS EG GRUNER T WENNERSTEN M LABEL KA SEIDLECK CM
Citation: J. Adolphsen et al., SINGLE EVENT UPSET RATES ON 1 MBIT AND 256 KBIT MEMORIES - CRUX EXPERIMENT ON APEX, IEEE transactions on nuclear science, 42(6), 1995, pp. 1964-1974
PARTICLE-INDUCED BIT ERRORS IN HIGH-PERFORMANCE FIBER OPTIC DATA LINKS FOR SATELLITE DATA MANAGEMENT
Authors: MARSHALL PW DALE CJ CARTS MA LABEL KA
Citation: Pw. Marshall et al., PARTICLE-INDUCED BIT ERRORS IN HIGH-PERFORMANCE FIBER OPTIC DATA LINKS FOR SATELLITE DATA MANAGEMENT, IEEE transactions on nuclear science, 41(6), 1994, pp. 1958-1965
SINGLE EVENT EFFECT GROUND TEST-RESULTS FOR A FIBER OPTIC DATA INTERCONNECT AND ASSOCIATED ELECTRONICS
Authors: LABEL KA HAWKINS DK COOLEY JA SEIDLECK CM MARSHALL P DALE C GATES MM KIM HS STASSINOPOULOS EG
Citation: Ka. Label et al., SINGLE EVENT EFFECT GROUND TEST-RESULTS FOR A FIBER OPTIC DATA INTERCONNECT AND ASSOCIATED ELECTRONICS, IEEE transactions on nuclear science, 41(6), 1994, pp. 1999-2004
SEDS MIL-STD-1773 FIBER OPTIC DATA BUS - PROTON IRRADIATION TEST-RESULTS AND SPACEFLIGHT SEU DATA
Authors: LABEL KA MARSHALL P DALE C CRABTREE CM STASSINOPOULOS EG MILLER JT GATES MM
Citation: Ka. Label et al., SEDS MIL-STD-1773 FIBER OPTIC DATA BUS - PROTON IRRADIATION TEST-RESULTS AND SPACEFLIGHT SEU DATA, IEEE transactions on nuclear science, 40(6), 1993, pp. 1638-1644
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