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Results: 1-11 |
Results: 11
PROBING OF DYNAMIC CHARGE STATES USING SI NGLE-ELECTRON TUNNELING TRANSISTORS
Authors: KRUPENIN VA LOTKHOV SV SCHERER H ZORIN AB AHLERS FJ NIEMEYER J WOLF H
Citation: Va. Krupenin et al., PROBING OF DYNAMIC CHARGE STATES USING SI NGLE-ELECTRON TUNNELING TRANSISTORS, Uspehi fiziceskih nauk, 168(2), 1998, pp. 219-222
INSTABILITY OF SINGLE-ELECTRON MEMORY AT LOW-TEMPERATURES IN AL ALOX/AL STRUCTURES/
Authors: KRUPENIN VA LOTKHOV SV PRESNOV DE
Citation: Va. Krupenin et al., INSTABILITY OF SINGLE-ELECTRON MEMORY AT LOW-TEMPERATURES IN AL ALOX/AL STRUCTURES/, Journal of experimental and theoretical physics, 84(1), 1997, pp. 190-196
RESISTIVE STATE ANOMALIES OF SUPERCONDUCTING NANOSTRUCTURES
Authors: ARUTYUNOV KY KRUPENIN VA LOTKHOV SV PAVOLOTSKI AB RINDERER L
Citation: Ky. Arutyunov et al., RESISTIVE STATE ANOMALIES OF SUPERCONDUCTING NANOSTRUCTURES, Superlattices and microstructures, 21, 1997, pp. 27-30
AN EXPERIMENTAL-STUDY OF CHARGE EFFECTS I N SUPERSMALL TUNNEL-JUNCTIONS
Authors: KRUPENIN VA LOTKHOV SV PASHKIN YA PRESNOV DE
Citation: Va. Krupenin et al., AN EXPERIMENTAL-STUDY OF CHARGE EFFECTS I N SUPERSMALL TUNNEL-JUNCTIONS, Uspehi fiziceskih nauk, 167(5), 1997, pp. 566-568
INVESTIGATION OF THE OFFSET CHARGE NOISE IN SINGLE-ELECTRON TUNNELINGDEVICES
Authors: WOLF H AHLERS FJ NIEMEYER J SCHERER H WEIMANN T ZORIN AB KRUPENIN VA LOTKHOV SV PRESNOV DE
Citation: H. Wolf et al., INVESTIGATION OF THE OFFSET CHARGE NOISE IN SINGLE-ELECTRON TUNNELINGDEVICES, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 303-306
BACKGROUND CHARGE NOISE IN METALLIC SINGLE-ELECTRON TUNNELING DEVICES
Authors: ZORIN AB AHLERS FJ NIEMEYER J WEIMANN T WOLF H KRUPENIN VA LOTKHOV SV
Citation: Ab. Zorin et al., BACKGROUND CHARGE NOISE IN METALLIC SINGLE-ELECTRON TUNNELING DEVICES, Physical review. B, Condensed matter, 53(20), 1996, pp. 13682-13687
ON THE REPRODUCIBILITY OF THE RESISTIVE TRANSITION ANOMALIES IN SUPERCONDUCTING NANOSTRUCTURES
Authors: ARUTYUNOV KY LOTKHOV SV PAVOLOTSKI AB PRESNOV DE RINDERER L
Citation: Ky. Arutyunov et al., ON THE REPRODUCIBILITY OF THE RESISTIVE TRANSITION ANOMALIES IN SUPERCONDUCTING NANOSTRUCTURES, Helvetica Physica Acta, 69, 1996, pp. 31-32
DETECTION OF THE SINGLE-ELECTRON TUNNELING NOISE USING COULOMB-BLOCKADE ELECTROMETER
Authors: ZORIN AB KRUPENIN VA LOTKHOV SV NIEMEYER J PRESNOV DE SCHERER H WOLF H AHLERS FJ WEIMAN T
Citation: Ab. Zorin et al., DETECTION OF THE SINGLE-ELECTRON TUNNELING NOISE USING COULOMB-BLOCKADE ELECTROMETER, Czechoslovak journal of Physics, 46, 1996, pp. 2281-2282
CHARGE-STATE INSTABILITIES IN THE SINGLE-ELECTRON TRAP
Authors: KRUPENIN VA LOTKHOV SV PRESNOV DE ZORIN AV AHLERS FJ NIEMEYER J SCHERER H WEIMANN T WOLF H
Citation: Va. Krupenin et al., CHARGE-STATE INSTABILITIES IN THE SINGLE-ELECTRON TRAP, Czechoslovak journal of Physics, 46, 1996, pp. 2283-2284
RESISTIVE STATE MEASUREMENTS OF QUASI-0-DIMENSIONAL SUPERCONDUCTING STRUCTURES
Authors: ARUTYUNOV KY KRUPENIN VA LOTKHOV SV PAVOLOTSKI AN RINDERER L
Citation: Ky. Arutyunov et al., RESISTIVE STATE MEASUREMENTS OF QUASI-0-DIMENSIONAL SUPERCONDUCTING STRUCTURES, Czechoslovak journal of Physics, 46, 1996, pp. 2309-2310
PHOTO-BEAM AND ELECTRON-BEAM LITHOGRAPHY SHARING COMMON STENCIL
Authors: KRUPENIN VA LOTKHOV SV VYSHENSKII SV
Citation: Va. Krupenin et al., PHOTO-BEAM AND ELECTRON-BEAM LITHOGRAPHY SHARING COMMON STENCIL, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2132-2136
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