Authors:
Liu, WC
Yu, KH
Lin, KW
Lin, KP
Yen, CH
Cheng, CC
Wang, CK
Chuang, HM
Citation: Wc. Liu et al., MOCVD grown InGaP/GaAs camel-like field-effect transistor for high-breakdown and high-temperature operations, J PHYS IV, 11(PR3), 2001, pp. 951-955
Citation: Kw. Lin et al., Characteristics and comparison of In0.49Ga0.51P/InGaAs single and double delta-doped pseudomorphic, SOL ST ELEC, 45(2), 2001, pp. 309-314
Citation: Wc. Liu et al., On the InGaP/GaAs/InGaAs camel-like FET for high-breakdown, low-leakage, and high-temperature operations, IEEE DEVICE, 48(8), 2001, pp. 1522-1530
Citation: Ch. Yen et al., Investigation of mesa-sidewall effects on direct current and radio frequency characteristics of Ga0.51In0.49P/In0.15Ga0.85As/Ga0.51In0.49P pseudomorphic high electron mobility transistors, J VAC SCI B, 18(6), 2000, pp. 2615-2619
Citation: Sl. Lou et al., Automatic breast region extraction from digital mammograms for PACS and telemammography applications, COMP MED IM, 24(4), 2000, pp. 205-220
Citation: Kp. Lin et al., Study of a high-barrier-gate pseudomorphic transistor with a step-compositioned channel and bottomside delta-doped sheet structure, SEMIC SCI T, 15(6), 2000, pp. 643-647
Citation: Yk. Chang et al., Charge transfer and hybridization effects in Ni3Al and Ni3Ga studies by x-ray-absorption spectroscopy and theoretical calculations, J APPL PHYS, 87(3), 2000, pp. 1312-1317
Citation: Kh. Yu et al., InGaP/GaAs camel-like field-effect transistor for high-breakdown and high-temperature applications, ELECTR LETT, 36(22), 2000, pp. 1886-1888
Authors:
Huang, CC
Wang, ST
Chang, YC
Lin, KP
Wu, PL
Citation: Cc. Huang et al., Measurement of the urinary lactate : creatinine ratio for the early identification of newborn infants at risk for hypoxic-ischemic encephalopathy, N ENG J MED, 341(5), 1999, pp. 328-335
Authors:
Lin, KP
Tsai, CP
Yamawaki, M
Ariga, T
Yu, RK
Citation: Kp. Lin et al., Heterogeneity of antibody specificity in taiwanese patients with polyneuropathy and IgM paraproteinemia, J BIOMED SC, 5(6), 1998, pp. 441-445