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Strauss, U
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Citation: J. Baur et al., Influence of strain on growth mode and electro-optical properties of high-brightness InGaN-LEDs on SiC, J CRYST GR, 230(3-4), 2001, pp. 507-511
Authors:
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Schad, SS
Scherer, M
Kamp, M
Ulu, G
Emsley, M
Unlu, MS
Lell, A
Bader, S
Hahne, B
Lugauer, HJ
Kuhn, F
Weimar, A
Harle, V
Citation: V. Schwegler et al., GaN-based lasers on SiC: influence of mirror reflectivity on L-I characteristics, J CRYST GR, 230(3-4), 2001, pp. 512-516
Authors:
Reuscher, G
Landwehr, G
Keim, M
Lugauer, HJ
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Citation: G. Reuscher et al., p(+)-BeTe/n(+)-ZnSe ESAKI tunnelling heterojunctions for II-VI optoelectronic devices, ELECTR LETT, 36(3), 2000, pp. 247-249
Authors:
Reuscher, G
Landwehr, G
Keim, M
Lugauer, HJ
Fischer, F
Waag, A
Citation: G. Reuscher et al., Blue light emitting diode based on p(+)-BeTe/n(+)-ZnSe ESAKI tunnelling heterojunction, ELECTR LETT, 36(12), 2000, pp. 1056-1058
Authors:
Ivanov, SV
Toropov, AA
Sorokin, SV
Shubina, TV
Sedova, IV
Kop'ev, PS
Alferov, ZI
Waag, A
Lugauer, HJ
Reuscher, G
Keim, M
Fischer, FF
Landwehr, G
Citation: Sv. Ivanov et al., Blue-green ZnSe lasers with a new type of active region, SEMICONDUCT, 33(9), 1999, pp. 1016-1020
Authors:
Solov'ev, VA
Sorokin, SV
Sedova, IV
Mosina, GN
Ivanov, SV
Lugauer, HJ
Reuscher, G
Keim, M
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Landwehr, G
Citation: Va. Solov'Ev et al., Cathodoluminescence study of molecular beam epitaxy (MBE) grown MgZnSSe and BeMgZnSe alloy based heterostructures, J CRYST GR, 202, 1999, pp. 481-485
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Titkov, AN
Shubina, TV
Ivanov, SV
Kop'ev, PS
Lugauer, HJ
Reuscher, G
Keim, M
Waag, A
Landwehr, G
Citation: Av. Ankudinov et al., Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes, APPL PHYS L, 75(17), 1999, pp. 2626-2628
Authors:
Ivanov, SV
Toropov, AA
Sorokin, SV
Shubina, TV
Sedova, IV
Sitnikova, AA
Kop'ev, PS
Alferov, ZI
Lugauer, HJ
Reuscher, G
Keim, M
Fischer, F
Waag, A
Landwehr, G
Citation: Sv. Ivanov et al., CdSe fractional-monolayer active region of molecular beam epitaxy grown green ZnSe-based lasers, APPL PHYS L, 74(4), 1999, pp. 498-500