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Results: 1-13 |
Results: 13
CHARACTERIZATION OF 3-D PARTICLE DISTRIBUTIONS AND EFFECTS ON RECRYSTALLIZATION KINETICS AND MICROSTRUCTURE
Authors: MARTHINSEN K FRIDY JM ROUNS TN LIPPERT KB NES E
Citation: K. Marthinsen et al., CHARACTERIZATION OF 3-D PARTICLE DISTRIBUTIONS AND EFFECTS ON RECRYSTALLIZATION KINETICS AND MICROSTRUCTURE, Scripta materialia, 39(9), 1998, pp. 1177-1183
EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF EELS NEAR-EDGE FINE-STRUCTURE IN TIAL WITH AND WITHOUT TERNARY ADDITION OF V, CR, OR MN
Authors: LIE K HOLMESTAD R MARTHINSEN K HOIER R
Citation: K. Lie et al., EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF EELS NEAR-EDGE FINE-STRUCTURE IN TIAL WITH AND WITHOUT TERNARY ADDITION OF V, CR, OR MN, Physical review. B, Condensed matter, 57(3), 1998, pp. 1585-1593
TRANSFORMATION KINETICS AND MICROSTRUCTURE FOR GRAIN-BOUNDARY NUCLEATED RECRYSTALLIZATION IN 2 DIMENSIONS
Authors: MARTHINSEN K RYUM N
Citation: K. Marthinsen et N. Ryum, TRANSFORMATION KINETICS AND MICROSTRUCTURE FOR GRAIN-BOUNDARY NUCLEATED RECRYSTALLIZATION IN 2 DIMENSIONS, Acta materialia, 45(3), 1997, pp. 1127-1136
A GENERAL-MODEL FOR METAL PLASTICITY
Authors: MARTHINSEN K NES E
Citation: K. Marthinsen et E. Nes, A GENERAL-MODEL FOR METAL PLASTICITY, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 234, 1997, pp. 1095-1098
NON-CENTROSYMMETRY EFFECTS AND POLARITY DETERMINATION IN III-V SEMICONDUCTORS
Authors: MARTHINSEN K LINDHEIM T HOIER R
Citation: K. Marthinsen et al., NON-CENTROSYMMETRY EFFECTS AND POLARITY DETERMINATION IN III-V SEMICONDUCTORS, Acta crystallographica. Section A, Foundations of crystallography, 53, 1997, pp. 366-375
THE INFLUENCE OF SPATIAL GRAIN-SIZE CORRELATION AND TOPOLOGY ON NORMAL GRAIN-GROWTH IN 2 DIMENSIONS
Authors: MARTHINSEN K HUNDERI O RYUM N
Citation: K. Marthinsen et al., THE INFLUENCE OF SPATIAL GRAIN-SIZE CORRELATION AND TOPOLOGY ON NORMAL GRAIN-GROWTH IN 2 DIMENSIONS, Acta materialia, 44(4), 1996, pp. 1681-1689
MODELING RECRYSTALLIZATION KINETICS, GRAIN SIZES, AND TEXTURES DURINGMULTIPASS HOT-ROLLING
Authors: VATNE HE MARTHINSEN K ORSUND R NES E
Citation: He. Vatne et al., MODELING RECRYSTALLIZATION KINETICS, GRAIN SIZES, AND TEXTURES DURINGMULTIPASS HOT-ROLLING, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 27(12), 1996, pp. 4133-4144
COMPARATIVE-ANALYSIS OF THE SIZE DISTRIBUTIONS OF LINEAR, PLANAR, ANDSPATIAL POISSON-VORONOI CELLS
Authors: MARTHINSEN K
Citation: K. Marthinsen, COMPARATIVE-ANALYSIS OF THE SIZE DISTRIBUTIONS OF LINEAR, PLANAR, ANDSPATIAL POISSON-VORONOI CELLS, Materials characterization, 36(2), 1996, pp. 53-63
REPEATED GRAIN-BOUNDARY AND GRAIN CORNER NUCLEATED RECRYSTALLIZATION IN ONE-DIMENSIONAL AND 2-DIMENSIONAL GRAIN STRUCTURES
Authors: MARTHINSEN K
Citation: K. Marthinsen, REPEATED GRAIN-BOUNDARY AND GRAIN CORNER NUCLEATED RECRYSTALLIZATION IN ONE-DIMENSIONAL AND 2-DIMENSIONAL GRAIN STRUCTURES, Modelling and simulation in materials science and engineering, 4(1), 1996, pp. 87-100
EFFICIENT BEAM-SELECTION CRITERIA IN QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: BIRKELAND C HOLMESTAD R MARTHINSEN K HOIER R
Citation: C. Birkeland et al., EFFICIENT BEAM-SELECTION CRITERIA IN QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Ultramicroscopy, 66(1-2), 1996, pp. 89-99
ANALYTICAL FILTERING OF LOW-ANGLE INELASTIC-SCATTERING CONTRIBUTIONS TO CBED CONTRAST
Authors: MARTHINSEN K HOLMESTAD R HOIER R
Citation: K. Marthinsen et al., ANALYTICAL FILTERING OF LOW-ANGLE INELASTIC-SCATTERING CONTRIBUTIONS TO CBED CONTRAST, Ultramicroscopy, 55(3), 1994, pp. 268-275
ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION
Authors: SPENCE JCH ZUO JM OKEEFFE M MARTHINSEN K HOIER R
Citation: Jch. Spence et al., ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 647-650
COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES
Authors: HOLMESTAD R KRIVANEK OL HOIER R MARTHINSEN K SPENCE JCH
Citation: R. Holmestad et al., COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES, Ultramicroscopy, 52(3-4), 1993, pp. 454-458
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