AAAAAA
Results: 1-25/50
Authors:
Nicolaides, L
Chen, Y
Mandelis, A
Vitkin, IA
Citation: L. Nicolaides et al., Theoretical, experimental, and computational aspects of optical property determination of turbid media by using frequency-domain laser infrared photothermal radiometry, J OPT SOC A, 18(10), 2001, pp. 2548-2556
Authors:
Mandelis, A
Citation: A. Mandelis, Diffusion-wave laser radiometric diagnostic quality-control technologies for materials NDE/NDT, NDT E INT, 34(4), 2001, pp. 277-287
Authors:
Wang, C
Mandelis, A
Au-Ieong, KP
Citation: C. Wang et al., Physical mechanism of reflectance inversion in hydrogen gas sensor with Pd/PVDF structures, SENS ACTU-B, 73(2-3), 2001, pp. 100-105
Authors:
Mandelis, A
Paoloni, S
Nicolaides, L
Citation: A. Mandelis et al., Novel lock-in waveform technique for signal-to-noise ratio and dynamic-range enhancement in highly noised photothermal experiments, ANAL SCI, 17, 2001, pp. S5-S8
Authors:
Garcia, JA
Nicolaides, L
Park, P
Mandelis, A
Farahkbahsh, B
Citation: Ja. Garcia et al., Photothermal radiometry of thermal sprayed coatings: Novel roughness elimination methodology, ANAL SCI, 17, 2001, pp. S89-S92
Authors:
Rodriguez, ME
Mandelis, A
Pan, G
Garcia, JA
Riopel, Y
Citation: Me. Rodriguez et al., Microelectronic circuit characterization via photothermal radiometry of scribeline recombination lifetime, ANAL SCI, 17, 2001, pp. S262-S264
Authors:
Mandelis, A
Rodriguez, ME
Garcia, JA
Gorodokin, V
Raskin, Y
Citation: A. Mandelis et al., Minority carrier lifetime and iron concentration measurements on p-Si wafers by infrared photothermal radiometry and microwave photoconductance decay., ANAL SCI, 17, 2001, pp. S265-S268
Authors:
Mendoza, PJ
Mandelis, A
Nicolaides, L
Huerta, J
Rodriguez, E
Citation: Pj. Mendoza et al., Combined photothermal and photoacoustic characterization of silicon-epoxy,and the existence of a particle percolation threshold., ANAL SCI, 17, 2001, pp. S269-S272
Authors:
Rodriguez, ME
Mandelis, A
Mendoza, PJ
Garcia, J
Citation: Me. Rodriguez et al., Photothermal radiometric frequency-swept studies of kinetics process in P-Si wafers, ANAL SCI, 17, 2001, pp. S273-S276
Authors:
Rodriguez, ME
Mandelis, A
Rabago, F
Nicolaides, L
Citation: Me. Rodriguez et al., Photothermal characterization of B-implanted Si (shallow) samples., ANAL SCI, 17, 2001, pp. S277-S280
Authors:
Nicolaides, L
Chen, Y
Mandelis, A
Vitkin, IA
Citation: L. Nicolaides et al., Analytical and experimental aspects of optical property determination of turbid media using frequency-domain PTR, ANAL SCI, 17, 2001, pp. S326-S329
Authors:
Nicolaides, L
Feng, C
Mandelis, A
Abrams, SH
Citation: L. Nicolaides et al., Dental dynamic diagnostics using simultaneous frequency-domain PTR and laser luminescence, ANAL SCI, 17, 2001, pp. S330-S333
Authors:
Nicolaides, L
Mandelis, A
Beingessner, CJ
Citation: L. Nicolaides et al., Depth profilomerty of hardened steels by Gaussian elimination of roughness, ANAL SCI, 17, 2001, pp. S383-S386
Authors:
Mandelis, A
Wang, CH
Citation: A. Mandelis et Ch. Wang, Technique, application and noise analysis of purely thermal-wave photopyroelectric interferometry (PPEI), ANAL SCI, 17, 2001, pp. S447-S450
Authors:
Balderas-Lopez, JA
Mandelis, A
Garcia, JA
Citation: Ja. Balderas-lopez et al., Measurements of the thermal diffusivity of liquids with a thermal-wave resonator cavity, ANAL SCI, 17, 2001, pp. S519-S522
Authors:
Rodriguez, ME
Mendoza, PJ
Mandelis, A
Nicolaides, L
Citation: Me. Rodriguez et al., Combined photothermal and photoacoustic characterization of silicon-epoxy composites and the existence of a particle thermal percolation threshold, NUCL INST B, 184(3), 2001, pp. 421-429
Authors:
Balderas-Lopez, JA
Mandelis, A
Citation: Ja. Balderas-lopez et A. Mandelis, Simple, accurate, and precise measurements of thermal diffusivity in liquids using a thermal-wave cavity, REV SCI INS, 72(6), 2001, pp. 2649-2652
Authors:
Li, L
Mandelis, A
Garcia, J
Eccles, C
Citation: L. Li et al., Infrared radiometry-based background-compensated thermometric instrument for noncontact temperature and friction measurements, REV SCI INS, 72(5), 2001, pp. 2483-2489
Authors:
Mandelis, A
Citation: A. Mandelis, Many uses for diffusion waves - Reply, PHYS TODAY, 54(3), 2001, pp. 100
Authors:
Mandelis, A
Nicolaides, L
Chen, Y
Citation: A. Mandelis et al., Structure and the reflectionless/refractionless nature of parabolic diffusion-wave fields - art. no. 020801, PHYS REV L, 8702(2), 2001, pp. 0801-NIL_6
Authors:
Mandelis, A
Rodriguez, ME
Raskin, Y
Gorodokin, V
Citation: A. Mandelis et al., Laser infrared photothermal radiometric and ELYMAT characterizations of p-Si wafers annealed in the presence of an external electric field, PHYS ST S-A, 185(2), 2001, pp. 471-478
Authors:
Balderas-Lopez, JA
Mandelis, A
Citation: Ja. Balderas-lopez et A. Mandelis, Thermal diffusivity measurements in liquids using signal common-mode-rejection demodulation in a thermal-wave cavity, J APPL PHYS, 90(7), 2001, pp. 3296-3300
Authors:
Balderas-Lopez, JA
Mandelis, A
Citation: Ja. Balderas-lopez et A. Mandelis, Thermal diffusivity measurements in the photoacoustic open-cell configuration using simple signal normalization techniques, J APPL PHYS, 90(5), 2001, pp. 2273-2279
Authors:
Nicolaides, L
Mandelis, A
Citation: L. Nicolaides et A. Mandelis, Methods for surface roughness elimination from thermal-wave frequency scans in thermally inhomogeneous solids, J APPL PHYS, 90(3), 2001, pp. 1255-1265
Authors:
Nicolaides, L
Mandelis, A
Beingessner, CJ
Citation: L. Nicolaides et al., Physical mechanisms of thermal-diffusivity depth-profile generation in a hardened low-alloy Mn, Si, Cr, Mo steel reconstructed by photothermal radiometry, J APPL PHYS, 89(12), 2001, pp. 7879-7884