Authors:
Asklund, H
Ilver, L
Kanski, J
Mankefors, S
Sodervall, U
Sadowski, J
Citation: H. Asklund et al., Thickness-dependent valence-band photoemission from thin InAs and GaAs films - art. no. 195314, PHYS REV B, 6319(19), 2001, pp. 5314
Authors:
Mankefors, S
Nilsson, PO
Kanski, J
Andersson, T
Karlsson, K
Agui, A
Sathe, C
Guo, JH
Nordgren, J
Citation: S. Mankefors et al., Theoretical investigation of the thickness dependence of soft-x-ray emission from thin AlAs(100) layers buried in GaAs, PHYS REV B, 61(8), 2000, pp. 5540-5545
Citation: S. Mankefors et Sp. Svensson, Ab initio investigation of the electronic and geometric structure of zincblende Ga1-xTlxAs alloys, J PHYS-COND, 12(7), 2000, pp. 1223-1237
Citation: Po. Nilsson et al., An ultrathin buried Si layer in GaAs studied by soft X-ray emission spectroscopy and surface X-ray diffraction: theory and experiment, J ALLOY COM, 286(1-2), 1999, pp. 31-36
Citation: S. Mankefors et al., Ab initio calculations of the geometry and electronic structure of hydrogenated As/Ge(100), PHYS REV B, 60(3), 1999, pp. 1933-1938
Authors:
Strocov, VN
Mankefors, S
Nilsson, PO
Kanski, J
Ilver, L
Starnberg, HI
Citation: Vn. Strocov et al., Very-low-energy electron diffraction on the H-terminated Si(111) surface: Ab initio pseudopotential analysis, PHYS REV B, 59(8), 1999, pp. R5296-R5299
Citation: S. Mankefors et al., Semiconductor polar surfaces: mechanisms of the stability of non-reconstructed III-V ((1)over-bar(1)over-bar(1)over-bar) surfaces, SURF SCI, 443(3), 1999, pp. L1049-L1054
Citation: S. Mankefors et al., Hydrogenation of As/Ge(100) 2 x 1: a theoretical study of the surface electronic structure, SURF SCI, 435, 1999, pp. 342-346