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Results:
1-11
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Results: 11
Authors:
Vasin, AV
Matveeva, LA
Yukhimchuk, VA
Shpilevskii, EM
Citation: Av. Vasin et al., The structure of fullerene C-60 films modified by helium glow discharge plasma, TECH PHYS L, 27(11), 2001, pp. 918-920
Authors:
Holiney, RY
Matveeva, LA
Venger, EF
Litvinenko, OA
Karachevtseva, LA
Citation: Ry. Holiney et al., Electroreflectance study of macroporous silicon surfaces (vol 172, pg 214,2001), APPL SURF S, 180(1-2), 2001, pp. 184-184
Authors:
Holiney, RY
Matveeva, LA
Venger, EF
Livinenko, AO
Karachevtseva, LA
Citation: Ry. Holiney et al., Electroreflectance study of macroporous silicon surfaces, APPL SURF S, 172(3-4), 2001, pp. 214-219
Authors:
Matveeva, LA
Vasin, AV
Kozeratskaya, GN
Totskii, YI
Citation: La. Matveeva et al., Radiation-resistant free germanium and silicon films for nuclear physics experiments, TECH PHYS L, 26(9), 2000, pp. 757-759
Authors:
Gorbach, TY
Holiney, RY
Matveeva, LA
Svechnikov, SV
Venger, EF
Kuzma, M
Wisz, G
Citation: Ty. Gorbach et al., Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTePLD films, MAT SCI E B, 71, 2000, pp. 288-291
Authors:
Gorbach, TY
Matveeva, LA
Smertenko, PS
Svechnikov, SV
Venger, EF
Kuzma, M
Wisz, G
Ciach, R
Rakowska, A
Citation: Ty. Gorbach et al., Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTePLD films on silicon patterned substrates, THIN SOL FI, 380(1-2), 2000, pp. 256-258
Authors:
Holiney, RY
Fedorenko, LL
Matveeva, LA
Strilchenko, IY
Venger, EF
Yusupov, NM
Citation: Ry. Holiney et al., Electroreflectance of porous layers obtained by stain etching of laser modified silicon, J PHYS D, 33(22), 2000, pp. 2875-2879
Authors:
Vasin, AV
Matveeva, LA
Kutsai, AM
Citation: Av. Vasin et al., Analysis of the fundamental absorption edge in amorphous hydrogenated carbon films, TECH PHYS L, 25(12), 1999, pp. 1006-1007
Authors:
Despotuli, AL
Matveeva, LA
Citation: Al. Despotuli et La. Matveeva, UV absorption of RbAg4I5-RE (Sm,Yb) thin-film systems, PHYS SOL ST, 41(2), 1999, pp. 192-196
Authors:
Venger, EF
Gorbach, TY
Matveeva, LA
Svechnikov, SV
Citation: Ef. Venger et al., Spectroscopy of electroreflection, the electron band structure, and the mechanism of visible photoluminescence of anisotropically etched silicon, J EXP TH PH, 89(5), 1999, pp. 948-954
Authors:
Gorbach, TY
Holiney, RY
Matveeva, LA
Smertenko, PS
Svechnikov, SV
Venger, EF
Ciach, R
Faryna, M
Citation: Ty. Gorbach et al., Growth of III-V semiconductor layers on Si patterned substrates, THIN SOL FI, 336(1-2), 1998, pp. 63-68
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