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Gorbach, TY
Holiney, RY
Matveeva, LA
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Venger, EF
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Wisz, G
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Gorbach, TY
Matveeva, LA
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Svechnikov, SV
Venger, EF
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Citation: Ty. Gorbach et al., Probe microanalysis investigation and electroreflectance spectroscopy of Hg1-xCdxTePLD films on silicon patterned substrates, THIN SOL FI, 380(1-2), 2000, pp. 256-258
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Holiney, RY
Fedorenko, LL
Matveeva, LA
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Venger, EF
Yusupov, NM
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Citation: Av. Vasin et al., Analysis of the fundamental absorption edge in amorphous hydrogenated carbon films, TECH PHYS L, 25(12), 1999, pp. 1006-1007
Authors:
Venger, EF
Gorbach, TY
Matveeva, LA
Svechnikov, SV
Citation: Ef. Venger et al., Spectroscopy of electroreflection, the electron band structure, and the mechanism of visible photoluminescence of anisotropically etched silicon, J EXP TH PH, 89(5), 1999, pp. 948-954