Authors:
Hoffmann, P
Mikalo, RP
Yfantis, A
Batchelor, DR
Appel, G
Yfantis, D
Schmeisser, D
Citation: P. Hoffmann et al., A spectre-microscopic approach for thin film analysis: Grain boundaries inmc-Si and Sn/SnO2 nano particles, MIKROCH ACT, 136(3-4), 2001, pp. 109-113
Citation: P. Hoffmann et al., A spectro-microscopic approach for spatially resolved characterisation of semiconductor structures in PEEM, SOL ST ELEC, 44(5), 2000, pp. 837-843
Authors:
Mikalo, RP
Hoffmann, P
Heller, T
Batchelor, DR
Appel, G
Schmeisser, D
Citation: Rp. Mikalo et al., Doping and defect inhomogeneities of polypyrrole tosylate films as revealed by mu-NEXAFS, MAT SCI E C, 8-9, 1999, pp. 257-265
Authors:
Hoffmann, P
Mikalo, RP
Schmeisser, D
Kittler, M
Citation: P. Hoffmann et al., A spectro-microscopic approach to study the morphology and elemental distribution of mc-Si surfaces, PHYS ST S-B, 215(1), 1999, pp. 743-749