ACNP - Italian Periodicals Catalogue

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Results: 1-12 |

Results: 12

Structural and morphological changes in low temperature annealed LPCVD Si layers

Authors: Cobianu, B Modreanu, M Danila, M Gavrila, R Bercu, M Gartner, M

Citation: B. Cobianu et al., Structural and morphological changes in low temperature annealed LPCVD Si layers, J PHYS IV, 11(PR3), 2001, pp. 315-323

Characterisation of LPCVD silicon oxynitride films by optical spectroscopy

Authors: Bercu, M Cobianu, C Modreanu, M Bercu, BN

Citation: M. Bercu et al., Characterisation of LPCVD silicon oxynitride films by optical spectroscopy, J PHYS IV, 11(PR3), 2001, pp. 963-969

Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films

Authors: Modreanu, M Gartner, M Tomozeiu, N Seekamp, J Cosmin, P

Citation: M. Modreanu et al., Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films, OPT MATER, 17(1-2), 2001, pp. 145-148

Photonic circuits integrated with CMOS compatible photodetectors

Authors: Cristea, D Craciunoiu, F Modreanu, M Caldararu, M Cernica, I

Citation: D. Cristea et al., Photonic circuits integrated with CMOS compatible photodetectors, OPT MATER, 17(1-2), 2001, pp. 201-205

Optical and electrical properties of LPCVD silicon oxynitride films on silicon

Authors: Szekeres, A Alexandrova, S Modreanu, M Cosmin, P Gartner, M

Citation: A. Szekeres et al., Optical and electrical properties of LPCVD silicon oxynitride films on silicon, VACUUM, 61(2-4), 2001, pp. 205-209

Physical properties of polycrystalline silicon films related to LPCVD conditions

Authors: Modreanu, M Bercu, M Cobianu, C

Citation: M. Modreanu et al., Physical properties of polycrystalline silicon films related to LPCVD conditions, THIN SOL FI, 383(1-2), 2001, pp. 212-215

Microstructural and optical properties of as-deposited LPCVD silicon films

Authors: Modreanu, M Tomozeiu, N Gartner, M Cosmin, P

Citation: M. Modreanu et al., Microstructural and optical properties of as-deposited LPCVD silicon films, THIN SOL FI, 383(1-2), 2001, pp. 254-257

Capacitance-voltage characterization of LPCVD-silicon oxynitride films

Authors: Szekeres, A Alexandrova, S Modreanu, M

Citation: A. Szekeres et al., Capacitance-voltage characterization of LPCVD-silicon oxynitride films, PHYS ST S-A, 187(2), 2001, pp. 493-498

Investigation on optical properties of CVD films used in MOEMS applications

Authors: Modreanu, M Gartner, M

Citation: M. Modreanu et M. Gartner, Investigation on optical properties of CVD films used in MOEMS applications, J MOL STRUC, 565, 2001, pp. 519-523

Optical characterization of dielectric borophosphosilicate glass

Authors: Gartner, M Modreanu, M Bosch, S Stoica, T

Citation: M. Gartner et al., Optical characterization of dielectric borophosphosilicate glass, MICROEL REL, 40(4-5), 2000, pp. 617-620

Phase and surface roughness evolution for as-deposited LPCVD silicon films

Authors: Cobianu, C Plugaru, R Nastase, N Nastase, S Flueraru, C Modreanu, M Adamczevska, J Paszkowicz, W Auleytner, J Cosmin, P

Citation: C. Cobianu et al., Phase and surface roughness evolution for as-deposited LPCVD silicon films, J PHYS IV, 9(P8), 1999, pp. 1083-1090

Optical properties of LPCVD silicon oxynitride

Authors: Modreanu, M Tomozeiu, N Cosmin, P Gartner, M

Citation: M. Modreanu et al., Optical properties of LPCVD silicon oxynitride, THIN SOL FI, 337(1-2), 1999, pp. 82-84

Risultati: 1-12 |