Authors:
von Duijn-Arnold, A
Zondervan, R
Schmidt, J
Baranov, PG
Mokhov, EN
Citation: A. Von Duijn-arnold et al., Electronic structure of the N donor center in 4H-SiC and 6H-SiC - art. no.085206, PHYS REV B, 6408(8), 2001, pp. 5206
Authors:
Segal, AS
Vorob'ev, AN
Karpov, SY
Mokhov, EN
Ramm, MG
Ramm, MS
Roenkov, AD
Vodakov, YA
Makarov, YN
Citation: As. Segal et al., Growth of silicon carbide by sublimation sandwich method in the atmosphereof inert gas, J CRYST GR, 208(1-4), 2000, pp. 431-441
Citation: Ya. Vodakov et En. Mokhov, Progress in the growth and research of crystals for wide-gap semiconducting materials, PHYS SOL ST, 41(5), 1999, pp. 742-745
Authors:
Baranov, PG
Il'in, IV
Mokhov, EN
Khramtsov, VA
Citation: Pg. Baranov et al., Transition and rare-earth elements in the SiC and GaN wide-gap semiconductors: recent EPR studies, PHYS SOL ST, 41(5), 1999, pp. 783-785
Authors:
van Duijn-Arnold, A
Mol, J
Verberk, R
Schmidt, J
Mokhov, EN
Baranov, PG
Citation: A. Van Duijn-arnold et al., Spatial distribution of the electronic wave function of the shallow boron acceptor in 4H- and 6H-SiC, PHYS REV B, 60(23), 1999, pp. 15829-15847
Citation: En. Mokhov et al., Growth mechanism and polytypism of SiC epitaxial layers: Color cathodoluminescence-scanning electron microscope study, SCANNING, 21(2), 1999, pp. 160-161
Authors:
Mokhov, EN
Roenkov, AD
Saparin, GV
Obyden, SK
Citation: En. Mokhov et al., Study of luminescent centers annealing in wide bandgap semiconductors: Color cathodoluminescence-scanning electron microscopy, SCANNING, 20(7), 1998, pp. 491-494