Authors:
KOVAL IF
MELNIK PV
NAKHODKIN NG
PYATNITSKY MY
AFANASIEVA TV
Citation: If. Koval et al., INTERACTION OF O-2 WITH THE BI SI(001) SYSTEM - FROM PASSIVATION TO PROMOTED OXIDATION/, Surface science, 384(1-3), 1997, pp. 844-847
Citation: Ng. Nakhodkin et Tv. Rodionova, THE MECHANISM OF SECONDARY GRAIN-GROWTH IN POLYSILICON FILMS, Journal of crystal growth, 171(1-2), 1997, pp. 50-55
Authors:
BONDARCHUCK AB
GOYSA SN
KOVAL IP
MELNIK PV
NAKHODKIN NG
Citation: Ab. Bondarchuck et al., EXTENDED FINE-STRUCTURE IN ELASTICALLY SCATTERED ELECTRON-SPECTRA - APPLICATION TO A STUDY OF BI ON AN A-SI SURFACE, Surface science, 336(3), 1995, pp. 767-770
Citation: Ng. Nakhodkin et Pv. Melnik, ELASTIC ELECTRON BACKSCATTERING SPECTROSCOPY, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 623-639
Authors:
KOVAL IP
MELNIK PV
NAKHODKIN NG
PYATNITSKY MY
Citation: Ip. Koval et al., ANALYSIS OF EXTENDED FINE-STRUCTURE IN IO NIZATION SPECTRA OF BAO ANDHTSC-CERAMICS, UKRAINSKII FIZICHESKII ZHURNAL, 39(1), 1994, pp. 73-76
Authors:
NAKHODKIN NG
ZYKOV GA
RODIONOVA TV
SULIMIN AD
Citation: Ng. Nakhodkin et al., EFFECT OF HYDROGEN ON THE STRUCTURE OF MICROCRYSTALLINE AND AMORPHOUSFILMS OF HYDROGENATED SILICON, Inorganic materials, 30(3), 1994, pp. 302-305
Authors:
LYUBINETSKY IV
MELNIK PV
NAKHODKIN NG
ANISIMOV AE
Citation: Iv. Lyubinetsky et al., A COMPACT SCANNING TUNNELING MICROSCOPE INTEGRABLE IN ULTRAHIGH-VACUUM SYSTEMS, Instruments and experimental techniques, 36(5), 1993, pp. 766-771