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Results: 1-12 |
Results: 12
A SIMPLE ERROR-CORRECTION METHOD FOR 2-PORT TRANSMISSION PARAMETER MEASUREMENT
Authors: WAN CH NAUWELAERS B DERAEDT W
Citation: Ch. Wan et al., A SIMPLE ERROR-CORRECTION METHOD FOR 2-PORT TRANSMISSION PARAMETER MEASUREMENT, IEEE microwave and guided wave letters, 8(2), 1998, pp. 58-59
A NEW TECHNIQUE FOR IN-FIXTURE CALIBRATION USING STANDARDS OF CONSTANT LENGTH
Authors: WAN CH NAUWELAERS B SCHREURS D DERAEDT W VANROSSUM M
Citation: Ch. Wan et al., A NEW TECHNIQUE FOR IN-FIXTURE CALIBRATION USING STANDARDS OF CONSTANT LENGTH, IEEE transactions on microwave theory and techniques, 46(9), 1998, pp. 1318-1320
2 NEW MEASUREMENT METHODS FOR EXPLICIT DETERMINATION OF COMPLEX PERMITTIVITY
Authors: WAN CH NAUWELAERS B DERAEDT W VANROSSUM M
Citation: Ch. Wan et al., 2 NEW MEASUREMENT METHODS FOR EXPLICIT DETERMINATION OF COMPLEX PERMITTIVITY, IEEE transactions on microwave theory and techniques, 46(11), 1998, pp. 1614-1619
IMPROVED HEMT MODEL FOR LOW PHASE-NOISE INP-BASED MMIC OSCILLATORS
Authors: SCHREURS D VANMEER H VANDERZANDEN K DERAEDT W NAUWELAERS B VANDECAPELLE A
Citation: D. Schreurs et al., IMPROVED HEMT MODEL FOR LOW PHASE-NOISE INP-BASED MMIC OSCILLATORS, IEEE transactions on microwave theory and techniques, 46(10), 1998, pp. 1583-1585
EFFECT OF CAPTURE AND ESCAPE PHENOMENA IN MONTE-CARLO TECHNIQUE ON THE SIMULATION OF THE NONLINEAR CHARACTERISTICS IN HIGH-ELECTRON-MOBILITY TRANSISTORS
Authors: ABOUKHALIL M SCHREURS D NAUWELAERS B VANROSSUM M MACIEJKO R WU K
Citation: M. Aboukhalil et al., EFFECT OF CAPTURE AND ESCAPE PHENOMENA IN MONTE-CARLO TECHNIQUE ON THE SIMULATION OF THE NONLINEAR CHARACTERISTICS IN HIGH-ELECTRON-MOBILITY TRANSISTORS, Journal of applied physics, 82(12), 1997, pp. 6312-6318
S-PARAMETER MEASUREMENTS OF HIGH-TEMPERATURE SUPERCONDUCTING AND NORMAL CONDUCTING MICROWAVE CIRCUITS AT CRYOGENIC TEMPERATURES
Authors: LAUWERS J ZHGOON S BOURZGUI N NAUWELAERS B CARRU JC VANDECAPELLE A
Citation: J. Lauwers et al., S-PARAMETER MEASUREMENTS OF HIGH-TEMPERATURE SUPERCONDUCTING AND NORMAL CONDUCTING MICROWAVE CIRCUITS AT CRYOGENIC TEMPERATURES, Journal de physique. IV, 6(C3), 1996, pp. 397-401
DC, LF DISPERSION AND HF CHARACTERIZATION OF SHORT-TIME STRESSED INP BASED LM-HEMTS
Authors: SCHREURS D SPIERS A DERAEDT W VANDERZANDEN K BAEYENS Y VANHOVE M NAUWELAERS B VANROSSUM M
Citation: D. Schreurs et al., DC, LF DISPERSION AND HF CHARACTERIZATION OF SHORT-TIME STRESSED INP BASED LM-HEMTS, Microelectronics and reliability, 36(11-12), 1996, pp. 1911-1914
COMPLEX PERMITTIVITY MEASUREMENT METHOD BASED ON ASYMMETRY OF RECIPROCAL 2-PORTS
Authors: WAN C NAUWELAERS B DERAEDT W VANROSSUM M
Citation: C. Wan et al., COMPLEX PERMITTIVITY MEASUREMENT METHOD BASED ON ASYMMETRY OF RECIPROCAL 2-PORTS, Electronics Letters, 32(16), 1996, pp. 1497-1498
CONSISTENT SMALL-SIGNAL AND LARGE-SIGNAL EXTRACTION TECHNIQUES FOR HETEROJUNCTION FETS
Authors: JANSEN P SCHREURS D DERAEDT W NAUWELAERS B VANROSSUM M
Citation: P. Jansen et al., CONSISTENT SMALL-SIGNAL AND LARGE-SIGNAL EXTRACTION TECHNIQUES FOR HETEROJUNCTION FETS, IEEE transactions on microwave theory and techniques, 43(1), 1995, pp. 87-93
BROAD-BAND CIRCULARLY POLARIZED MICROSTRIP ANTENNA IN 2-SIDED STRUCTURE WITH COAXIAL PROBE COUPLING
Authors: AN H NAUWELAERS B VANDECAPELLE A
Citation: H. An et al., BROAD-BAND CIRCULARLY POLARIZED MICROSTRIP ANTENNA IN 2-SIDED STRUCTURE WITH COAXIAL PROBE COUPLING, Electronics Letters, 29(3), 1993, pp. 310-312
NOISE-FIGURE MEASUREMENT OF RECEIVING ACTIVE MICROSTRIP ANTENNAS
Authors: AN H NAUWELAERS B VANDECAPELLE A
Citation: H. An et al., NOISE-FIGURE MEASUREMENT OF RECEIVING ACTIVE MICROSTRIP ANTENNAS, Electronics Letters, 29(18), 1993, pp. 1594-1596
MEASUREMENT TECHNIQUE FOR ACTIVE MICROSTRIP ANTENNAS
Authors: AN H NAUWELAERS B VANDECAPELLE A
Citation: H. An et al., MEASUREMENT TECHNIQUE FOR ACTIVE MICROSTRIP ANTENNAS, Electronics Letters, 29(18), 1993, pp. 1646-1647
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